Research Group: Solid State Physics (VSF)

Article

Iske, P.L. and Caspers, W.J. (1987) A mechanism for symmetry breaking in antiferromagnetic Heisenberg systems. Physica A, 142 (1-3). pp. 360-373. ISSN 0378-4371

Tielen, G.I. and Iske, P.L. and Caspers, W.J. (1991) A thermodynamic approximation of the ground state of antiferromagnetic heisenberg spin−1/2 lattices. Physica A: Theoretical and statistical physics, 173 (3). pp. 507-521. ISSN 0378-4371

Busscher, H.J. and Uyen, H.M. and Jong de, H.P. and Arends, J. and Kip, G.A.M. (1988) Adsorption of aminefluorides on human enamel. Journal of Dentistry, 16 (4). pp. 166-171. ISSN 0300-5712

Keim, E.G. and Wolterbeek, L. and Silfhout van, A. (1987) Adsorption of atomic oxygen (N2O) on a clean Si(100) surface and its influence on the surface state density; A comparison with O2. Surface Science, 180 (2-3). pp. 565-598. ISSN 0039-6028

Keim, E.G. and Silfhout van, A. and Wolterbeek, L. (1987) Adsorption of atomic oxygen on the Si(110)5×1 surface via interaction with N2O. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 5 (4). pp. 1019-1023. ISSN 0734-2101

Sasse, A.G.B.M. and Silfhout van, A. (1989) Adsorption of nitric oxide on the Si(100)2×1 surface: A theoretical and experimental approach. Physical review B: Condensed matter, 40 (3). pp. 1773-1782. ISSN 1095-3795

Keim, Enrico G. and Silfhout van, Arend and Wolterbeek, Lambert (1988) Adsorption of oxygen on the Si(110)5×1 surface via interaction with O2. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 6 (1). pp. 57-62. ISSN 0734-2101

Oda, O. and Hanekamp, L.J. and Bootsma, G.A. (1981) An AES and LEED study of carbon and oxygen sorption on copper surfaces. Applications of Surface Science, 7 (3). pp. 206-214. ISSN 0378-5963

Nijs de, J.M.M. and Silfhout van, A. (1990) An ellipsometric and RBS study of TiSi2 formation. Materials Science and Engineering B: Solid-state materials for advanced technology, 5 (2). pp. 319-323. ISSN 0921-5107

Putten van, A.F.P. (1983) An integrated silicon double bridge anemometer. Sensors and Actuators, 4 (1983). pp. 387-396. ISSN 0250-6874

Keim, E.G. and Silfhout van, A. (1985) An investigation of the interaction of N2O with the Si(111)-7 × 7 surface using AES and optical reflectometry; A comparison with O2. Surface Science, 152-15 (2). pp. 1096-1102. ISSN 0039-6028

Aarnink, W.A.M. and Weishaupt, A. and Silfhout van, A. (1990) Angle-resolved X-ray photoelectron spectroscopy (ARXPS) and a modified Levenberg-Marquardt fit procedure: a new combination for modeling thin layers. Applied Surface Science, 45 (1). pp. 37-48. ISSN 0169-4332

Wijers, C.M.J. and Poppe, G.P.M. (1990) Anisotropic off-normal incidence optical reflection from GaP (110) surfaces. Vacuum, 41 (1-3). pp. 624-627. ISSN 0042-207X

Baikie, I.D. and Werf van der, K.O. and Oerbekke, H. and Broeze, J. and Silfhout van, A. (1989) Automatic kelvin probe compatible with ultrahigh vacuum. Review of Scientific Instruments, 60 (5). p. 930. ISSN 0034-6748

Post, T. and Capel, H.W. and Quispel, G.R.W. and Weele van der, J.P. (1990) Bifurcations in two-dimensional reversible maps. Physica A: Theoretical and statistical physics, 164 (3). pp. 625-662. ISSN 0378-4371

Nijs de, J.M.M. and Holtslag, A.H.M. and Hoekstra, A and Silfhout van, A. (1988) Calibration method for rotating-analyzer ellipsometers. Journal of the Optical Society of America A: Optics and image science, 5 (9). p. 1466. ISSN 0740-3232

Waal van de, Benjamin W. (1991) Can the Lennard-Jones solid be expected to be fcc? Physical Review Letters, 67 (23). pp. 3263-3266. ISSN 0031-9007

Lisowski, W. and Berg van den, A.H.J. and Smithers, M. (1998) Characterization of titanium hydride film after long-term air interaction: SEM, ARXPS and AES depth profile studies. Surface and Interface Analysis, 26 (3). pp. 213-219. ISSN 0142-2421

Lisowski, W. and Berg van den, A.H.J. and Leonard, D. and Mathieu, H.J. (2000) Characterization of titanium hydride films covered by nanoscale evaporated Au layers: ToF-SIMS, XPS and AES depth profile analysis. Surface and Interface Analysis, 29 (4). pp. 292-297. ISSN 0142-2421

Waal van de, Benjamin W. (1994) Comment on "Atomic force microscopy characterization of stable faces in cubic C60 single crystals": possible evidence for growth-promoting cross-twinning. Chemical Physics, 186 (2-3). pp. 447-449. ISSN 0301-0104

Waal van de, Benjamin W. (1993) Comment on "Coexistence of fcc and hcp phases of C60". Chemical Physics Letters, 202 (3-4). pp. 341-344. ISSN 0009-2614

Lohner, T. and Toth, L. and Fried, M. and Khanh, N.Q. and Yang, Gen Qing and Lu, Lin Chen and Zou, Shichang and Hanekamp, L.J. and Silfhout van, A. and Gyulai, J. (1994) Comparative investigation of damage induced by diatomic and monoatomic ion implantation in silicon. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 85 (1-4). pp. 524-527. ISSN 0168-583X

Caspers, W.J. and Braak van de, H.P. and Verbeek, P.W. and Verstelle, J.C. (1971) Complete sets of diagonal operators in quantum-statistical mechanics. Physica, 53 (2). pp. 210-224. ISSN 0031-8914

Lisowski, W. and Berg van den, A.H.J. and Hanekamp, L.J. and Silfhout van, A. (1992) Composition and thickness of surface layer on molybdenum tips for scanning tunnelling microscopy (STM) studied by SEM/AES/(AR)XPS. Surface and Interface Analysis, 19 (1-12). pp. 93-99. ISSN 0142-2421

Bekker, H.G. and Wijers, C.M.J. and Christensen, N.E. (1996) Confinement and the CLOPW method. Physica B: Condensed Matter, 217 (3-4). pp. 193-206. ISSN 0921-4526

Waal van de, Benjamin W. (1996) Cross-twinning model of fcc crystal growth. Journal of Crystal Growth, 158 (1-2). pp. 153-165. ISSN 0022-0248

Schlößer, Dietmar C. and Verheij, Laurens K. and Rosenfeld, Georg and Comsa, George (1999) Determination of Step Free Energies from Island Shape Fluctuations on Metal Surfaces. Physical Review Letters, 82 (19). pp. 3843-3846. ISSN 0031-9007

Fried, M. and Lohner, T. and Aarnink, W.A.M. and Hanekamp, L.J. and Silfhout van, A. (1992) Determination of complex dielectric functions of ion implanted and implanted‐annealed amorphous silicon by spectroscopic ellipsometry. Journal of Applied Physics, 71 (10). pp. 5260-5262. ISSN 0021-8979

Wessels, P.P.F. and Caspers, W.J. and Wiegel, F.W. (1999) Discretizing the one-dimensional Dirac equation. Europhysics Letters, 46 (2). pp. 123-126. ISSN 0295-5075

Valkering, T.P. and Hooijer, C.L.A. and Kroon, M.F. (2000) Dynamics of two capacitively coupled Josephson junctions in the overdamped limit. Physica D: Nonlinear phenomena, 135 (1-2). pp. 137-153. ISSN 0167-2789

Eßer, M. and Morgenstern, K. and Rosenfeld, G. and Comsa, G. (1998) Dynamics of vacancy island coalescence on Ag(111). Surface Science, 402-40 . pp. 341-345. ISSN 0039-6028

Gadgil, V.J. and Geijselaers, H.J.M. (1993) Effect of cathodic hydrogen charging on the surface of duplex stainless steel. Scripta Metallurgica et Materialia, 28 (12). pp. 1489-1494. ISSN 0956-716X

Kono, S. and Hanekamp, L.J. and Silfhout van, A. (1977) Effects on ellipsometric parameters caused by heat treatment of silicon (111) surface. Surface Science, 65 (2). pp. 633-640. ISSN 0039-6028

Poppe, G.P.M. and Wijers, C.M.J. (1990) Exact solution of the optical response of thick slabs in the discrete dipole approach. Physica B: Condensed Matter, 167 (3). pp. 221-237. ISSN 0921-4526

Kramer, N. and Birk, H. and Jorritsma, J. and Schönenberger, C. (1995) Fabrication of metallic nanowires with a scanning tunneling microscope. Applied Physics Letters, 66 (11). pp. 1325-1327. ISSN 0003-6951

Thijssen, W.H.A. and Strange, M. and Brugh aan de, J.M.J. and Ruitenbeek van, J.M. (2008) Formation and properties of metal–oxygen atomic chains. New Journal of Physics, 10 (3). 033005. ISSN 1367-2630

Wijers, C.M.J. and Poppe, G.P.M. and Boeij de, P.L. and Bekker, H.G. and Wentink, D.J. (1993) Full microscopic treatment of the optical response of the Si(100)2x1 surface. Thin Solid Films, 233 (1-2). pp. 28-31. ISSN 0040-6090

Wijers, C.M.J. and Lantinga, R. and Boeij de, P.L. (1995) Influence on SSHG of the Orientation of Uniaxial Molecules on Surfaces. Surface Science, 331-33 (2). pp. 1329-1334. ISSN 0039-6028

Baikie, I.D. and Werf van der, K.O. and Hanekamp, L.J. (1988) Integrated automatic modular measuring system. Review of Scientific Instruments, 59 (9). p. 2075. ISSN 0034-6748

Stokkers, G.J. and Silfhout van, A. and Bootsma, G.A. and Fransen, T. and Gellings, P.J. (1983) Interaction of oxygen with an AISI 314 stainless steel surface studied by ellipsometry and auger electron spectroscopy in combination with ion bombardment. Corrosion Science, 23 (3). pp. 195-204. ISSN 0010-938X

Voskoboynikov, O. and Wijers, C.M.J. and Liu, J.L. and Lee, C.P. (2005) Interband magneto-optical transitions in a layer of semiconductor nano-rings. Europhysics Letters, 70 (5). pp. 656-662. ISSN 0295-5075

Lohner, T. and Kotai, E. and Khanh, N.Q. and Toth, L. and Fried, M. and Vedam, K. and Nguyen, N.V. and Hanekamp, L.J. and Silfhout van, A. (1994) Ion-implantation induced anomalous surface amorphization in silicon. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 85 (1-4). pp. 335-339. ISSN 0168-583X

Lohner, T. and Fried, M. and Gyulai, J. and Vedam, K. and Nguyen, N.V. and Hanekamp, L.J. and Silfhout van, A. (1993) Ion-implantation-caused special damage profiles determined by spectroscopic ellipsometry in crystalline and in relaxed (annealed) amorphous silicon. Thin Solid Films, 233 (1-2). pp. 117-121. ISSN 0040-6090

Schlößer, Dietmar C. and Morgenstern, Karina and Verheij, Laurens K. and Rosenfeld, Georg and Besenbacher, Flemming and Comsa, George (2000) Kinetics of island diffusion on Cu(111) and Ag(111) studied with variable-temperature STM. Surface Science, 465 (1-2). pp. 19-39. ISSN 0039-6028

Morgenstern, Karina and Rosenfeld, Georg and Comsa, George (1999) Local correlation during Ostwald ripening of two-dimensional islands on Ag(111). Surface Science, 441 (2-3). pp. 289-300. ISSN 0039-6028

Voskoboynikov, O. and Wijers, C.M.J. and Liu, J.L. and Lee, C.P. (2005) Magneto-optical response of layers of semiconductor quantum dots and nanorings. Physical Review B: Condensed matter and materials physics, 71 (24). p. 245332. ISSN 1098-0121

Poppe, G.P.M. and Wijers, C.M.J. and Silfhout van, A. (1991) Microscopic treatment of the IR spectroscopy of CO physisorbed onNaCl(100). Surface Science, 251-25 . pp. 321-324. ISSN 0039-6028

Sasse, A.G.B.M. and Kleinherenbrink, P.M. and Silfhout van, A. (1988) Missing dimer defects investigated by adsorption of nitric oxide (NO) on silicon (100) 2 × 1. Surface Science, 199 (1-2). pp. 243-260. ISSN 0039-6028

Nefyodov, Yu. A. and Golubov, A.A. and Trunin, M.R. and Béal-Monod, M.T. (2000) Multicomponent order parameter and penetration depth of YBCO single crystals. Physica B: Condensed Matter, 284-28 (Part 1). pp. 919-920. ISSN 0921-4526

Hanekamp, L.J. (1988) Multiple reflections in an optical retarder investigated by spectroscopic transmission ellipsometry. Optics Communications, 65 (4). pp. 261-263. ISSN 0030-4018

Schönenberger, Christian and Kramer, Niels (1996) Nanolithography on hydrogen-terminated silicon by scanning-probe microscopy. Microelectronic Engineering, 32 (1-4). pp. 203-217. ISSN 0167-9317

Kramer, N. and Jorritsma, J. and Birk, H. and Schönenberger, C. (1995) Nanometer lithography on silicon and hydrogenated amorphous silicon with low energy electrons. Journal of Vacuum Science & Technology B: Microelectronics and nanometer structures, 13 (3). pp. 805-811. ISSN 1071-1023

Kramer, N. and Jorritsma, J. and Birk, H. and Schönenberger, C. (1995) Nanometer lithography on silicon and hydrogenated amorphous silicon with low-energy electrons. Microelectronic Engineering, 27 (1-4). pp. 47-50. ISSN 0167-9317

Holtslag, A.H.M. and Silfhout van, A. (1987) Neon ion bombardment on silicon surfaces. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 19-20 (Part 2). pp. 585-589. ISSN 0168-583X

Waal van de, Benjamin W. (1996) No Evidence for Size-Dependent Icosahedral - fcc Structural Transition in Rare-Gas Clusters. Physical Review Letters, 76 (7). pp. 1083-1086. ISSN 0031-9007

Holtslag, A.H.M. and Silfhout van, A. (1988) Noble-gas ion bombardment on clean silicon surfaces. Physical review B: Condensed matter, 38 (15). pp. 10556-10570. ISSN 1095-3795

Fried, M. and Lohner, T. and Nijs de, J.M.M. and Silfhout van, A. and Hanekamp, L.J. and Khanh, N.Q. and Laczik, Z. and Gyulai, J. (1989) Non-destructive characterization of nitrogen-implanted silicon-on-insulator structures by spectroscopic ellipsometry. Materials Science and Engineering B: Solid-state materials for advanced technology, 2 (1-3). pp. 131-137. ISSN 0921-5107

Caspers, W.J. and Labuz, M. and Wal, A. (2006) On the completeness of the set of Bethe-Hulth´en solutions of the linear Heisenberg system. Journal of Physics: Conference Series, 30 . pp. 73-85. ISSN 1742-6588

Langevoort, J.C. and Hanekamp, L.J. and Gellings, P.J. (1987) On the kinetics of oxidation of austenitic stainless steels AISI 304 and incoloy 800H. Applied Surface Science, 28 (3). pp. 189-203. ISSN 0169-4332

Waal van de, Benjamin W. (1995) On the origin of second-peak splitting in the static structure factor of metallic glasses. Journal of Non-Crystalline Solids, 189 (1-2). pp. 118-128. ISSN 0022-3093

Langevoort, J.C. and Sutherland, I. and Hanekamp, L.J. and Gellings, P.J. (1987) On the oxide formation on stainless steels AISI 304 and incoloy 800H investigated with XPS. Applied Surface Science, 28 (2). pp. 167-179. ISSN 0169-4332

Fried, M. and Silfhout van, A. (1994) Optical dispersion relations in two types of amorphous silicon using Adachi’s expression. Physical review B: Condensed matter, 49 (8). pp. 5699-5702. ISSN 1095-3795

Wijers, C.M.J. (2004) Polarizability tensor and Kramers-Heisenberg induction. Physical review A: Atomic, molecular, and optical physics, 70 (6). 063807. ISSN 1050-2947

Wierenga, P.E. and Sparnaay, M.J. and Silfhout van, A. (1980) Reflectometric study of surface states and oxygen adsorption on clean Si(100) and (110) surfaces. Surface Science, 99 (1). pp. 59-69. ISSN 0039-6028

Kramer, N. and Niesten, M. and Schönenberger, C. (1995) Resistless high resolution optical lithography on silicon. Applied Physics Letters, 67 (20). pp. 2989-2991. ISSN 0003-6951

Caspers, W.J. and Tielen, G.I. (1986) Rotational ordering and symmetry breaking in the triangular antiferromagnetic Heisenberg lattice. Physica A, 135 (2-3). pp. 519-532. ISSN 0378-4371

Wijers, C.M.J. and Boeij de, P.L. (1995) SSHG of uniaxial molecules: Phenomena near brewster's angle. Physica Status Solidi A: Applied research, 152 (1). pp. 237-248. ISSN 0031-8965

Kramer, N. and Berg van den, M.R. and Schönenberger, C. (1996) Scanning tunnelling microscope-induced oxidation of hydrogen passivated silicon surfaces. Thin Solid Films, 281-28 (1-2). pp. 637-639. ISSN 0040-6090

Hanekamp, L.J. and Brader, S.J.H. (1984) Short contribution: The behaviour of secondary electrons from Ni (110) upon oxygen adsorption. Vacuum, 34 (7). pp. 709-710. ISSN 0042-207X

Hanekamp, L.J. and Lisowski, W. and Bootsma, G.A. (1982) Spectroscopic ellipsometric investigation of clean and oxygen covered copper single crystal surfaces. Surface Science, 118 (1-2). pp. 1-18. ISSN 0039-6028

Hanekamp, L.J. and Brader, S.J.H. and Bootsma, G.A. (1983) Spectroscopic ellipsometric investigation of the clean and oxygen exposed Ni(110) surface. Surface Science, 135 (1-3). pp. 383-395. ISSN 0039-6028

Rosenfeld, Georg and Morgenstern, Karina and Beckmann, Ingo and Wulfhekel, Wulf and Laegsgaard, Erik and Besenbacher, Flemming and Comsa, George (1998) Stability of two-dimensional clusters on crystal surfaces: from Ostwald ripening to single-cluster decay. Surface Science, 402-40 . pp. 401-408. ISSN 0039-6028

Waal van de, B.W. (1999) Structure analysis of large argon clusters from gas-phase electron diffraction data: some recent results. Journal of Molecular Structure, 485-48 . pp. 269-279. ISSN 0022-2860

Waal van de, B.W. and Torchet, G. and Feraudy de, M.-F. (2000) Structure of large argon clusters ArN,103<N<105: experiments and simulations. Chemical Physics Letters, 331 (1). pp. 57-63. ISSN 0009-2614

Sasse, A.G.B.M. and Lakerveld, D.G. and Silfhout van, A. (1988) Summary Abstract: Self‐deconvolution in CVV Auger electron spectroscopy. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 6 (3). p. 1045. ISSN 0734-2101

Hemmes, K. and Lisowski, W. and Lodder, J.C. and Hanekamp, L.J. and Popma, Th.J.A. (1986) Surface and bulk magnetic behaviour of sputtered CoCr films. Journal of Physics D: Applied Physics, 19 (7). p. 1311. ISSN 0022-3727

Lohner, T. and Khanh, N.Q. and Petrik, P. and Biro, L.P. and Fried, M. and Pinter, I. and Lehnert, W. and Frey, L. and Ryssel, H. and Wentink, D.J. and Gyulai, J. (1998) Surface disorder production during plasma immersion implantation. Thin Solid Films, 313-31 . pp. 254-258. ISSN 0040-6090

Voskoboinikov, A. and Nakhodkin, N. and Kryn'ko, Y. and Kulik, S. and Melnik, P. and Sheka, D. (1994) Surface plasmon peak intensity dependence on the oxygen coverage at metal surfaces. Solid State Communications, 90 (1). pp. 27-30. ISSN 0038-1098

Nijs de, J.M.M. and Silfhout van, A. (1988) Systematic and random errors in rotating-analyzer, ellipsometry. Journal of the Optical Society of America A: Optics and image science, 5 (6). pp. 773-781. ISSN 0740-3232

Braun, O.M. and Chubykalo, O.A. and Kivshar, Yu. S. and Valkering, T.P. (1998) The Frenkel-Kontorova model with a transverse degree of freedom: kinks structures. Physica D: Nonlinear phenomena, 113 (2-4). pp. 152-156. ISSN 0167-2789

Wijers, C.M.J. (2001) The Local Field and What It Means. Physica Status Solidi A: Applied research, 188 (4). pp. 1251-1260. ISSN 0031-8965

Nijs de, J.M.M. and Silfhout van, A. (1990) The Ti/c-Si solid state reaction : I. An ellipsometrical study. Applied Surface Science, 40 (4). pp. 333-347. ISSN 0169-4332

Nijs de, J.M.M. and Silfhout van, A. (1990) The Ti/c-Si solid state reaction : II. Additional measurements by means of RBS, XPS and AES. Applied Surface Science, 40 (4). pp. 349-358. ISSN 0169-4332

Nijs de, J.M.M. and Silfhout van, A. (1990) The Ti/c-Si solid state reaction : III. The low-temperature reaction kinetics. Applied Surface Science, 40 (4). pp. 359-366. ISSN 0169-4332

Keim, Enrico G. and Silfhout van, Arend (1987) The adsorption behaviour of O2 on the clean Si(110) surface in the early stage. Surface Science, 186 (3). L557-L560. ISSN 0039-6028

Sasse, A.G.B.M. and Lakerveld, D.G. and Silfhout van, A. (1988) The adsorption of nitric oxide on a silicon (100) 2 × 1 surface studied with Auger electron spectroscopy. Surface Science, 195 (3). L167-L172. ISSN 0039-6028

Holtslag, A.H.M. and Silfhout van, A. (1987) The desorption behaviour of implanted noble gases at low energy on silicon surfaces. Surface Science, 187 (1). pp. 36-57. ISSN 0039-6028

Poppe, G.P.M. and Wijers, C.M.J. and Silfhout van, A. (1991) The double cell technique: a discrete dipole approach towards surface optics. Solid State Communications, 78 (8). pp. 773-777. ISSN 0038-1098

Martens, J.W.D. and Bogert van den, W.F. and Silfhout van, A. (1981) The influence of argon ion bombardment on the electrical and optical properties of clean silicon surfaces. Surface Science, 105 (1). pp. 275-288. ISSN 0039-6028

Straaijer, A. and Hanekamp, L.J. and Bootsma, G.A. (1980) The influence of cell window imperfections on the calibration and measured data of two types of rotating-analyzer ellipsometers. Surface Science, 96 (1-3). pp. 217-231. ISSN 0039-6028

Holtslag, A.H.M. and Slager, U.C. and Silfhout van, A. (1985) The interpretation of ellipsometric measurements of ion bombardment of noble gases on semiconductor surfaces. Surface Science, 152-15 (Part 2). pp. 1079-1085. ISSN 0039-6028

Nijs de, J.M.M. and Silfhout van, A. (1990) The kinetics of titanium monosilicide growth studied by three-wavelength ellipsometry. Materials Science and Engineering B: Solid-state materials for advanced technology, 5 (2). pp. 313-317. ISSN 0921-5107

Wolterbeek, L. and Akkerhuis, G.F. and Silfhout van, A. (1985) The optimization of differential reflectometry at surfaces of transparent crystals. Surface Science, 152-15 (Part 2). pp. 1071-1078. ISSN 0039-6028

Tielen, G.J. and Lulek, T. and Traa, M.R.M.J. and Kuzma, M. and Caspers, W.J. (1997) The role of the Manhattan distance in antiferromagnetic ordering. Physica A: Theoretical and statistical physics, 246 (1-2). pp. 199-220. ISSN 0378-4371

Valkering, Theo P. (1987) The shape of the basin of attraction and transients via transformation to normal form. Physica D: Nonlinear phenomena, 27 (1-2). pp. 213-223. ISSN 0167-2789

Bootsma, G.A. and Rooij de, N.F. and Silfhout van, A. (1981) The solid/liquid interface. Sensors and Actuators, 1 . pp. 111-136. ISSN 0250-6874

Post, T. and Capel, H.W. and Weele van der, J.P. (1989) Window scaling in one-dimensional maps. Physics Letters A, 136 (3). pp. 109-113. ISSN 0375-9601

Poppe, G.P.M. and Wijers, C.M.J. and Silfhout van, A. (1991) ir spectroscopy of CO physisorbed on NaCl(100): Microscopic treatment. Physical review B: Condensed matter, 44 (15). pp. 7917-7929. ISSN 1095-3795

Thesis

Bekker, Hermie Gerhard (1997) CLOPW: a mixed basis set full potential electronic structure method. thesis.

Boeij de, Paul Leonardus (1997) Dynamic electric polarisation at crystalline surface: an ab-initio study of optical reflection. thesis.

Rabbering, Frederik Lambertus Wilhelmus (2008) On the interplay between steering and interlayer diffusion in Cu(001) homoepitaxy. thesis.