Wessels, W.A. and Broekmaat, J.J. and Beerends, R.J.L. and Koster, G. and Rijnders, A.J.H.M.
Fast and gentle side approach for atomic force microscopy.
Review of scientific instruments, 84
Bayraktar, M. and Wessels, W.A. and Lee, C.J. and Goor, F.A. van and Koster, G. and Rijnders, G. and Bijkerk, F.
Active multilayer mirrors for reflectance tuning at extreme ultraviolet (EUV) wavelengths.
Journal of physics D: applied physics, 45
494001-1 - 494001-5.