Author Publications

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Jump to: 2014 | 2013 | 2011
Number of items: 7.

2014

Khan, Muhammad Aamir and Kerkhoff, Hans G. (2014) Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs. In: 17th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, 23-25 April 2014, Warsaw, Poland (pp. pp. 15-20).

2013

Khan, Muhammad Aamir and Kerkhoff, Hans G. (2013) Analysing degradation effects in charge-redistribution SAR ADCs. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, 2-4 October 2013, New York, NY, USA (pp. pp. 65-70).

Khan, Muhammad Aamir and Kerkhoff, Hans G. (2013) The essence of reliability estimation during operational life for achieving high system dependability. In: 16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 September 2013, Santander, Spain (pp. pp. 575-581).

Khan, Muhammad Aamir and Kerkhoff, Hans G. (2013) An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. In: 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, 8-10 April 2013, Karlovy Vary, Czech Republic (pp. pp. 159-164).

Khan, Muhammad Aamir and Kerkhoff, Hans G. (2013) Monitoring operating temperature and supply voltage in achieving high system dependability. In: 8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March 2013, Abu Dhabi, UAE (pp. pp. 108-112).

2011

Khan, Muhammad A. and Kerkhoff, Hans G. (2011) A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. In: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, 13-15 April 2011, Cottbus, Germany (pp. pp. 17-22).

Khan, Muhammad A. and Kerkhoff, Hans G. (2011) SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. In: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 3-5 October 2011, Vancouver, B.C. Canada (pp. pp. 374-381).

This list was generated on Wed Oct 22 05:16:26 2014 CEST.