Author Publications

2005

Vermaak, Hermanus Jacobus (2005) Design-for-delay-testability techniques for high-speed digital circuits. thesis.

2004

Vermaak, H.J. and Kerkhoff, H.G. (2004) Using the Oscillation Test Method to test for Delay Faults in Embedded Cores. In: 7th IEEE Africon Conference in Africa, AFRICON 2004, 15-17 Sept. 2004, Gabarone, Botswana.

2003

Vermaak, H.J. and Kerkhoff, H.G. (2003) Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores. In: Eighth IEEE European Test Workshop, 2003, 25-28 May 2003, Maastricht, the Netherlands.

2002

Vermaak, H.J. and Kerkhoff, H.G. and Jordaan, G.D. (2002) Using a Pulsed Supply Voltage for Delay Faults Testing of Digital Circuits in a Digital Oscillation Environment. In: 6th IEEE Africon Conference in Africa, AFRICON 2002, 2-4 Oct. 2002, George, South Africa.