Number of items: 1.
1998
Vandenbossche, Eric and De Keukeleire, Catherine and Wolf de, Marc and Hove van, Hugo and Witters, Johan (1998) Modelling and simulation of hot-carriers degradation of high voltage floating lateral NDMOS transistors. Microelectronics Reliability, 38 (6-8). pp. 1097-1101. ISSN 0026-2714
This list was generated on Wed Jun 19 05:40:28 2013 CEST.
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