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1998

Vandenbossche, Eric and De Keukeleire, Catherine and Wolf, Marc de and Hove, Hugo van and Witters, Johan (1998) Modelling and simulation of hot-carriers degradation of high voltage floating lateral NDMOS transistors. Microelectronics Reliability, 38 (6-8). pp. 1097-1101. ISSN 0026-2714

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