Number of items: 2.
1996
Bijlsma, Sipke J. and Kranenburg van, Herma and Nieuwesteeg, K.J.B.M. and Pitt, Michael G. and Verweij, Jan F. (1996) Electrical breakdown of amorphous hydrogenated silicon rich silicon nitride thin film diodes. IEEE Transactions on Electron Devices, 43 (9). pp. 1592-1601. ISSN 0018-9383
Klootwijk, J.H. and Verweij, J.F. and Rem, J.B. and Bijlsma, S. (1996) Dielectric breakdown II: Related projects at the University of Twente. Microelectronics Journal, 27 (7). pp. 623-632. ISSN 0026-2692
This list was generated on Sun May 19 05:40:34 2013 CEST.
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