Author Publications

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Number of items: 16.

2012

Herfst, Rodolf W. and Steeneken, Peter G. and Tiggelman, Mark P.J. and Stulemeijer, Jiri and Schmitz, Jurriaan (2012) Fast RF-CV characterization through High-Speed 1-port S-Parameter measurements. IEEE Transactions on Semiconductor Manufacturing, 25 (3). pp. 310-316. ISSN 0894-6507

2010

Herfst, R.W. and Steeneken, P.G. and Tiggelman, M.P.J. and Stulemeijer, J. and Schmitz, J. (2010) Fast RF-CV characterization through high-speed 1-port S-parameter measurements. In: Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), 2010, 22-25 Mar 2010, Hirosjima, Japan (pp. pp. 170-173).

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Mauczok, R. and Keur, W. and Hueting, R.J.E. (2010) BaxSr1−xTi1.02O3 metal–insulator–metal capacitors on planarized alumina substrates. Thin Solid Films, 518 (10). pp. 2854-2959. ISSN 0040-6090

2009

Furukawa, Yukiko and Reimann, Klaus and Jedema, Friso Jacobus and Tiggelman, Markus Petrus Josephus and Roest, Aarnoud Laurens (2009) Tunable capacitor. Patent.

Klee, Mareike and Esch, Harry van and Keur, Wilco and Kumar, Biju and Leuken-Peters, Linda van and Liu, Jin and Mauczok, Rüdiger and Neumann, Kai and Reimann, Klaus and Renders, Christel and Roest, Aarnoud L. and Tiggelman, Mark P.J. and Wild, Marco de and Wunnicke, Olaf and Zhao, Jing (2009) Ferroelectric Thin-Film Capacitors and Piezoelectric Switches for Mobile Communication Applications. IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 56 (8). pp. 1505-1512. ISSN 0885-3010

Tiggelman, Markus Petrus Josephus (2009) Thin film barium strontium titanate capacitors for tunable RF front-end applications. thesis.

Tiggelman, M.P.J. and Reimann, K. and Van Rijs, F. and Schmitz, J. and Hueting, R.J.E. (2009) On the Trade-Off Between Quality Factor and Tuning Ratio in Tunable High-Frequency Capacitors. IEEE Transactions on Electron Devices, 56 (9). pp. 2128-2136. ISSN 0018-9383

Tiggelman, Markus Petrus Josephus and Reimann, Klaus (2009) Reconfigurable radio-frequency front-end. Patent.

2008

Klee, M. and Keur, W. and Mauczok, R. and Esch, H. van and Wild, M. de and Liu, J. and Roest, A. and Reimann, K. and Renders, Ch. and Peters, L. and Tiggelman, M.P.J. and Wunnicke, O. and Neumann, K. (2008) MI004 miniaturised, high performance ferroelectric and piezoelectric thin film devices. In: 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF, 23-28 feb 2008, Santa Re, NM, USA (pp. pp. 1-4).

Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Keur, W. and Mauczock, R. and Schmitz, J. and Hueting, R.J.E. (2008) Identifying dielectric and resistive electrode losses in high-density capacitors at radio frequencies. In: 21st ICMTS 2008 IEEE Conference on Microelectronic Test Structures, 24-27 March 2008, Edinburgh, Schotland (pp. pp. 190-195).

Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Mauczok, R. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2008) The trade-off between tuning ratio and quality factor of BaxSr1-xTiO3 MIM capacitors on alumina substrates. In: 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2008, 27-28 November 2008, Veldhoven, The Netherlands (pp. pp. 506-508).

2007

Klee, M. and Beelen, D. and Keurl, W. and Kiewitt, R. and Kumar, B. and Mauczok, R. and Reimann, K. and Renders, Ch. and Roest, A. and Roozeboom, F. and Steeneken, P.G. and Tiggelman, M.P.J. and Vanhelmont, F. and Wunnicke, O. and Lok, P. and Neumann, K. and Fraser, J. and Schmitz, G. (2007) Application of Dielectric, Ferroelectric and Piezoelectric Thin Film Devices in Mobile Communication and Medical Systems. In: 15th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2006, 30 July - 3 August 2006, Sunset Beach, NC, USA (pp. pp. 9-16).

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Schmitz, J. and Hueting, R.J.E. and Liu, J. and Furukawa, Y. and Mauczok, R. and Keur, W. (2007) Separation of intrinsic dielectric and resistive electrode losses in ferroelectric capacitors at radio frequencies. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 465-467).

Tiggelman, M.P.J. and Reimann, K. and Schmitz, J. (2007) Reducing AC impedance measurement errors caused by the DC voltage dependence of broadband high-voltage bias-tees. In: IEEE International Conference on Microelectronic Test Structures, ICMTS 2007, 19-22 March 2007, Tokyo, Japan (pp. pp. 200-205).

2006

Bankras, Radko G. and Tiggelman, Mark P.J. and Negara, M. Adi and Sasse, Guido T. and Schmitz, Jurriaan (2006) C-V test structures for metal gate CMOS. In: International Conference on Microelectronic Test Structures, ICMTS, March 6-9, 2006, Austin, Texas, USA (pp. pp. 226-229).

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Beelen, D. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2006) Electrical characterization of thin film ferroelectric capacitors. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands (pp. pp. 439-443).

This list was generated on Tue Sep 2 05:13:06 2014 CEST.