Author Publications

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Number of items: 13.

2012

Herfst, Rodolf W. and Steeneken, Peter G. and Tiggelman, Mark P.J. and Stulemeijer, Jiri and Schmitz, Jurriaan (2012) Fast RF-CV characterization through High-Speed 1-port S-Parameter measurements. IEEE Transactions on Semiconductor Manufacturing, 25 (3). pp. 310-316. ISSN 0894-6507

2011

Herfst, Rodolf W. and Schmitz, Jurriaan and Scholten, Andries J. (2011) Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements. In: IEEE International Reliability Physics Symposium, IRPS 2011, 10-14 April 2011, Monterey, USA (pp. XT.6.1 -XT.6.4).

Herfst, Roelof W. and Schmitz, Jurriaan and Scholten, Andries J. (2011) Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements. In: IEEE International Reliability Physics Symposium, IRPS 2011, 10-14 April 2011, Monterey, USA (pp. XT.6.1-XT.6.4).

2010

Herfst, R.W. and Steeneken, P.G. and Tiggelman, M.P.J. and Stulemeijer, J. and Schmitz, J. (2010) Fast RF-CV characterization through high-speed 1-port S-parameter measurements. In: Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), 2010, 22-25 Mar 2010, Hirosjima, Japan (pp. pp. 170-173).

2008

Herfst, R.W. and Steeneken, P.G. and Schmitz, J. and Mank, A.J.G. and Gils, M. van (2008) Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches. In: IEEE International Reliability Physics Symposium, IRPS , April 27 - May 1 2008, Phoenix, AZ (pp. pp. 492-495).

Herfst, R.W. and Steeneken, P.G. and Schmitz, J. (2008) Identifying degradation mechanisms in RF MEMS capacitive switches. In: Proceedings of the 21st IEEE International Conference on Micro Electro Mechanical Systems, 13-17 Jan 2008, Tucson, AZ, USA (pp. pp. 168-171).

Herfst, Roelof Willem (2008) Degradation of RF MEMS capacitive switches. thesis.

Herfst, Roelof Willem (2008) Center-Shift Method for the Characterization of Dielectric Charging in RF MEMS Capacitive Switches. IEEE Transactions on Semiconductor Manufacturing, 21 (2). pp. 148-153. ISSN 0894-6507

Steeneken, Peter and Herfst, Rodolf and Suy, Hilco and Goossens, Martijn and Beek, Joost van and Bielen, Jeroen and Stulemeijer, Jiri and Schmitz, Jurriaan (2008) RF MEMS Switches for Mobile Communication. Future Fab International, 24 . pp. 24-30.

2007

Herfst, R.W. and Steeneken, P.G. and Schmitz, J. (2007) Time and voltage dependence of dielectric charging in RF MEMS capacitive switches. In: 45th Annual IEEE International Reliability Physics Symposium, IRPS 2007, 15-19 April 2007, Phoenix, Arizona (pp. pp. 417-421).

Steeneken, Peter and Suy, Hilco and Herfst, Rodolf and Goossens, Martijn and Beek, Joost van and Schmitz, Jurriaan (2007) Micro-elektromechanische schakelaars voor mobiele telefoons. Nederlands Tijdschrift voor Natuurkunde, 73e jaargang (9). pp. 314-317. ISSN 0926-4264

2006

Herfst, R.W. and Huizing, H.G.A. and Steeneken, P.G. and Schmitz, J. (2006) Characterization of dielectric charging in RF MEMS capacitive switches. In: Proceedings of the 2006 International Conference on Microelectronic Test Structures (ICMTS), 6-9 Mar 2006, Austin, TX, USA (pp. pp. 133-136).

2005

Herfst, R.W. and Huizing, H.G.A. and Steeneken, P.G. and Schmitz, J. (2005) Characterization of dielectric charging in RF MEMS. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2005, 17-18 November 2005, Veldhoven, The Netherlands (pp. pp. 11-14).

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