Author Publications

2008

Sasse, Guido T. and Acar, Mustafa and Kuper, Fred G. and Schmitz, J. (2008) RF CMOS reliability simulations. Microelectronics Reliability, 48 (8-9). pp. 1581-1585. ISSN 0026-2714

Sasse, Guido T. and Kuper, Fred G. and Schmitz, Jurriaan (2008) MOSFET Degradation Under RF Stress. IEEE Transactions on Electron Devices, 55 (11). pp. 3167-3174. ISSN 0018-9383

Sasse, Guido T. and Schmitz, Jurriaan (2008) Application and evaluation of the RF charge-pumping technique. IEEE Transactions on Electron Devices, 55 (3). pp. 881-889. ISSN 0018-9383

Sasse, Guido Theodor (2008) Reliability engineering in RF CMOS. thesis.

2007

Sasse, Guido T. and Vries de, Rein J. and Schmitz, Jurriaan (2007) Methodology for performing RF reliability experiments on a generic test structure. In: IEEE International Conference on Microelectronic Test Structures, ICMTS 2007, 19-22 March 2007, Tokyo, Japan.

2006

Bankras, Radko G. and Tiggelman, Mark P.J. and Negara, M. Adi and Sasse, Guido T. and Schmitz, Jurriaan (2006) C-V test structures for metal gate CMOS. In: International Conference on Microelectronic Test Structures, ICMTS, March 6-9, 2006, Austin, Texas, USA.

Sasse, G.T. and Schmitz, J. (2006) Charge Pumping at radio Frequencies: Methodology, Trap Response and Application. In: 44th Annual IEEE International Reliability Physics Symposium Proceedings, IRPS, 26-30 March 2006, San Jose, CA, USA.

Sasse, G.T. and Schmitz, J. (2006) Interface trap response to RF charge pumping measurements. In: 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, 2006, 23-24 Nov 2006, Veldhoven, The Netherlands.

2005

Sasse, G.T. and Vries de, H. and Schmitz, J. (2005) Charge pumping at radio frequencies [MOSFET device interface state density measurement]. In: International Conference on Microelectronic Test Structures, ICMTS, 4-7 April 2005, Leuven, Belgium.

Sasse, Guido T. and Vries, Henk and Schmitz, Jurriaan (2005) The RF charge pump technique for measuring the interface state density on leaky dielectrics. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 17-18 November 2005, Veldhoven, The Netherlands.

Tiemeijer, L.F. and Havens, R.J. and Kort de, R. and Scholten, A.J. and Langevelde van, R. and Klaassen, D.B.M. and Sasse, G.T. and Bouttement, Y. and Petot, C. and Bardy, S. and Gloria, D. and Scheer, P. and Boret, S. and Haaren van, B. and Clement, C. and Larchanche, J-F. and Lim, I-S. and Duvallet, A. and Zlotnicka, A. (2005) Record RF performance of standard 90 nm CMOS technology. In: IEEE International Electron Devices Meeting 2004, 13-15 December 2004, San Francisco, California, USA.

2004

Sasse, G.T. and Kort de, R. and Schmitz, J. (2004) Gate-capacitance extraction from RF C-V measurements. In: 34th European Solid-State Device Research Conference, ESSDERC 2004, 21-23 September 2004, Leuven, Belgium.