Author Publications

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Jump to: 2007 | 2006 | 2005 | 2004
Number of items: 11.

2007

Salm, Cora and Hoekstra, Eric and Kolhatkar, Jay S. and Hof, André J. and Wallinga, Hans and Schmitz, Jurriaan (2007) Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectronics Reliability, 47 (4-5). pp. 577-580. ISSN 0026-2714

Wel, Arnoud P. van der and Klumperink, Eric A.M. and Kolhatkar, Jay S. and Hoekstra, Eric and Snoeij, Martijn F. and Salm, Cora and Wallinga, Hans and Nauta, Bram (2007) Low-Frequency Noise Phenomena in Switched MOSFETs. IEEE Journal of Solid-State Circuits, 42 (3). pp. 540-550. ISSN 0018-9200

2006

Salm, C. and Hoekstra, E. and Kolhatkar, J.S. and Hof, A.J. and Wallinga, H. and Schmitz, J. (2006) Low-Frequency noise in hot-carrier degraded MOSFETs. In: 14th workshop on dielectrics in microelectronics WODIM, 26-28 june 2006, Santa Tecla, Italy (pp. pp. 64-65).

2005

Hoekstra, E. (2005) Large Signal Excitation Measurement Techniques for RTS Noise in MOSFETs. In: EUROCON 2005 "Computer as a tool", November, 22-24, 2005, Serbia & Montenegro, Belgrade (pp. pp. 1863-1866).

Hoekstra, E. (2005) Large Signal Excitation Measurement Techniques for Random Telegraph Signal Noise in MOSFETs. In: The International Conference on Computer as a Tool, 2005. (EUROCON 2005), 21-24 November 2005, Belgrade, Serbia & Montenegro (pp. pp. 1863-1866).

Hof, A.J. and Hoekstra, E. and Kovalgin, A.Y. and Schaijk, R. van and Baks, W.M. and Schmitz, J. (2005) The Impact of Deuterated CMOS processing on Gate Oxide Reliability. IEEE Transactions on Electron Devices, 52 (9). pp. 2111-2115. ISSN 0018-9383

Klumperink, Eric and Wel, Arnoud van der and Kolhatkar, Jay and Hoekstra, Eric and Salm, Cora and Wallinga, Hans and Nauta, Bram (2005) Reduction of 1/f Noise by Switched Biasing: an Overview. In: ProRISC 2005, 16th Workshop on Circuits, Systems and Signal Processing, 17-18 November 2005, Veldhoven, The Netherlands (pp. pp. 307-311).

Kolhatkar, Jay and Hoekstra, Eric and Hof, André and Salm, Cora and Schmitz, Jurriaan and Wallinga, Hans (2005) Impact of Hot-Carrier Degradation on the Low-Frequency Noise in MOSFETs Under Steady-State and Periodic Large-Signal Excitation. IEEE Electron Device Letters, 26 (10). pp. 764-766. ISSN 0741-3106

Wel, A.P. van der and Klumperink, E.A.M. and Hoekstra, E. and Nauta, B. (2005) Relating Random Telegraph Signal Noise in Metal Oxide Semiconductor Transistors to Interface Trap Energy Distribution. Applied Physics Letters, 87 (18). 183507/1-183507/3. ISSN 0003-6951

2004

Kolhatkar, J.S. and Hoekstra, E. and Salm, C. and Wel, A.P. van der and Klumperink, E.A.M. and Schmitz, J. and Wallinga, H. (2004) Modeling of RTS Noise in MOSFETs under Steady-State and Large-Signal Excitation. In: IEEE International Electron Devices Meeting, IEDM, 13-15 Dec. 2004, San Francisco, CA, USA (pp. pp. 759-762).

Wel, Arnoud P. van der and Klumperink, Eric A.M. and Kolhatkar, Jay and Hoekstra, Erik and Nauta, Bram (2004) Visualisation Techniques for Random Telegraph Signals in MOSFETs. In: ProRISC 2004, 15th Annual Workshop on Circuits, Systems and Signal Processing, 25-26 Nov 2004, Veldhoven, the Netherlands (pp. pp. 610-615).

This list was generated on Sat Sep 20 05:15:55 2014 CEST.