Author Publications

2007

Lisowski, W. and Keim, E.G. and Kaszkur, Z. and Berg van den, A.H.J. and Smithers, M.A. (2007) Microstructural and chemical transformation of thin Ti/Pd and TiDy/Pd bilayer films induced by vacuum annealing. Analytical and Bioanalytical Chemistry, 389 (5). pp. 1489-1498. ISSN 1618-2642

2006

Lisowski, W. and Keim, E.G. and Berg van den, A.H.J. and Smithers, M.A. (2006) Thermal desorption of deuterium from modified carbon nanotubes and its correlation to the microstructure. Carbon, 44 (5). pp. 974-982. ISSN 0008-6223

Lisowski, W. and Keim, E.G. and Berg van den, A.H.J. and Smithers, M.A. (2006) Structural and chemical characterisation of titanium deuteride films covered by nanoscale evaporated palladium layers. Analytical and Bioanalytical Chemistry, 385 (4). pp. 700-707. ISSN 1618-2642

2005

Lisowski, W. and Keim, E.G. and Berg van den, A.H.J. and Smithers, M.A. (2005) Structural and chemical evolution of single-wall carbon nanotubes under atomic and molecular deuterium interaction. Carbon, 43 (5). pp. 1073-1083. ISSN 0008-6223

Tong, H.D. and Berg van den, A.H.J. and Gardeniers, J.G.E. and Jansen, H.V. and Gielens, F.C. and Elwenspoek, M.C. (2005) Preparation of palladium-silver aloy films by a dual sputtering technique and its application in hydrogen separation membrane. Thin Solid Films, 479 . pp. 89-94. ISSN 0040-6090

2000

Lisowski, W. and Berg van den, A.H.J. and Leonard, D. and Mathieu, H.J. (2000) Characterization of titanium hydride films covered by nanoscale evaporated Au layers: ToF-SIMS, XPS and AES depth profile analysis. Surface and Interface Analysis, 29 (4). pp. 292-297. ISSN 0142-2421

1998

Lisowski, W. and Berg van den, A.H.J. and Smithers, M. (1998) Characterization of titanium hydride film after long-term air interaction: SEM, ARXPS and AES depth profile studies. Surface and Interface Analysis, 26 (3). pp. 213-219. ISSN 0142-2421

1992

Lisowski, W. and Berg van den, A.H.J. and Hanekamp, L.J. and Silfhout van, A. (1992) Composition and thickness of surface layer on molybdenum tips for scanning tunnelling microscopy (STM) studied by SEM/AES/(AR)XPS. Surface and Interface Analysis, 19 (1-12). pp. 93-99. ISSN 0142-2421