Author Publications

Article

Joseph, Arun A. and Heuvelmans, Sander and Gerritsma, Gerrit J. and Kerkhoff, Hans G. (2003) The Detection of Defects in a Niobium Tri-layer Process. IEEE Transactions on Applied Superconductivity, 13 (2). pp. 95-98. ISSN 1051-8223

Joseph, Arun A. and Heuvelmans, Sander and Gerritsma, Gerrit J. and Kerkhoff, Hans G. (2004) Test structures and their application in structural testing of digital RSFQ circuits. Physica C: Superconductivity, 403 (1-2). pp. 103-111. ISSN 0921-4534

Joseph, Arun A. and Sesé, Javier and Flokstra, Jaap and Kerkhoff, Hans G. (2005) Structural Testing of the HYPRES Niobium Process. IEEE Transactions on Applied Superconductivity, 15 (2, par). pp. 106-109. ISSN 1051-8223

Conference or Workshop Item

Joseph, Arun A. and Kerkhoff, Hans G. (2003) Towards Structural Testing of Superconductor Electronics. In: International Test Conference, ITC 2003, Sept. 30 - Oct. 2, 2003, Baltimore, USA.

Joseph, Arun A. and Kerkhoff, Hans G. (2005) Testing Superconductor Logic Integrated Circuits. In: 10th IEEE European Test Symposium (ETS'05), 22-25 May 2005, Talinn, Estonia.

Joseph, Arun A. and Kerkhoff, Hans G. and Flokstra, Jaap (2005) Structural Testing of RSFQ Circuits. In: 10th International Superconductive Electronics Conference, ISEC 2005, 5-9 September 2005, Noordwijkerhout, The Netherlands.

Joseph, Arun A. and Weusthof, Marcel H.H. and Kerkhoff, Hans G. (2004) Defect-Oriented Testing of an RSFQ D-type Flip-Flop. In: ProRISC 2004, 15th Annual Workshop on Circuits, Systems and Signal Processing, 25-26 Nov 2004, Veldhoven, the Netherlands.

Kerkhoff, Hans G. and Joseph, Arun A. (2004) Testability issues in superconductor electronics. In: Second IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2004, 28-30 Jan. 2004, Perth, Australia.

Kerkhoff, Hans G. and Joseph, Arun A. and Heuvelmans, Sander (2004) Testable design and testing of high-speed superconductor microelectronics. In: First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002, 29-31 Jan 2002 , Christchurch, New Zealand.

Thesis

Joseph, Arun Anthony (2006) Defect-based testing of LTS digital circuits. thesis.