Author Publications

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Jump to: 2000 | 1999
Number of items: 6.

2000

Akil, N. and Houtsma, V.E. and Le Minh, P. and Holleman, J. and Zieren, V. and Mooij, D. de and Woerlee, P.H. and Berg, A. van den and Wallinga, H. (2000) Modeling of Light Emission Spectra Measured on Silicon Nanometer-Scale Diode-Antifuses. Journal of Applied Physics, 88 (4). pp. 1916-1922. ISSN 0021-8979

Kovalgin, A.Y. and Akil, N.A. and Le Minh, P. and Holleman, J. and Berg, A. van den and Houtsma, V.E. and Wallinga, H. (2000) Nano-scale hotspots: a route to fast, real time and reliable gas sensing. In: SeSens workshop on Semiconductor Sensor and Actuator Technology, Nov. 30 - Dec. 1, 2000, Veldhoven, The Netherlands (pp. pp. 651-654).

Le Minh, P. and Akil, N.A. and Wallinga, H. and Woerlee, P.H. and Berg, A. van den and Holleman, J. (2000) New Efficient CMOS-Compatible Electro-Optical Device. In: SAFE 2000, Nov. 29-30, 2000, Veldhoven, The Netherlands (pp. pp. 93-95).

LeMinh, P. and Akil, N. and Wallinga, H. and Woerlee, P.H. and Berg, A. van den and Holleman, J. (2000) A Novel Silicon Electro-Optic Device for sensor applications. In: IEEE 13th Annual Meeting Lasers and Electro-Optics Society, LEOS 2000, 13-16 November 2000, Rio Grande, Puerto Rico (pp. pp. 523-524).

1999

Houtsma, V.E. and Holleman, J. and Akil, N.A. and Le Minh, P. and Zieren, V. and Berg, A. van den and Wallinga, H. and Woerlee, P.H. (1999) Visible light emission from reverse-biased silicon nanometer-scale diode-antifuses. In: International Semiconductor Conference, CAS 1999, 5-9 October 1999, Sinaia, Romania (pp. pp. 461-465).

Le Minh, P. and Akil, N.A. and Houtsma, V.E. and Woerlee, P.H. and Wallinga, H. and Berg, A. van den and Holleman, J. (1999) Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure. In: SAFE'99, Annual Workshop on Semiconductor Advances for Future Electronics, Nov. 24-25, 1999, Mierlo, The Netherlands (pp. pp. 265-268).

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