Blank, D.H.A. and Rijnders, A.J.H.M. and Broekmaat, J.J. and Roesthuis, F.J.G. (2013) Scanning Probe Microscope. Patent.
Wessels, W.A. and Broekmaat, J.J. and Beerends, R.J.L. and Koster, G. and Rijnders, A.J.H.M. (2013) Fast and gentle side approach for atomic force microscopy. Review of scientific instruments, 84 (123704). ISSN 0034-6748
Nguyen, Minh and Dekkers, Matthijn and Zalk, Maarten van and Broekmaat, Joska and Janssens, Arjen and Nazeer, Hammad and Blank, Dave and Rijnders, Guus (2011) Large-area pulsed laser deposition and assembly processes for pierzoelectric MEMS devices based on all-oxide thin films. In: International Conference on Materials for Advanced Tehcnologies, ICMAT 2011, 26 June - 1 July 2011, Suntec, Singapore.
Broekmaat, Joska and Brinkman, Alexander and Blank, Dave H.A. and Rijnders, Guus (2008) High temperature surface imaging using atomic force microscopy. Applied Physics Letters, 92 (4). 043102 . ISSN 0003-6951
Broekmaat, Joska Johannes (2008) In-situ growth monitoring with scanning force microscopy during pulsed laser deposition. thesis.