Dekkers, M. and Boschker, H. and Zalk van, M. and Nguyen, M.D. and Nazeer, H. and Houwman, E.P. and Rijnders, G. (2013) The significance of the piezoelectric coefficient d31,eff determined from cantilever structures. Journal of Micromechanics and Microengineering, 23 (2). 025008. ISSN 0960-1317
Nguyen, Minh and Dekkers, Matthijn and Zalk van, Maarten and Broekmaat, Joska and Janssens, Arjen and Nazeer, Hammad and Blank, Dave and Rijnders, Guus (2011) Large-area pulsed laser deposition and assembly processes for pierzoelectric MEMS devices based on all-oxide thin films. In: International Conference on Materials for Advanced Tehcnologies, ICMAT 2011, 26 June - 1 July 2011, Suntec, Singapore.
Sardan Sukas, Ö. and Berenschot, J.W. and Boer de, M.J. and Nguyen, M.D. and Zalk van, M. and Abelmann, L. (2011) Towards in-situ tem analysis of PLD Pb(Zr,Ti)O thin film membranes. In: 22nd Micromechanics and Microsystems Technology Europe Workshop, MME 2011, 19-22 June 2011, Tonsberg, Norway.
Zalk van, M. and Brinkman, A. and Aarts, J. and Hilgenkamp, H. (2010) Interface resistance of YBa2Cu3O7−δ/La0.67Sr0.33MnO3 ramp-type contacts. Physical Review B: Condensed matter and materials physics, 82 (13). p. 134513. ISSN 1098-0121
Zalk van, M. and Veldhorst, M. and Brinkman, A. and Aarts, J. and Hilgenkamp, H. (2009) Magnetization-induced resistance-switching effects in La0.67Sr0.33MnO3/YBa2Cu3O7â��Î´ bi- and trilayers. Physical Review B: Condensed matter and materials physics, 79 (13). p. 134509. ISSN 1098-0121
Zalk van, Maarten (2009) In between matters, interfaces in complex oxides. thesis.
Brinkman, A. and Huijben, M. and Zalk van, M. and Huijben, J. and Zeitler, U. and Maan, J.C. and Wiel van der, W.G. and Rijnders, G. and Blank, D.H.A. and Hilgenkamp, H. (2007) Magnetic effects at the interface between nonmagnetic oxides. Nature Materials, 6 (7). pp. 493-496. ISSN 1476-1122
Zalk van, M. and Brinkman, A. and Golubov, A.A. and Hilgenkamp, H. and Kim, T.H. and Moodera, J.S. and Rogalla, H. (2006) Fabrication of multiband MgB2 tunnel junctions for transport measurements. Superconductor Science and Technology, 19 (5). S226-S230. ISSN 0953-2048