Author Publications

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Number of items: 215.

2014

Hajlasz, M. and Donkers, J.J.T.M. and Sque, S.J. and Heil, S.B.S. and Gravesteijn, D.J. and Rietveld, F.J.R. and Schmitz, J. (2014) Sheet resistance under Ohmic contacts to AlGaN/GaN heterostructures. Applied physics letters, 104 . p. 242109. ISSN 0003-6951

Kaleli, B. and Nguyen, M.D. and Schmitz, J. and Wolters, R.A.M. and Hueting, R.J.E. (2014) Analysis of thin-film PZT/LNO stacks on an encapsulated TiN electrode. Microelectronic engineering, 119 . 16 - 19. ISSN 0167-9317

2013

Ferrara, A. and Steeneken, P.G. and Heringa, A. and Boksteen, B.K. and Swanenberg, M. and Scholten, A.J. and Dijk, L. van and Schmitz, J. and Hueting, R.J.E. (2013) The safe operating volume as a general measure for the operating limits of LDMOS transistors. In: International Electron Devices Meeting, IEDM 2013, 9-11 December 2013, Washington, DC, USA (pp. 6.7.1-6.7.4).

Ferrara, A. and Steeneken, P.G. and Reimann, K. and Heringa, A. and Yan, L. and Boksteen, B.K. and Swanenberg, M. and Koops, G.E.J. and Scholten, A.J. and Surdeanu, R. and Schmitz, J. and Hueting, R.J.E. (2013) Comparison of electrical techniques for temperature evaluation in power MOS transistors. In: IEEE International Conference on Microelectronic Test Structures, ICMTS 2013, 25-28 March 2013, San Diego, CA, USA (pp. pp. 115-120).

Graaf, H. van der and Aarnink, A.A.I. and Aarts, A. and Bakel, N. van and Berbee, E. and Berkien, A. and Beuzekom, M. van and Bosma, M. and Campbell, M. and Chefdeville, M.A. and Colas, P. and Colijn, A.-P. and Fomaini, A. and Fransen, M. and Giganon, A. and Giomataris, I. and Gotink, W. and Groot, N. de and Hartjes, F. and van der Heijden, B. and Hessey, N. and Jansweijer, P. and Konig, A. and Koppert, W. and Llopart, X. and Nooij, L. de and Putten, S. van der and Rövekamp, J. and Salm, C. and San Segundo Bello, D. and Schmitz, J. and Smits, S.M. and Timmermans, J. and Verkooijen, H. and Visschers, J. and Visser, J. and Wijnen, T. and Wyrsch, N. (2013) The gridpix detector: history and perspective. Modern Physics Letters A, 28 (28-13). pp. 13400211-13400217. ISSN 0217-7323

Hemert, T. van and Kaleli, B. and Hueting, R.J.E. and Esseni, D. and Dal, M.J.H. van and Schmitz, J. (2013) Strain and conduction-band offset in narrow n-type finFETs. IEEE transactions on electron devices, 60 (3). pp. 1005-1010. ISSN 0018-9383

Kazmi, S.N.R. and Salm, C. and Schmitz, J. (2013) Deep reactive ion etching of in situ boron doped LPCVD $Ge_{0.7}Si_{0.3}$ using $SF_6$ and $O_2$ plasma. Microelectronic engineering, 110 . pp. 311-314. ISSN 0167-9317

Kazmi, S.N.R. and Salm, C. and Schmitz, J. (2013) Deep reactive ion etching of in situ boron doped LPCVD $Ge_{0.7}Si_{0.3}$ using $SF_6$ and $O_2$ plasma. Microelectronic engineering, 110 . pp. 311-314. ISSN 0167-9317

Koppert, W.J.C. and Bakel, N. van and Bilevych, Y. and Colas, P. and Desch, K. and Fransen, M. and Graaf, H. van der and Hartjes, F. and Hessey, N.P. and Kaminski, J. and Schmitz, J. and Schön, R. and Zappon, F. (2013) GridPix detectors: production and beam test results. Nuclear instruments and methods in physics research. Section A: Accelerators, spectrometers, detectors and associated equipment, 732 . pp. 245-249. ISSN 0168-9002

Piccolo, G. and Sammak, A. and Hueting, R.J.E. and Schmitz, J. and Nanver, L.K. (2013) Role of junction depth in light emission from silicon p-i-n LEDs. In: 43rd European Solid-State Device Research Conference, ESSDERC 2013, 16-20 September 2013, Bucharest, Romania (pp. pp. 119-122).

Rangarajan, B. and Kovalgin, A.Y. and Wörhoff, K. and Schmitz, J. (2013) Low-temperature deposition of high-quality siliconoxynitride films for CMOS-integrated optics. Optics letters, 38 (6). pp. 941-943. ISSN 0146-9592

Rangarajan, Balaji and Kovalgin, Alexey Y. and Schmitz, Jurriaan (2013) Deposition and properties of silicon oxynitride films with low propagation losses by inductively coupled PECVD at 150 °C. Surface and coatings technology, 230 . pp. 46-50. ISSN 0257-8972

Schmitz, Jurriaan (2013) Microchip post-processing: There is plenty of room at the top. In: Future trends in microelectronics: frontiers and innovation. Future trends in microelectronics, 7 . John Wiley & Sons, Inc., Hoboken, NJ, pp. 110-119. ISBN 9781118442166

Van Bui, Hao and Kovalgin, Alexey and Schmitz, Jurriaan and Wolters, Rob A.M. (2013) Conduction and electric field effect in ultra-thin TiN films. Applied physics letters, 103 (5). 051904. ISSN 0003-6951

Wang, J and Salm, Cora and Schmitz, Jurriaan (2013) Comparison of C-V measurement methods for RF-MEMS capacitive switches. In: IEEE International Conference on Microelectronic Test Structures, ICMTS 2013, 25-28 March, 2013, San Diego, CA, USA (pp. pp. 53-58).

2012

Boksteen, B.K. and Dhar, S. and Ferrara, A. and Heringa, A. and Hueting, R.J.E. and Koops, G.E.J. and Salm, C. and Schmitz, J. (2012) On the degradation of field-plate assisted RESURF power devices. In: IEEE International Electron Devices Meeting, IEDM 2012 , 10-13 December 2012, San Francisco, CA, USA (pp. pp. 311-314).

Faber, Erik J. and Wolters, Rob A.M. and Schmitz, Jurriaan (2012) Novel test structures for dedicated temperature budget determination. IEEE Transactions on Semiconductor Manufacturing, 25 (3). pp. 339-345. ISSN 0894-6507

Groenland, A.W. and Wolters, R.A.M. and Kovalgin, A.Y. and Schmitz, J. (2012) Four point probe structures with buried and surface electrodes for the electrical characterization of ultrathin conducting films. IEEE Transactions on Semiconductor Manufacturing, 25 (2). pp. 1-24. ISSN 0894-6507

Groenland, A.W. and Vereshchagina, E. and Kovalgin, A.Y. and Wolters, R.A.M. and Gardeniers, J.G.E. and Schmitz, J. (2012) Micro- and nano-link ultra-low power heaters for sensors. In: European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, 17 September, 17-09-2012, USA (pp. 169 - 172).

Herfst, Rodolf W. and Steeneken, Peter G. and Tiggelman, Mark P.J. and Stulemeijer, Jiri and Schmitz, Jurriaan (2012) Fast RF-CV characterization through High-Speed 1-port S-Parameter measurements. IEEE Transactions on Semiconductor Manufacturing, 25 (3). pp. 310-316. ISSN 0894-6507

Kazmi, S.N.R. and Kovalgin, A.Y. and Aarnink, A.A.I. and Salm, C. and Schmitz, J. (2012) Low-stress highly-conductive in-situ boron doped Ge$_{0.7}$Si$_{0.3}$ films by LPCVD. ECS journal of solid state science and technology, 1 (5). P222-P226. ISSN 2162-8777

Kazmi, Syed Naveed Riaz and Aarnink, Tom and Salm, Cora and Schmitz, Jurriaan (2012) CMOS-MEMS Post Processing Compatible Capacitively Transduced GeSi Resonators. In: Proceedings of 2012 IEEE International Frequency Control Symposium (IFCS) , 21-24 May 2012, Baltimore, USA (pp. pp. 1-4).

Piccolo, G. and Kovalgin, A.Y. and Schmitz, J. (2012) Nanoscale carrier injectors for high luminescence Si-based LEDs. Solid-state electronics, 74 (Special Issue). pp. 43-48. ISSN 0038-1101

Rangarajan, B. and Kovalgin, A.Y. and Oesterlin, P. and Kloe, R. de and Brunets, I. and Schmitz, J. (2012) Laterally confined large-grained Poly-GeSi films: crystallization and dopant activation using green laser. ECS journal of solid state science and technology, 1 (6). pp. 263-268. ISSN 2162-8777

2011

Andricciola, Pietro and Tuinhout, Hans and Wils, Nicole and Schmitz, Jurriaan (2011) Microsecond pulsed DC matching measurements on MOSFETs in strong and weak inversion. In: 24th International Conference on Microelectronic Test Structures, ICMTS 2011, 4-7 April 2011, Amsterdam, the Netherlands (pp. pp. 90-94).

Bilevych, Y. and Blanco Carballo, V.M. and Chefdeville, M.A. and Colas, P. and Delagnes, E. and Fransen, M. and Graaff, H. van der and Koppert, W.J.C. and Melai, J. and Salm, C. and Schmitz, J. and Timmermans, J. and Wyrsch, N. (2011) Spark protection layers for CMOS pixel anode chips in MPGDs. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 629 (1). pp. 66-73. ISSN 0168-9002

Blanco Carballo, V.M. and Fransen, M. and Graaf, H. van der and Lu, J. and Schmitz, J. (2011) A CMOS compatible Microbulk Micromegas-like detector using silicon oxide as spacer material. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 629 (1). pp. 118-122. ISSN 0168-9002

Brunets, Ihor and Walters, Robert J. and Kovalgin, Alexey Y. and Polman, Albert and Schmitz, Jurriaan (2011) Realization of Silicon-Nanodots-Based CMOS Backend-Compatible Electrical SPP Source. In: 219th ECS Meeting, 1-6 May 2011, Montreal, QC, Canada.

Faber, Erik J. and Wolters, Rob A.M. and Schmitz, Jurriaan (2011) On the kinetics of platinum silicide formation. Applied Physics Letters, 98 (8). 082102. ISSN 0003-6951

Faber, Erik J. and Wolters, Rob A.M. and Schmitz, Jurriaan (2011) Gap-closing test structures for temperature budget determination. In: 24th International Conference on Microelectronic Test Structures, ICMTS 2011, 4-7 April 2011, Amsterdam, the Netherlands (pp. pp. 165-169).

Groenland, A.W. and Kovalgin, A.Y. and Schmitz, J. and Wolters, R.A.M. (2011) Nano-Link Based Ultra Low Power Micro Electronic Hotplates for Sensors and Actuators. ECS Transactions, 35 (30). pp. 25-34. ISSN 1938-5862

Groenland, A.W. and Wolters, R.A.M. and Kovalgin, A.Y. and Schmitz, J. (2011) A Difference in Using Atomic Layer Deposition or Physical Vapour Deposition TiN as Electrode Material in Metal-Insulator-Metal and Metal-Insulator-Silicon Capacitors. Journal of Nanoscience and Nanotechnology, 11 (9). pp. 8368-8373. ISSN 1533-4880

Hemert, T. van and Kaleli, B. and Hueting, R.J.E. and Esseni, D. and Dal, M.J.H. van and Schmitz, J. (2011) Extracting the Conduction Band Offset in Strained FinFETs from Subthreshold-Current Measurements. In: 41st European Solid-State Device Research Conference, ESSDERC 2011, 12-16 September 2011, Helsinki, Finland (pp. pp. 275-278).

Hemert, T. van and Sakriotis, D. and Hueting, R.J.E. and Schmitz, J. (2011) Exploring capacitance-voltage measurements to find the piezoelectric coefficient of aluminum nitride. In: 24th International Conference on Microelectronic Test Structures, ICMTS 2011, 4-7 April 2011, Amsterdam, the Netherlands (pp. pp. 69-73).

Herfst, Rodolf W. and Schmitz, Jurriaan and Scholten, Andries J. (2011) Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements. In: IEEE International Reliability Physics Symposium, IRPS 2011, 10-14 April 2011, Monterey, USA (pp. XT.6.1 -XT.6.4).

Herfst, Roelof W. and Schmitz, Jurriaan and Scholten, Andries J. (2011) Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements. In: IEEE International Reliability Physics Symposium, IRPS 2011, 10-14 April 2011, Monterey, USA (pp. XT.6.1-XT.6.4).

Kazmi, S.N.R. and Aarnink, A.A.I. and Kovalgin, A.Y. and Salm, C. and Schmitz, J. (2011) Low Stress In Situ Boron Doped Poly SiGe Layers for MEMS Modular Integration with CMOS. ECS Transactions, 35 (30). pp. 45-52. ISSN 1938-5862

Koppert, W.J.C. and Fransen, M. and Bakel, N. van and Graaf, H. van der and Hartjes, F. and Timmermans, J. and Visser, J. and Kluit, R. and Gromov, V. and Zappon, F. and Blanco Carballo, V. and Schmitz, J. and Bilevych, Y. (2011) Charge protection characterisation and drift time resolution improvement for GridPix. In: IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011, 23-29 October 2011, Valencia, Spain (pp. pp. 1799-1802).

Lu, J. and Liu, W. and Kovalgin, A.Y. and Sun, Y. and Schmitz, J. (2011) Materials Characterization of CIGS solar cells on Top of CMOS chips. In: MRS Spring Meeting - Symposium E – Energy Harvesting, 25-29 April 2011, San Francisco, CA, USA (pp. e06-23).

Lu, Jiwu and Kovalgin, Alexey Y. and Werf, Karine H.M. van der and Schropp, Ruud E.I. and Schmitz, Jurriaan (2011) Integration of Solar Cells on Top of CMOS Chips Part I: a-Si Solar Cells. IEEE Transactions on Electron Devices, 58 (5). pp. 2014-2021. ISSN 0018-9383

Lu, Jiwu and Liu, Wei and Kovalgin, Alexey Y. and Sun, Yun and Schmitz, Jurriaan (2011) Integration of Solar Cells on Top of CMOS Chips - Part II: CIGS Solar Cells. IEEE Transactions on Electron Devices, 58 (8). pp. 2620-2627. ISSN 0018-9383

Piccolo, G. and Puliyankot, V. and Kovalgin, A.Y. and Hueting, R.J.E. and Heringa, A. and Schmitz, J. (2011) Light emission enhancement by geometrical scaling of carrier injectors in Si-based LEDs. In: 41st European Solid-State Device Research Conference, ESSDERC 2011, 12-16 September 2011, Helsinki, Finland (pp. pp. 175-178).

Puliyankot, V. and Piccolo, G. and Hueting, R.J.E. and Heringa, A. and Kovalgin, A. and Schmitz, J. (2011) Increased light emission by geometrical changes in Si LEDs. In: 8th International Conference on Group IV Photonics, GFP 2011, 14-16 September 2011, London, UK (pp. pp. 287-289).

Rangarajan, Balaji and Brunets, Ihor and Oesterlin, Peter and Kovalgin, Alexey and Schmitz, Jurriaan (2011) Characterization of Green Laser Crystallized GeSi Thin Films. In: 2011 MRS Spring Meeting, 25-29 April 2011, San Francisco, CA, USA (pp. a06-04).

Van Bui, H. and Groenland, A.W. and Aarnink, A.A.I. and Wolters, R.A.M. and Schmitz, J. and Kovalgin, A.Y. (2011) Growth Kinetics and Oxidation Mechanism of ALD TiN Thin Films Monitored by In Situ Spectroscopic Ellipsometry. Journal of the Electrochemical Society, 158 . pp. 214-220. ISSN 0013-4651

2010

Blanco Carballo, V. and Chefdeville, M.A. and Decowski, M.P. and Fransen, M. and van der Graaf, H. and Koppert, W.J.C. and Schmitz, J. (2010) Applications of GridPix detectors. Journal of Instrumentation, 5 (2). pp. 1-5. ISSN 1748-0221

Boksteen, B.K. and Hueting, R.J.E. and Salm, C. and Schmitz, J. (2010) An Initial study on The Reliability of Power Semiconductor Devices. In: STW.ICT Conference 2010, 18-19 Nov 2010, Veldhoven, The Netherlands (pp. pp. 68-72).

Faber, E.J. and Wolters, R.A.M. and Schmitz, J. (2010) Novel test structures for temperature budget determination during wafer processing. In: IEEE International Conference on Microelectronic Test Structures (ICMTS), 2010, 22-25 Mar 2010, Hirosjima, Japan (pp. pp. 30-33).

Groenland, A.W. and Wolters, R.A.M. and Kovalgin, A.Y. and Schmitz, J. (2010) On the leakage problem of MIM capacitors due to improper etching of titanium nitride. In: STW.ICT Conference 2010, 18-19 Nov 2010, Veldhoven, The Netherlands (pp. pp. 89-92).

Hemert, T. van and Hueting, R.J.E. and Rajasekharan, B. and Salm, C. and Schmitz, J. (2010) On the modelling and optimisation of a novel Schottky based silicon rectifier. In: 40th European Solid-State Device Research, Essderc 2010, 13-17 Sep 2010, Sevilla, Spain (pp. pp. 460-463).

Herfst, R.W. and Steeneken, P.G. and Tiggelman, M.P.J. and Stulemeijer, J. and Schmitz, J. (2010) Fast RF-CV characterization through high-speed 1-port S-parameter measurements. In: Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), 2010, 22-25 Mar 2010, Hirosjima, Japan (pp. pp. 170-173).

Jose, Sumy and Jansman, André B.M. and Hueting, Raymond J.E. and Schmitz, Jurriaan (2010) Optimized reflector stacks for solidly mounted bulk acoustic wave resonators. IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 57 (12). pp. 2753-2763. ISSN 0885-3010

Kaleli, B. and Aarnink, A.A.I. and Smits, S.M. and Hueting, R.J.E. and Wolters, R.A.M. and Schmitz, J. (2010) Electron Beam Lithography of HSQ and PMMA Resists and Importance of their Properties to Link the Nano World to the Micro World. In: STW.ICT Conference 2010, 18-19 Nov 2010, Veldhoven, The Netherlands (pp. pp. 105-108).

Kazmi, S.N.R. and Rangarajan, B. and Aarnink, T. and Salm, C. and Schmitz, J. (2010) Low Stressed In-situ Boron doped Poly SiGe Layers for High-Q Resonators. In: STW.ICT Conference 2010, 18-19 Nov 2010, Veldhoven, The Netherlands (pp. pp. 109-113).

Lu, J. and Liu, W. and Werf, C.H.M. van der and Kovalgin, A.Y. and Sun, Y. and Schropp, R.E.I. and Schmitz, J. (2010) Above-CMOS a-Si and CIGS Solar Cells for Powering Autonomous Microsystems. In: IEEE International Electron Devices Meeting, IEDM 2010, 6-8 December 2010, San Francisco, CA, USA (pp. 31.3.1.-31.3.4).

Melai, J. and Blanco Carballo, V.M. and Salm, C. and Schmitz, J. (2010) Suspended membranes, cantilevers and beams using SU-8 foils. Microelectronic Engineering, 87 (5-8). pp. 1274-1277. ISSN 0167-9317

Melai, Joost and Breskin, Amos and Cortesi, Marco and Bilevych, Yevgen and Fransen, Martin and Graaf, Harry van der and Visschers, Jan and Blanco Carballo, Víctor and Salm, Cora and Schmitz, Jurriaan (2010) A UV sensitive integrated micromegas with timepix readout. Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 628 . pp. 133-137. ISSN 0168-9002

Melai, Joost and Lyashenko, Alexey and Breskin, Amos and Graaf, Harry van der and Timmermans, Jan and Visschers, Jan and Salm, Cora and Schmitz, Jurriaan (2010) An integrated micromegas UV-photon detector. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 633 . pp. 194-197. ISSN 0168-9002

Piccolo, G. and Kovalgin, A.Y. and Schmitz, J. (2010) On the effect of nano-injectors on conduction in silicon p-i-n diodes. In: STW.ICT Conference 2010, 18-19 Nov 2010, Veldhoven, The Netherlands (pp. pp. 140-142).

Rajasekharan, B. and Hueting, R.J.E. and Salm, C. and Hemert, T. van and Wolters, R.A.M. and Schmitz, J. (2010) Fabrication and characterization of the charge-plasma diode. IEEE electron device letters, 31 (6). pp. 528-530. ISSN 0741-3106

2009

Arguirov, T. and Mchedlidze, T. and Kittler, M. and Reiche, M. and Wilhelm, T. and Hoang, T. and Holleman, J. and Schmitz, J. (2009) Silicon based light emitters utilizing radiation from dislocations; electric field induced shift of the dislocation-related luminescence. Physica E: Low-dimensional Systems and Nanostructures, 41 (6). pp. 907-911. ISSN 1386-9477

Bilevych, Y. and Blanco Carballo, V.M. and Breur, S. and Fransen, M. and Graaf, H. van der and Hartjes, F. and Hessey, N. and Kalter, R. and Ketel, T. and Koppert, W.C. and Rogers, M. and Schmitz, J. and Timmermans, J. and Visschers, J. (2009) The performance of GridPix detectors. In: IEEE Nuclear Science Symposium Conference Record 2009, 24 October - 1 November 2009, Orlando, FL, USA (pp. pp. 231-236).

Bilevych, Y. and Blanco Carballo, V.M. and Chefdeville, M.A. and Fransen, M. and Graaf, H. van der and Salm, C. and Schmitz, J. and Timmermans, J. (2009) Twingrid: a wafer post-processed multistage micro patterned gaseous detector. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 610 (3). pp. 644-648. ISSN 0168-9002

Blanco Carballo, V.M. and Bilevych, Y. and Chefdeville, M.A. and Fransen, M. and van der Graaf, H. and Salm, C. and Schmitz, J. and Timmermans, J. (2009) GEMGrid: a wafer post-processed GEM-like radiation detector. Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 608 (1). pp. 86-91. ISSN 0168-9002

Blanco Carballo, V.M. and Melai, J. and Salm, C. and Schmitz, J. (2009) Moisture resistance of SU-8 and KMPR as structural material. Microelectronic Engineering, 86 (4-6). pp. 765-768. ISSN 0167-9317

Brunets, I. and Boogaard, A. and Smits, S.M. and Vries, H. de and Aarnink, A.A.I. and Holleman, J. and Kovalgin, A.Y. and Schmitz, J. (2009) Low temperature TFTs with poly-stripes. In: Proceedings of the 5th International Thin Film Transistor Conference ITC'09, 5-6 Mar 2009, Palaiseau, France (pp. pp. 62-65).

Brunets, I. and Holleman, J. and Kovalgin, A.Y. and Boogaard, A. and Schmitz, J. (2009) Low-temperature fabricated TFTs on polysilicon stripes. IEEE Transactions on Electron Devices, 56 (8). pp. 1637-1644. ISSN 0018-9383

Faber, Erik J. and Wolters, Rob A.M. and Rajasekharan, Bijoy and Salm, Cora and Schmitz, Jurriaan (2009) Monitoring silicide formation via in situ resistance measurements. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 67-70).

Groenland, A.W. and Wolters, R.A.M. and Kovalgin, A.Y. and Schmitz, J. (2009) Four point probe structures with buried electrodes for the electrical characterization of ultrathin conducting films. In: IEEE International Conference on Microelectronic Test Structures, ICMTS 2009, 30 March - 2 April 2009, Oxnard, CA, USA (pp. pp. 191-195).

Groenland, A.W. and Wolters, R.A.M. and Kovalgin, A.Y. and Schmitz, J. (2009) Contact chain measurements for ultrathin conducting films. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 150-152).

Kazmi, S.N.R. and Salm, Cora and Schmitz, J. (2009) Materials selection for low temperature processed high Q resonators using ashby approach. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 81-84).

Lu, Jiwu and Kovalgin, Alexey Y. and Schmitz, Jurriaan (2009) Influence of passivation process on chip performance. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 542-544).

Melai, Joost and Lyashenko, Alexey and Breskin, Amos and Graaf, Harry van der and Timmermans, Jan and Visschers, Jan and Salm, Cora and Schmitz, Jurriaan (2009) Photocathodes for a post-processed imaging array. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 32-35).

Melai, Joost and Salm, Cora and Smits, Sander and Visschers, Jan and Schmitz, Jurriaan (2009) The electrical conduction and dielectric strength of SU-8. Journal of Micromechanics and Microengineering, 19 (6). 065012. ISSN 0960-1317

Melai, Joost and Salm, Cora and Wolters, Rob and Schmitz, Jurriaan (2009) Qualitative and quantitative characterization of outgassing from SU-8. Microelectronic Engineering, 86 (4-6). pp. 761-764. ISSN 0167-9317

Piccolo, G. and Kovalgin, A.Y. and Schmitz, J. (2009) Effect of carrier injector size on silicon LED performance. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 167-169).

Puliyankot, V. and Hueting, R.J.E. and Schmitz, J. (2009) An initial modelling and simulation study on the 1D Si-Based LED. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 170-173).

Rajasekharan, B. and Salm, C. and Wolters, R.A.M. and Aarnink, A.A.I. and Boogaard, A. and Schmitz, J. (2009) Metal contacts to lowly doped Si and ultra thin SOI. In: Proceedings of Fifth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits, 19-21 Jan 2009, Gotheburg, Sweden (pp. pp. 29-30).

Rajasekharan, Bijoy and Salm, Cora and Hueting, Ray and Wolters, Rob and Schmitz, Jurriaan (2009) Metal contacts to lowly doped Si and ultra thin SOI. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 103-104).

Rangarajan, Balaji and Brunets, Ihor and Holleman, Jisk and Kovalgin, Alexey Y. and Schmitz, Jurriaan (2009) TFTs as photodetectors for optical interconnects. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, 26-27 Nov 2009, Veldhoven, The Netherlands (pp. pp. 52-54).

Schmitz, J. (2009) Special Section on the 2008 International Conference on Microelectronic Test Structure. In: Special Section on the 2008 International Conference on Microelectronic Test Structure (pp. pp. 1-50).

Steen, Jan-Laurens P.J. van der and Hueting, R.J.E. and Schmitz, J. (2009) Extracting Energy Band Offsets on Long-Channel Thin Silicon-on-Insulator MOSFETs. IEEE Transactions on Electron Devices, 56 (9). pp. 1999-2007. ISSN 0018-9383

Tiggelman, M.P.J. and Reimann, K. and Van Rijs, F. and Schmitz, J. and Hueting, R.J.E. (2009) On the Trade-Off Between Quality Factor and Tuning Ratio in Tunable High-Frequency Capacitors. IEEE Transactions on Electron Devices, 56 (9). pp. 2128-2136. ISSN 0018-9383

Van Bui, Hao and Aarnink, A.A.I. and Kovalgin, A.Y. and Wolters, R.A.M. and Schmitz, J. (2009) Thermal atomic layer deposition and oxidation of TiN monitored by in-situ spectroscopic ellipsometry. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 59-62).

Walters, R.J. and Loon, R.V.A. van and Brunets, I. and Schmitz, J. and Polman, A. (2009) A silicon-based electrical source of surface plasmon polaritons. Nature Materials, 8 (12). pp. 1-4. ISSN 1476-1122

Walters, Robert J. and Loon, Rob V.A. van and Brunets, Ihor and Schmitz, Jurriaan and Polman, Albert (2009) A silicon-based electrical source for surface plasmon polaritons. In: 6th International Conference on GroupIV Photonics GFP'09, 9-11 Sept 2009, San Francisco, USA (pp. pp. 74-76).

2008

Bilevych, Y. and Blanco Carballo, V.M. and Chefdeville, M. and Fransen, M. and Graaf, H. van der and Groot, N. de and Hartjes, F. and Konig, A. and Nooij, L. de and Rogers, M. and Schmitz, J. and Timmermans, J. and Romaniouk, A. and Konovalov, S. and Morozov, S. (2008) New results from GridPix detectors. In: IEEE Nuclear Science Symposium, NSS, 19-25 October 2008, Dresden, Germany (pp. pp. 1311-1315).

Blanco Carballo, V.M. and Melai, J. and Salm, C. and Schmitz, J. (2008) Moisture resistance of SU-8 and KMPR as structural material for integrated gaseous detectors. In: 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2008, 27-28 November 2008, Veldhoven, The Netherlands (pp. pp. 395-398).

Blanco Carballo, Víctor Manuel and Chefdeville, Maximilien and Fransen, Martin and Graaf, Harry van der and Melai, Joost and Salm, Cora and Schmitz, Jurriaan and Timmermans, Jan (2008) A Radiation Imaging Detector Made by Postprocessing a Standard CMOS Chip. IEEE Electron Device Letters, 29 (6). pp. 585-588. ISSN 0741-3106

Boogaard, A. and Roesthuis, R. and Brunets, I. and Aarnink, A.A.I. and Kovalgin, A.Y. and Holleman, J. and Wolters, R.A.M. and Schmitz, J. (2008) Deposition of High-Quality SiO2 Insulating Films at Low Temperatures by means of Remote PECVD. In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands (pp. pp. 452-456).

Brunets, I. and Holleman, J. and Kovalgin, A.Y. and Schmitz, J. (2008) Poly-Si stripe TFTs by Grain-Boundary controlled crystallization of Amorphous-Si. In: Proceedings of the 38th European Solid-State Device Research Conference, 15-19 September 2008, Edinburgh, Schotland (pp. pp. 87-90).

Brunets, I. and van Loon, R.V.A. and Walters, R.J. and Polman, A. and Boogaard, A. and Aarnink, A.A.I. and Kovalgin, A.Y. and Wolters, R.A.M. and Holleman, J. and Schmitz, J. (2008) Light emission from silicon nanocrystals embedded in ALD-alumina at low temperatures. In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands (pp. pp. 399-402).

Chefdeville, M. and Graaf, H. van der and Hartjes, F. and Timmermans, J. and Visschers, J. and Blanco Carballo, V.M. and Salm, C. and Schmitz, J. and Smits, S. and Colas, P. and Giomataris, I. (2008) Pulse height fluctuations of integrated micromegas detectors. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 591 (1). pp. 147-150. ISSN 0168-9002

Groenland, A.W. and Brunets, I. and Boogaard, A. and Aarnink, A.A.I. and Kovalgin, A.Y. and Schmitz, J. (2008) Thermal and plasma-enhanced oxidation of ALD TiN. In: 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2008, 27-28 November 2008, Veldhoven, The Netherlands (pp. pp. 468-471).

Herfst, R.W. and Steeneken, P.G. and Schmitz, J. and Mank, A.J.G. and Gils, M. van (2008) Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches. In: IEEE International Reliability Physics Symposium, IRPS , April 27 - May 1 2008, Phoenix, AZ (pp. pp. 492-495).

Herfst, R.W. and Steeneken, P.G. and Schmitz, J. (2008) Identifying degradation mechanisms in RF MEMS capacitive switches. In: Proceedings of the 21st IEEE International Conference on Micro Electro Mechanical Systems, 13-17 Jan 2008, Tucson, AZ, USA (pp. pp. 168-171).

Hoang, T. and Holleman, J. and Schmitz, J. (2008) SOI LEDs with carrier confinement. In: Materials Science Forum. Trans Tech Publications, Switzerland, Stafa- Zurich, Switzerland, pp. 101-116. ISBN 9780878493586

Hueting, R.J.E. and Rajasekharan, B. and Salm, C. and Schmitz, J. (2008) The charge plasma P-N diode. IEEE electron device letters, 29 (12). pp. 1367-1369. ISSN 0741-3106

Kazmi, S.N.R. and Schmitz, J. (2008) Comparison of gate capacitance extraction methodologies. In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands (pp. pp. 562-564).

Kovalgin, Alexey Y. and Isai, Gratiela and Holleman, Jisk and Schmitz, Jurriaan (2008) Low-Temperature SiO2 Layers Deposited by Combination of ECR Plasma and Supersonic Silane/Helium Jet. Journal of the Electrochemical Society, 155 (2). G21-G28. ISSN 0013-4651

Kuindersma, P. and Hoang, T. and Schmitz, J. and Vijayaraghavan, M.N. and Dijkstra, M. and Noort, W.A. van and Vanhoucke, T. and Peters, W.C.M. and Kramer, M.C.J.C.M. (2008) The power conversion efficiency of visible light emitting devices in standard BiCMOS processes. In: 5th IEEE International Conference on Group IV Photonics, 2008, 17-19 Sept 2008, Sorrento, Italy (pp. pp. 256-258).

Lu, J. and Kovalgin, A.Y. and Schmitz, J. (2008) Functional layers for CIGS solar cell on-chip fabrication during post-processing. In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands (pp. pp. 487-490).

Mchedlidze, T. and Arguirov, T. and Kittler, M. and Hoang, T. and Holleman, J. and Le Minh, P. and Schmitz, J. (2008) Engineering of dislocation-loops for light emission from silicon diodes. Solid State Phenomena, 131-13 . pp. 303-308. ISSN 1012-0394

Melai, Joost and Blanco Carballo, Víctor M. and Salm, Cora and Wolters, Rob and Schmitz, Jurriaan (2008) Further outgassing studies on SU-8. In: 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2008, 27-28 November 2008, Veldhoven, The Netherlands (pp. pp. 491-494).

Nijhuis, Christian A. and Maat, Jurjen ter and Bisri, Satria Z. and Weusthof, Marcel H.H. and Salm, Cora and Schmitz, Jurriaan and Ravoo, Bart Jan and Huskens, Jurriaan and Reinhoudt, David N. (2008) Preparation of metal-SAM-dendrimer-SAM-metal junctions by supramolecular metal transfer printing. New Journal of Chemistry, 32 (4). pp. 652-661. ISSN 1144-0546

Nijhuis, Christian A. and Maat, Jurjen ter and Bisri, Satria Z. and Weusthof, Marcel H.H. and Salm, Cora and Schmitz, Jurriaan and Ravoo, Bart Jan and Huskens, Jurriaan and Reinhoudt, David N. (2008) Preparation of metal–SAM–dendrimer–SAM–metal junctions by supramolecular metal transfer printing,. New Journal of Chemistry, 32 . pp. 652-661. ISSN 1144-0546

Piccolo, G. and Hoang, T. and Holleman, J. and Kovalgin, A.Y. and Schmitz, J. (2008) Silicon LEDs with antifuse injection. In: 5th IEEE International Conference on Group IV Photonics, 2008, 17-19 Sept 2008, Sorrento, Italy (pp. pp. 49-51).

Piccolo, G. and Hoang, T. and Holleman, J. and Kovalgin, A.Y. and Schmitz, J. (2008) Antifuse injectors for SOI LEDs. In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands (pp. pp. 573-575).

Rajasekharan, B. and Salm, C. and Hueting, R.J.E. and Hoang, T. and Schmitz, J. (2008) Dimensional scaling effects on transport properties of ultrathin body p-i-n diodes. In: Proceedings of the 9th Conference on ULtimate Integration on Silicon, 12-14 Mar 2008, Udine, Italy (pp. pp. 195-198).

Rajasekharan, B. and Hueting, R.J.E. and Salm, C. and Hoang, T. and Schmitz, J. (2008) Charge plasma diode - a novel device concept. In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands (pp. pp. 576-579).

Salm, Cora and Blanco Carballo, Víctor M. and Melai, Joost and Schmitz, Jurriaan (2008) Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip. Microelectronics Reliability, 48 (8-9). pp. 1139-1143. ISSN 0026-2714

Sasse, Guido T. and Acar, Mustafa and Kuper, Fred G. and Schmitz, J. (2008) RF CMOS reliability simulations. Microelectronics Reliability, 48 (8-9). pp. 1581-1585. ISSN 0026-2714

Sasse, Guido T. and Kuper, Fred G. and Schmitz, Jurriaan (2008) MOSFET Degradation Under RF Stress. IEEE Transactions on Electron Devices, 55 (11). pp. 3167-3174. ISSN 0018-9383

Sasse, Guido T. and Schmitz, Jurriaan (2008) Application and evaluation of the RF charge-pumping technique. IEEE Transactions on Electron Devices, 55 (3). pp. 881-889. ISSN 0018-9383

Schmitz, J. and Vries, R. de and Salm, C. and Hoang, T. and Hueting, R.J.E. and Holleman, J. (2008) On the switching speed of SOI LEDs. In: Proceedings of the Fourth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits, 23-25 Jan 2008, Cork, Ireland (pp. pp. 101-102).

Schmitz, Jurriaan and Thewes, Roland (2008) Foreword: Special issue devoted to the ESSDERC’07 conference. Solid-State Electronics, 52 (9). p. 1265. ISSN 0038-1101

Steen, J.-L.P.J. van der and Hueting, R.J.E. and Schmitz, J. (2008) Extracting energy band offsets on Thin Silicon–On–Insulator MOSFETs. In: 38th European Solid-State Device Research Conference, 15-19 September 2008, Edinburgh, Schotland (pp. pp. 242-245).

Steen, J.-L.P.J. van der and Hueting, R.J.E. and Schmitz, J. (2008) Energy band offset extraction – a comparative study –. In: 11th annual workshop on semiconductor advances for future electronics and sensors, SAFE 2008, 27-28 Nov 2008, Veldhoven, The Netherlands (pp. pp. 592-595).

Steeneken, Peter and Herfst, Rodolf and Suy, Hilco and Goossens, Martijn and Beek, Joost van and Bielen, Jeroen and Stulemeijer, Jiri and Schmitz, Jurriaan (2008) RF MEMS Switches for Mobile Communication. Future Fab International, 24 . pp. 24-30.

Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Keur, W. and Mauczock, R. and Schmitz, J. and Hueting, R.J.E. (2008) Identifying dielectric and resistive electrode losses in high-density capacitors at radio frequencies. In: 21st ICMTS 2008 IEEE Conference on Microelectronic Test Structures, 24-27 March 2008, Edinburgh, Schotland (pp. pp. 190-195).

Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Mauczok, R. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2008) The trade-off between tuning ratio and quality factor of BaxSr1-xTiO3 MIM capacitors on alumina substrates. In: 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2008, 27-28 November 2008, Veldhoven, The Netherlands (pp. pp. 506-508).

Walters, R.J. and Loon, R. van and Polman, A. and Brunets, I. and Piccolo, G. and Schmitz, J. (2008) Luminescence properties of silicon nanocrystals in Al2O3 fabricated at low temperature. In: 5th IEEE International Conference on Group IV Photonics, 2008, 17-19 Sept 2008, Sorrento, Italy (pp. pp. 41-42).

2007

Blanco Carballo, V.M. and Chefdeville, M. and Colas, P. and Giomataris, Y. and Graaf, H. van der and Gromov, V. and Hartjes, F. and Kluit, R. and Koffeman, E. and Salm, C. and Schmitz, J. and Smits, S.M. and Timmermans, J. and Visschers, J.L. (2007) Charge amplitude distribution of the Gossip gaseous pixel detector. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 583 (1). pp. 42-48. ISSN 0168-9002

Blanco Carballo, V.M. and Salm, C. and Smits, S.M. and Schmitz, J. and Chefdeville, M. and Graaf, H. van der and Timmermans, J. and Visschers, J.L. (2007) On the geometrical design of integrated micromegas detectors. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 576 (1). pp. 1-4. ISSN 0168-9002

Blanco Carballo, V.M. and Salm, C. and Smits, S.M. and Schmitz, J. and Melai, J. and Chefdeville, M. and Graaf, H. van der (2007) Technological aspects of gaseous pixel detectors fabrication. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov. 2007, Veldhoven, The Netherlands (pp. pp. 501-503).

Boogaard, A. and Kovalgin, A.Y. and Brunets, I. and Aarnink, A.A.I. and Holleman, J. and Wolters, R.A.M. and Schmitz, J. (2007) Characterization of SiO2 films deposited at low temperature by means of remote ICPECVD. Surface & Coatings Technology, 201 (22-23). pp. 8976-8980. ISSN 0257-8972

Boogaard, A. and Kovalgin, A.Y. and Brunets, I. and Aarnink, A.A.I. and Wolters, R.A.M. and Holleman, J. and Schmitz, J. (2007) On the verification of EEDFs in plasmas with silane using optical emission spectroscopy. ECS Transactions, 6 (1). pp. 259-270. ISSN 1938-5862

Boogaard, A. and Kovalgin, A.Y. and Brunets, I. and Holleman, J. and Schmitz, J. (2007) Optical and Electrical Characterization of SiO2 films deposited at low temperature by means of remote ICPECVD. In: Proceedings of the 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, 29 - 30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 404-407).

Brunets, I. and Aarnink, A.A.I. and Boogaard, A. and Kovalgin, A.Y. and Wolters, R.A.M. and Holleman, J. and Schmitz, J. (2007) Low-temperature LPCVD of Si nanocrystals from disilane and trisilane (Silcore®) embedded in ALD-alumina for non-volatile memory devices. Surface & Coatings Technology, 201 . pp. 9209-9214. ISSN 0257-8972

Brunets, I. and Boogaard, A. and Aarnink, A.A.I. and Kovalgin, A.Y. and Wolters, R.A.M. and Holleman, J. and Schmitz, J. (2007) Low-temperature process steps for realization of non-volatile memory devices. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 504-508).

Degraeve, R. and Schmitz, J. and Pantisano, L. and Simoen, E. and Houssa, M. and Kaczer, B. and Groeseneken, G. (2007) Electrical characterization of advanced gate dielectrics. In: Dielectric Films for Advanced Microelectronics. Wiley series in materials for electronic & optoelectronic applications . John Wiley & Sons Ltd., England, pp. 371-435. ISBN 9780470013601

Groenland, A.W. and Kovalgin, A.Y. and Holleman, J. and Schmitz, J. (2007) Simulation of a Nanolink Hot-Plate Device. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 November 2007, Veldhoven, The Netherlands (pp. pp. 581-583).

Herfst, R.W. and Steeneken, P.G. and Schmitz, J. (2007) Time and voltage dependence of dielectric charging in RF MEMS capacitive switches. In: 45th Annual IEEE International Reliability Physics Symposium, IRPS 2007, 15-19 April 2007, Phoenix, Arizona (pp. pp. 417-421).

Hoang, T. and Le Minh, P. and Holleman, J. and Schmitz, J. (2007) Strong efficiency improvement of SOI-LEDs through carrier confinement. IEEE electron device letters, 28 (5). pp. 383-385. ISSN 0741-3106

Hoang, Tu and Holleman, Jisk and Le Minh, Puong and Schmitz, Jurriaan and Mchedlidze, Teimuraz and Arguirov, Tzanimir and Kittler, Martin (2007) Influence of dislocation loops on the near infrared light emission from silicon diodes. IEEE Transactions on Electron Devices, 54 (8). pp. 1860-1866. ISSN 0018-9383

Kovalgin, A.Y. and Boogaard, A. and Brunets, I. and Holleman, J. and Schmitz, J. (2007) Chemical modeling of a high-density inductively-coupled plasma reactor containing silane. Surface & Coatings Technology, 201 . pp. 8849-8853. ISSN 0257-8972

Lee, Kyong-Taek and Schmitz, Jurriaan and Brown, George A. and Heh, Dawei and Choi, Rino and Harris, Rusty and Song, Seung-Chul and Lee, Byoung Hun and Han, In-Sikh and Lee, Hi-Deok and Jeong, Yoon-Ha (2007) Test structures for accurate UHF C-V measurements of nano-scale CMOSFETs with HfSiON and TiN metal gate. In: IEEE International Conference on Microelectronic Test Structures, ICMTS 2007, 19-22 March 2007, Tokyo, Japan (pp. pp. 124-127).

Lu, J. and Kovalgin, A.Y. and Schmitz, J. (2007) Modeling of an Integrated Electromagnetic Generator for Energy Scavenging. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 603-607).

Mchedlidze, T. and Arguirov, T. and Kittler, M. and Hoang, T. and Holleman, J. and Schmitz, J. (2007) Influence of electric field on spectral positions of dislocation-related luminescence peaks in silicon: Stark effect. Applied physics letters, 91 (20). p. 201113. ISSN 0003-6951

Melai, Joost and Salm, Cora and Smits, Sander and Blanco Carballo, Víctor M. and Schmitz, Jurriaan and Hageluken, Ben (2007) Considerations on using SU-8 as a construction material for high aspect ratio structures. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov. 2007, Veldhoven, The Netherlands (pp. pp. 529-534).

Rajasekharan, B. and Salm, C. and Hueting, R.J.E. and Hoang, T. and Wiel, W.G. van der and Schmitz, J. (2007) Dimensional scaling effects on transport properties of p-i-n diodes. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 457-459).

Salm, Cora and Hoekstra, Eric and Kolhatkar, Jay S. and Hof, André J. and Wallinga, Hans and Schmitz, Jurriaan (2007) Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectronics Reliability, 47 (4-5). pp. 577-580. ISSN 0026-2714

Sasse, Guido T. and Vries, Rein J. de and Schmitz, Jurriaan (2007) Methodology for performing RF reliability experiments on a generic test structure. In: IEEE International Conference on Microelectronic Test Structures, ICMTS 2007, 19-22 March 2007, Tokyo, Japan (pp. pp. 177-182).

Schmitz, J. (2007) More than Moore creates opportunities for Materials Science. In: 16th International Materials Research Congress (IMRC) 2007, 25 Oct - 1 Nov 2007, Cancun, Mexico (pp. p. 19).

Schmitz, J. (2007) Adding functionality to microchips by wafer post-processing. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 576 (1). pp. 142-149. ISSN 0168-9002

Steen, J.-L.P.J. van der and Hueting, R.J.E. and Smit, G.D.J. and Hoang, T. and Holleman, J. and Schmitz, J. (2007) Valence Band Offset Measurements on Thin Silicon-on-Insulator MOSFETs. IEEE Electron Device Letters, 28 (9). pp. 821-824. ISSN 0741-3106

Steen, J.-L.P.J. van der and Hueting, R.J.E. and Smit, G.D.J. and Hoang, T. and Holleman, J. and Schmitz, J. (2007) Band Offset Measurements on Ultra-Thin (100) SOI MOSFETs. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 460-464).

Steeneken, Peter and Suy, Hilco and Herfst, Rodolf and Goossens, Martijn and Beek, Joost van and Schmitz, Jurriaan (2007) Micro-elektromechanische schakelaars voor mobiele telefoons. Nederlands Tijdschrift voor Natuurkunde, 73e jaargang (9). pp. 314-317. ISSN 0926-4264

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Schmitz, J. and Hueting, R.J.E. and Liu, J. and Furukawa, Y. and Mauczok, R. and Keur, W. (2007) Separation of intrinsic dielectric and resistive electrode losses in ferroelectric capacitors at radio frequencies. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 465-467).

Tiggelman, M.P.J. and Reimann, K. and Schmitz, J. (2007) Reducing AC impedance measurement errors caused by the DC voltage dependence of broadband high-voltage bias-tees. In: IEEE International Conference on Microelectronic Test Structures, ICMTS 2007, 19-22 March 2007, Tokyo, Japan (pp. pp. 200-205).

Visschers, J.L. and Blanco Carballo, V.M. and Chefdeville, M. and Colas, P. and Graaf, H. van der and Schmitz, J. and Smits, S.M. and Timmermans, J. (2007) Direct readout of gaseous detectors with tiled CMOS circuits. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 572 (1). pp. 203-204. ISSN 0168-9002

2006

Aarts, A.A. and Blanco Carballo, V.M. and Chefdeville, M. and Colas, P. and Dunand, S. and Fransen, M. and Graaf, H. van der and Giomataris, Y. and Hartjes, F. and Koffeman, G. and Melai, J. and Peek, H. and Riegler, W. and Salm, C. and Schmitz, J. and Smits, S.M. and Timmermans, J. and Visschers, J.L. and Wyrsch, N. (2006) Discharge Protection and Ageing of Micromegas Pixel Detectors. In: 2006 IEEE Nuclear Science Symposium Conference Record, 29 Oct - 4 Nov 2006, San Diego, CA, USA (pp. pp. 3865-3869).

Bankras, Radko G. and Tiggelman, Mark P.J. and Negara, M. Adi and Sasse, Guido T. and Schmitz, Jurriaan (2006) C-V test structures for metal gate CMOS. In: International Conference on Microelectronic Test Structures, ICMTS, March 6-9, 2006, Austin, Texas, USA (pp. pp. 226-229).

Bankras, R.G. and Holleman, J. and Schmitz, J. and Sturm, J.M. and Zinine, A. and Wormeester, H. and Poelsema, B. (2006) In Situ Reflective High-Energy Electron Diffraction Analysis During the Initial Stage of a Trimethylaluminum/Water ALD Process. Chemical Vapor Deposition, 12 (5). pp. 275-280. ISSN 0948-1907

Blanco Carballo, V.M. and Chefdeville, M. and Graaf, H. van der and Salm, C. and Aarnink, A.A.I. and Smits, S.M. and Altpeter, D.M. and Timmermans, J. and Visschers, J.L. and Schmitz, J. (2006) A miniaturized multiwire proportional chamber using CMOS wafer scale post-processing. In: 32nd European Solid State Device Research Conference, 02-06 July 2006, Montreux, Switzerland (pp. pp. 129-132).

Blanco Carballo, V.M. and Salm, C. and Smits, S.M. and Schmitz, J. and Chefdeville, M. and Graaf, H. van der and Timmermans, J. and Visschers, J.L. (2006) An integrated gaseous detector using microfabrication post-processing technology. In: 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, 23-24 Nov. 2006, Veldhoven, The Netherlands (pp. pp. 369-372).

Boogaard, A. and Kovalgin, A.Y. and Aarnink, A.A.I. and Wolters, R.A.M. and Holleman, J. and Brunets, I. and Schmitz, J. (2006) Measurement of electron temperatures of Argon Plasmas in a High-Density Inductively-Coupled Remote Plasma System by Langmuir Probe and Optical-Emission Spectroscopy. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands (pp. pp. 412-418).

Boogaard, Arjen and Kovalgin, Alexey and Aarnink, Tom and Wolters, Rob and Holleman, Jisk and Brunets, Ihor and Schmitz, Jurriaan (2006) Langmuir-probe Characterization of an Inductively-Coupled Remote Plasma System intended for CVD and ALD. ECS Transactions, 2 (7). pp. 181-191. ISSN 1938-5862

Brunets, I. and Hemert, T. van and Boogaard, A. and Aarnink, A.A.I. and Kovalgin, A.Y. and Holleman, J. and Schmitz, J. (2006) Memory devices with encapsulated Si nano-crystals: Realization and Characterization. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands (pp. pp. 419-422).

Campbell, M. and Heijne, E.H.M. and Llopart, X. and Chefdeville, M.A. and Colas, P. and Giomataris, Y. and Colijn, A.P. and Fornaini, A. and Graaf, H. van der and Kluit, P. and Timmermans, J. and Visschers, J.L. and Schmitz, J. (2006) An integrated readout system for drift chambers: the application of monolithic CMOS pixel sensors as segmented direct anode. In: 9th Topical Seminar on Innovative Particle and Radiation Detectors, 23-26 May 2004, Siena, Italy (pp. pp. 200-203).

Herfst, R.W. and Huizing, H.G.A. and Steeneken, P.G. and Schmitz, J. (2006) Characterization of dielectric charging in RF MEMS capacitive switches. In: Proceedings of the 2006 International Conference on Microelectronic Test Structures (ICMTS), 6-9 Mar 2006, Austin, TX, USA (pp. pp. 133-136).

Hoang, T. and LeMinh, P. and Hollleman, J. and Schmitz, J. (2006) The effect of dislocation loops on the light emission of silicon LEDs. IEEE Electron Device Letters, 27 (2). pp. 105-107. ISSN 0741-3106

Hoang, Tu and LeMinh, Phuong and Holleman, Jisk and Schmitz, Jurriaan (2006) Influence of Interface Recombination in Light Emission from Lateral Si-Based Light Emitting Devices. ECS Transactions, 3 (11). pp. 9-16. ISSN 1938-5862

Kovalgin, A.Y. and Zinine, A. and Bankras, R.G. and Wormeester, H. and Poelsema, B. and Schmitz, J. (2006) On the growth of native oxides on hydrogen-terminated silicon surfaces in dark and under illumination with light. In: Proceedings of the Electrochemical Society, 29 okt - 3 nov 2006, Cancun, Mexico (pp. pp. 191-202).

Melai, J. and Salm, C. and Schmitz, J. and Smits, S.M. and Visschers, J.L. (2006) An integrated single photon detector array using porous anodic alumina. In: Proceedings of 8th IWORID (International Workshop on Radiation Imaging Detectors), 2 - 6 July 2006, Pisa, Italy (pp. p. 1).

Melai, J. and Salm, C. and Schmitz, J. and Smits, S.M. and Visschers, J.L. (2006) An integrated single photon detector array using porous anodic alumina. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands (pp. pp. 389-393).

Salm, C. and Hoekstra, E. and Kolhatkar, J.S. and Hof, A.J. and Wallinga, H. and Schmitz, J. (2006) Low-Frequency noise in hot-carrier degraded MOSFETs. In: 14th workshop on dielectrics in microelectronics WODIM, 26-28 june 2006, Santa Tecla, Italy (pp. pp. 64-65).

Salm, C. and Hof, A.J. and Kuper, F.G. and Schmitz, J. (2006) Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectronics Reliability, 46 (9-11). pp. 1617-1622. ISSN 0026-2714

Sasse, G.T. and Schmitz, J. (2006) Charge Pumping at radio Frequencies: Methodology, Trap Response and Application. In: 44th Annual IEEE International Reliability Physics Symposium Proceedings, IRPS, 26-30 March 2006, San Jose, CA, USA (pp. pp. 627-628).

Sasse, G.T. and Schmitz, J. (2006) Interface trap response to RF charge pumping measurements. In: 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, 2006, 23-24 Nov 2006, Veldhoven, The Netherlands (pp. pp. 427-431).

Stavitski, N. and Dal, M.J.H. van and Wolters, R.A.M. and Kovalgin, A.Y. and Schmitz, J. (2006) Specific contact resistance measurements of metal-semiconductor junctions. In: Microelectronic Test Structures, 2006 IEEE International Conference on (pp. pp. 13-17).

Stavitski, N. and Dal, M.J.H. van and Klootwijk, J.H. and Wolters, R.A.M. and Kovalgin, A.Y. and Schmitz, J. (2006) Cross-Bridge Kelvin Resistor (CBKR) structures for silicide-semiconductor junctions characterization. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands (pp. pp. 436-438).

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Beelen, D. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2006) Electrical characterization of thin film ferroelectric capacitors. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands (pp. pp. 439-443).

2005

Aarnink, A.A.I. and Boogaard, A. and Brunets, I. and Isai, I.G. and Kovalgin, A.Y. and Holleman, J. and Wolters, R.A.M. and Schmitz, J. (2005) A high-density inductively-coupled remote plasma system for the deposition of dielectrics and semiconductors. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, the Netherlands (pp. pp. 67-69).

Bankras, R.G. and Holleman, J. and Schmitz, J. (2005) In-Situ RHEED analysis of atomic layer deposition. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, The Netherlands (pp. pp. 70-75).

Brunets, I. and Boogaard, A. and Isai, I.G. and Aarnink, A.A.I. and Kovalgin, A.Y. and Holleman, J. and Schmitz, J. (2005) Three-dimensional IC's prolong the life of Moore's law. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, the Netherlands (pp. pp. 76-78).

Campbell, M. and Chefdeville, M. and Colas, P. and Colijn, A.P. and Forniani, A. and Giomataris, Y. and Graaf, H. van der and Heijne, E.H.M. and Kluit, P. and Llopart, X. and Schmitz, J. and Timmermans, J. and Visschers, J.K. (2005) The detection of single electrons by means of a Micromegas-covered Medipix2 pixel CMOS readout circuit. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 540 (2-3). pp. 295-304. ISSN 0168-9002

Campbell, M. and Heijne, E.H.M. and Llopart, X. and Colas, P. and Giganon, A. and Giomataris, Y. and Fornaini, A. and Graaf, H. van der and Kluit, P. and Timmermans, J. and Visschers, J.L. and Schmitz, J. (2005) GOSSIP: A vertex detector combining a thin gas layer as signal generator with a CMOS readout pixel array. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 560 (1). pp. 131-134. ISSN 0168-9002

Chefdeville, M. and Colas, P. and Giomataris, Y. and Graaf, H. van der and Heijne, E.H.M. and Putten, S. van der and Salm, C. and Schmitz, J. and Smits, S.M. and Timmermans, J. and Visschers, J.L. (2005) An electron-multiplying ‘Micromegas’ grid made in silicon wafer post-processing technology. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 556 (2). pp. 490-494. ISSN 0168-9002

Chefdeville, M. and Colas, P. and Giomataris, Y. and Graaf, H. van der and Heijne, E.H.M. and Putten, S. van der and Salm, C. and Schmitz, J. and Smits, S. and Timmermans, J. and Visschers, J.L. (2005) An electron-multiplying 'Micromegas' grid made in silicon wafer post-processing technology. In: SAFE 2005, 8th Annual Workshop on Circuits, Systems and Signal Processing, 17-18 Nov. 2005, Veldhoven, the Netherlands (pp. pp. 139-142).

Forniani, A. and Campbell, M. and Chefdeville, M.A. and Colas, P. and Colijn, A.P. and van der Graaf, H. and Giomataris, Y. and Heijne, E.H.M. and Kluit, P. and Llopart, X. and Schmitz, J. and Timmermans, J. and Visschers, J.L. (2005) The detection of single electrons using a Microgas gas amplification and a MediPix2 CMOS pixel readout. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 546 (1-2). pp. 270-273. ISSN 0168-9002

Herfst, R.W. and Huizing, H.G.A. and Steeneken, P.G. and Schmitz, J. (2005) Characterization of dielectric charging in RF MEMS. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2005, 17-18 November 2005, Veldhoven, The Netherlands (pp. pp. 11-14).

Hoang, T. and Le Minh, P. and Holleman, J. and Schmitz, J. (2005) The effect of dislocation loops on the light emission of silicon LEDs. In: Proceedings of 5th European Solid-State Device Research Conference (ESSDERC) 2005, 12-16 Sep 2005, Grenoble, France (pp. pp. 359-362).

Hoang, T. and LeMinh, P. and Holleman, J. and Schmitz, J. (2005) The effect of dislocation loops on the light emission of silicon LEDs. In: 35th European Solid-State Device Research Conference, ESSDERC, 12-16 Sept. 2005 , Grenoble, France (pp. pp. 359-362).

Hof, A.J. and Hoekstra, E. and Kovalgin, A.Y. and Schaijk, R. van and Baks, W.M. and Schmitz, J. (2005) The Impact of Deuterated CMOS processing on Gate Oxide Reliability. IEEE Transactions on Electron Devices, 52 (9). pp. 2111-2115. ISSN 0018-9383

Hof, A.J. and Kovalgin, A.Y. and Woerlee, P.H. and Schmitz, J. (2005) On the Oxidation Kinetics of Silicon in Ultradiluted H2O and D2O Ambient. Journal of the Electrochemical Society, 152 (9). F133-F137. ISSN 0013-4651

Kolhatkar, Jay and Hoekstra, Eric and Hof, André and Salm, Cora and Schmitz, Jurriaan and Wallinga, Hans (2005) Impact of Hot-Carrier Degradation on the Low-Frequency Noise in MOSFETs Under Steady-State and Periodic Large-Signal Excitation. IEEE Electron Device Letters, 26 (10). pp. 764-766. ISSN 0741-3106

Kovalgin, A.Y. and Hof, A.J. and Schmitz, J. (2005) An approach to modeling of silicon oxidation in a wet ultra-diluted ambient. Microelectronic Engineering, 80 . pp. 432-435. ISSN 0167-9317

Le Minh, P. and Hoang, T. and Holleman, J. and Schmitz, J. (2005) The effect of an electric field on a lateral silicon light-emitting diode. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, The Netherlands (pp. pp. 117-120).

Sasse, G.T. and Vries, H. de and Schmitz, J. (2005) Charge pumping at radio frequencies [MOSFET device interface state density measurement]. In: International Conference on Microelectronic Test Structures, ICMTS, 4-7 April 2005, Leuven, Belgium (pp. pp. 229-233).

Sasse, Guido T. and Vries, Henk and Schmitz, Jurriaan (2005) The RF charge pump technique for measuring the interface state density on leaky dielectrics. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 17-18 November 2005, Veldhoven, The Netherlands (pp. pp. 47-51).

Stavitski, N. and Dal, M.J.H. van and Wolters, R.A.M. and Kovalgin, A.Y. and Schmitz, J. (2005) Specific contact resistance measurements of metal-semiconductor junctions. In: SAFE 2005, 8th Annual Workshop on Circuits, Systems and Signal Processing, 17-18 November 2005, Veldhoven, the Netherlands (pp. pp. 52-55).

Sturm, J.M. and Zinine, A. and Wormeester, H. and Bankras, R.G. and Holleman, J. and Schmitz, J. and Poelsema, B. (2005) Laterally resolved electrical characterisation of high-L oxides with non-contact Atomic Force Microscopy. Microelectronic Engineering, 80 . pp. 78-81. ISSN 0167-9317

Sturm, J.M. and Zinine, A. and Wormeester, H. and Poelsema, B. and Bankras, R.G. and Holleman, J. and Schmitz, J. (2005) Imaging of oxide charges and contact potential difference fluctuations in Atomic Layer Deposited AL203 on Si. Journal of Applied Physics, 97 (6). 063709. ISSN 0021-8979

Sturm, J.M. and Zinine, A.I. and Wormeester, H. and Poelsema, B. and Bankras, R.G. and Holleman, J. and Schmitz, J. (2005) Nanoscale topography-capacitance correlation in high-K films: Interface heterogeneity related electrical properties. Journal of Applied Physics, 98 (7). 076104-1. ISSN 0021-8979

2004

Campbell, M. and Heijne, E.H.M. and Llopart, X. and Chefdeville, M.A. and Colas, P. and Giganon, A. and Giomataris, Y. and Colijn, A.P. and Fornaini, A. and Graaf, H. van der and Kluit, P. and Timmermans, J. and Visschers, J.L. and Schmitz, J. (2004) New gaseous detectors: the application of CMOS pixel chips as direct anode. In: 2004 IEEE Nuclear Science Symposium Conference Record, 16-22 Oct 2004, Rome, Italy (pp. pp. 955-958).

Colas, P. and Colijn, A.P. and Forniani, A. and Giomataris, Y. and Graaf, H. van der and Heijne, E.H.M. and Llopart, X. and Schmitz, J. and Timmermans, J. and Visschers, J.L. (2004) The readout of a GEM or Micromegas-equipped TPC by means of the Medipix2 CMOS sensor as direct anaode. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 535 (1-2). pp. 506-510. ISSN 0168-9002

Hoang, T. and LeMinh, P. and Holleman, J. and Schmitz, J. (2004) Effects of Dislocation Loops into Electroluminescence of Si-based Light Emitting Diodes. In: SAFE 2004, 7th Annual Workshop on Semiconductor Advances for Future Electronics, 25-26 Nov 2004, Veldhoven, the Netherlands (pp. pp. 697-699).

Hoang, T. and LeMinh, P. and Holleman, J. and Zieren, V. and Goossens, M.J. and Schmitz, J. (2004) A High Efficiency Lateral Light Emitting Device on SOI. In: 12th International Symposium on Electron Devices for Microwave and Optoelectronic Applications, EDMO, 8-9 November 2004, Berg-en-Dal, Kruger National Park, South Africa (pp. pp. 87-91).

Hof, A.J. and Kovalgin, A.Y. and Schmitz, J. and Schaijk, R. van and Baks, W.M. (2004) Gate Oxide Reliability and Deuterated CMOS Processing. In: IEEE International Integrated Reliability Workshop, 18-21 October 2004, Lake Tahoe, USA (pp. pp. 7-10).

Kolhatkar, J.S. and Hoekstra, E. and Salm, C. and Wel, A.P. van der and Klumperink, E.A.M. and Schmitz, J. and Wallinga, H. (2004) Modeling of RTS Noise in MOSFETs under Steady-State and Large-Signal Excitation. In: IEEE International Electron Devices Meeting, IEDM, 13-15 Dec. 2004, San Francisco, CA, USA (pp. pp. 759-762).

Sasse, G.T. and Kort, R. de and Schmitz, J. (2004) Gate-capacitance extraction from RF C-V measurements. In: 34th European Solid-State Device Research Conference, ESSDERC 2004, 21-23 September 2004, Leuven, Belgium (pp. pp. 113-116).

Schmitz, J. and Cubaynes, F.N and Kort, R. de and Havens, R.J. and Scholten, A.J. and Tiemeijer, L.F. (2004) The RF-CV method for characterization of leaky gate dielectrics. Microelectronic Engineering, 72 . pp. 149-153. ISSN 0167-9317

Schmitz, J. and Cubaynes, F.N. and Kort, R. de and Havens, R.J. and Scholten, A.J. and Tiemeijer, L.F. (2004) The RF-CV method for characterization of leaky gate dielectrics. In: 13th Biannual Conference on Insulating Films on Semiconductors, 18 June 2003, Barcelona, Spain.

Schmitz, J. and Weusthof, M.H.H. and Hof, A.J. (2004) Leakage current correction in quasi-static C-V measurements. In: International Conference on Microelectronic Test Structures, ICMTS, 22-25 March 2004, Awaji Yumebutai, Japan (pp. pp. 179-181).

Schmitz, Jurriaan and Cubaynes, Florence N. and Havens, Ramon J. and Kort, Randy de and Scholten, Adries J. and Tiemeijer, Luuk F. (2004) Test structures design considerations for RF-CV measurements on leaky dielectrics. IEEE Transactions on Semiconductor Manufacturing, 17 (2). pp. 150-154. ISSN 0894-6507

2003

Bankras, R.G. and Aarnink, A.A.I. and Holleman, J. and Schmitz, J. (2003) In-situ RHEED analysis of atomic layer deposition and characterization of AL203 gate dielectrics. In: 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2003, 25-26 November 2003, Veldhoven, The Netherlands (pp. pp. 726-729).

Cubaynes, F.N. and Schmitz, J. and Marel, C. van der and Snijders, J.H.M. and Veloso, A. and Rothschild, A. and Olsen, C. and Date, L. (2003) Plasma nitridation optimization for sub-15 A gate dielectrics. In: International Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films, 28 April - 2 May 2003, Paris, France (pp. pp. 595-604).

Hoang, T. and Le Minh, P. and Holleman, J. and Schmitz, J. and Wallinga, H. (2003) High external quantum efficiency of the lateral P-I-N diodes realized of silicon on insulator (SOI) material. In: Proceedings of the 6th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2003, 25 - 26 November 2003, Veldhoven, The Netherlands (pp. pp. 610-613).

Hof, A.J. and Kovalgin, A.Y. and Woerlee, P.H. and Schmitz, J. (2003) On oxidation kinetics and electrical quality of gate oxide grown in H2O or D2O ambient. In: 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2003, 25-26 November 2003, Veldhoven, The Netherlands (pp. pp. 743-747).

Schmitz, J. and Cubaynes, F.N. and Havens, R.J. and Kort, R. de and Scholten, A.J. and Tiemeijer, L.F. (2003) Test structure design considerations for RF-CV measurements on leaky dielectrics. In: International Conference on Microelectronic Test Structures, 2003, 17-20 March 2003, Monterey, California, USA (pp. 181- 185).

Schmitz, J. and Cubaynes, F.N. and Havens, R.J. and Kort, R. de and Scholten, A.J. and Tiemeijer, L.F. (2003) RF capacitance-voltage characterization of MOSFETs with high-leakage dielectric. IEEE Electron Device Letters, 24 (1). pp. 37-39. ISSN 0741-3106

2000

Ponomarev, Youri V. and Stolk, Peter A. and Salm, Cora and Schmitz, Jurriaan and Woerlee, Pierre H. (2000) High-Performance Deep SubMicron CMOS Technologies with Polycrystalline-SiGe Gates. IEEE Transactions on Electron Devices, 47 (4). pp. 848-855. ISSN 0018-9383

1999

Houtsma, V.E. and Holleman, J. and Salm, C. and Haan, I.R. de and Schmitz, J. and Widdershoven, F.P. and Woerlee, P.H. (1999) Minority Carrier Tunneling and Stress-Induced Leakage Current for p+ gate MOS Capacitors with Poly-Si and PolySi0.7Ge0.3 Gate Material. In: International Electron Devices Meeting, 1999. IEDM Technical Digest, IEDM, Washington, USA (pp. pp. 457-460).

1997

Ponomarev, Y.V. and Salm, C. and Schmitz, J. and Woerlee, P.H. and Stolk, P.A. and Gravesteijn, D.J. (1997) Gate-Workfunction Engineering Using Poly-(Si,Ge) for High-Performance 0.18µm CMOS Technology. In: International Electron Devices Meeting, 1997. Technical Digest, Washington DC, USA (pp. pp. 829-832).

This list was generated on Mon Jul 28 05:31:58 2014 CEST.