Author Publications

2008

Nijhuis, Christian A. and Maat ter, Jurjen and Bisri, Satria Z. and Weusthof, Marcel H.H. and Salm, Cora and Schmitz, Jurriaan and Ravoo, Bart Jan and Huskens, Jurriaan and Reinhoudt, David N. (2008) Preparation of metal-SAM-dendrimer-SAM-metal junctions by supramolecular metal transfer printing. New Journal of Chemistry, 32 (4). pp. 652-661. ISSN 1144-0546

Nijhuis, Christian A. and Maat ter, Jurjen and Bisri, Satria Z. and Weusthof, Marcel H.H. and Salm, Cora and Schmitz, Jurriaan and Ravoo, Bart Jan and Huskens, Jurriaan and Reinhoudt, David N. (2008) Preparation of metal–SAM–dendrimer–SAM–metal junctions by supramolecular metal transfer printing,. New Journal of Chemistry, 32 . pp. 652-661. ISSN 1144-0546

2004

Joseph, Arun A. and Weusthof, Marcel H.H. and Kerkhoff, Hans G. (2004) Defect-Oriented Testing of an RSFQ D-type Flip-Flop. In: ProRISC 2004, 15th Annual Workshop on Circuits, Systems and Signal Processing, 25-26 Nov 2004, Veldhoven, the Netherlands.

Schmitz, J. and Weusthof, M.H.H. and Hof, A.J. (2004) Leakage current correction in quasi-static C-V measurements. In: International Conference on Microelectronic Test Structures, ICMTS, 22-25 March 2004, Awaji Yumebutai, Japan.

2002

Stancic, M. and Fang, L. and Weusthof, M.H.H. and Tijink, R.M.W. and Kerkhoff, H.G. (2002) A New Test Generation Approach for Embedded Analogue Cores in SoC. In: International Test Conference, 2002, 7-10 Oct. 2002, Baltimore, USA.

1998

Klootwijk, J.H. and Kranenburg van, H. and Weusthof, M.H.H. and Woerlee, P.H. and Wallinga, H. (1998) RTP annealings for high-quality LPCVD interpolysilicon dielectric layers. Microelectronics Reliability, 38 (2). pp. 277-280. ISSN 0026-2714

1996

Klootwijk, J.H. and Weusthof, M.H.H. and Kranenburg van, H. and Woerlee, P.H. and Wallinga, H. (1996) Improvements of deposited interpolysilicon dielectric characteristics with RTP N2O-anneal. IEEE Electron Device Letters, 17 (7). pp. 358-359. ISSN 0741-3106