Author Publications

2012

Vrielink, J.A.M. and Tiggelaar, R.M. and Gardeniers, J.G.E. and Lefferts, L. (2012) Applicability of X-ray fluorescence spectroscopy as method to determine thickness and composition of stacks of metal thin films: A comparison with imaging and profilometry. Thin solid films, 520 . 1740 - 1744. ISSN 0040-6090

2005

Bos, M. and Vrielink, J.A.M. (2005) The influence of scattering processes in quantitative X-ray fluorescence analysis. Analytica Chimica Acta, 545 (1). pp. 92-88. ISSN 0003-2670

2002

Bos, M. and Boukamp, B.A. and Vrielink, J.A.M. (2002) Determination of diffusion profiles of silver ions in soda-lime–silica glass by X-ray fluorescence spectrometry. Analytica Chimica Acta, 459 (2). pp. 305-311. ISSN 0003-2670

2000

Bos, M. and Vrielink, J.A.M. and Linden van der, W.E. (2000) Non-destructive analysis of small irregularly shaped homogenous samples by X-ray fluorescence spectrometry. Analytica Chimica Acta, 412 (1-2). pp. 203-211. ISSN 0003-2670

1998

Bos, M. and Vrielink, J.A.M. (1998) Constraints, iteration schemes and convergence criteria for concentration calculations in X-ray fluorescence spectrometry with the use of fundamental parameter methods. Analytica Chimica Acta, 373 (2-3). pp. 291-302. ISSN 0003-2670

1994

Bos, M. and Vrielink, J.A.M. (1994) The wavelet transform for pre-processing IR spectra in the identification of mono- and di-substituted benzenes. Chemometrics and Intelligent Laboratory Systems, 23 (1). pp. 115-122. ISSN 0169-7439