Author Publications

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Jump to: 2013 | 2007 | 2005
Number of items: 6.

2013

Sturm, J.M. and Liu, F. and Grecea, M.L. and Gleeson, M.A. and Lee, C.J. and Bijkerk, F. (2013) UHV-opstelling voor het bestuderen van de contaminatie van EUV-spiegels. NEVAC blad, 5 (1). 12 - 15. ISSN 0169-9431

2007

Sturm, J.M. and Croes, G.O. and Wormeester, H. and Poelsema, Bene (2007) Metastable precursor for oxygen dissociation on Si(0 0 1) 2 × 1 resolved by high lateral resolution work function measurements. Surface Science, 601 (12). pp. 2498-2507. ISSN 0039-6028

Sturm, J.M. and Wormeester, H. and Poelsema, Bene (2007) Heterogeneous oxidation of Si(1 1 1) 7 × 7 monitored with Kelvin probe force microscopy. Surface Science, 601 (19). pp. 4598-4602. ISSN 0039-6028

2005

Sturm, J.M. and Zinine, A. and Wormeester, H. and Bankras, R.G. and Holleman, J. and Schmitz, J. and Poelsema, B. (2005) Laterally resolved electrical characterisation of high-L oxides with non-contact Atomic Force Microscopy. Microelectronic Engineering, 80 . pp. 78-81. ISSN 0167-9317

Sturm, J.M. and Zinine, A. and Wormeester, H. and Poelsema, B. and Bankras, R.G. and Holleman, J. and Schmitz, J. (2005) Imaging of oxide charges and contact potential difference fluctuations in Atomic Layer Deposited AL203 on Si. Journal of Applied Physics, 97 (6). 063709. ISSN 0021-8979

Sturm, J.M. and Zinine, A.I. and Wormeester, H. and Poelsema, B. and Bankras, R.G. and Holleman, J. and Schmitz, J. (2005) Nanoscale topography-capacitance correlation in high-K films: Interface heterogeneity related electrical properties. Journal of Applied Physics, 98 (7). 076104-1. ISSN 0021-8979

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