Author Publications

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Number of items: 9.

2015

Hoang, T.M.C. and Geerdink, B. and Sturm, J.M. and Lefferts, L. and Seshan, K. (2015) Steam reforming of acetic acid - A major component in the volatiles formed during gasification of humin. Applied catalysis B: environmental, 163 . 74 - 82. ISSN 0926-3373

2014

Coloma Ribera, R. and Kruijs, R.W.E. van de and Sturm, J.M. and Yakshin, A.E. and Bijkerk, F. (2014) Surface and sub-surface oxidation of thin films using Low Energy Ion Scattering. In: LEIS Workshop 2014, 22-05-2014 - 22-05-2014, Enschede.

Gao, A. and Zoethout, E. and Sturm, J.M. and Lee, C.J. and Bijkerk, F. (2014) Defect formation in single layer graphene under extreme ultraviolet irradiation. Applied surface science, 317 . 745 - 751. ISSN 0169-4332

2013

Sturm, J.M. and Liu, F. and Grecea, M.L. and Gleeson, M.A. and Lee, C.J. and Bijkerk, F. (2013) UHV-opstelling voor het bestuderen van de contaminatie van EUV-spiegels. NEVAC blad, 5 (1). 12 - 15. ISSN 0169-9431

2007

Sturm, J.M. and Croes, G.O. and Wormeester, H. and Poelsema, Bene (2007) Metastable precursor for oxygen dissociation on Si(0 0 1) 2 × 1 resolved by high lateral resolution work function measurements. Surface Science, 601 (12). pp. 2498-2507. ISSN 0039-6028

Sturm, J.M. and Wormeester, H. and Poelsema, Bene (2007) Heterogeneous oxidation of Si(1 1 1) 7 × 7 monitored with Kelvin probe force microscopy. Surface Science, 601 (19). pp. 4598-4602. ISSN 0039-6028

2005

Sturm, J.M. and Zinine, A. and Wormeester, H. and Bankras, R.G. and Holleman, J. and Schmitz, J. and Poelsema, B. (2005) Laterally resolved electrical characterisation of high-L oxides with non-contact Atomic Force Microscopy. Microelectronic Engineering, 80 . pp. 78-81. ISSN 0167-9317

Sturm, J.M. and Zinine, A. and Wormeester, H. and Poelsema, B. and Bankras, R.G. and Holleman, J. and Schmitz, J. (2005) Imaging of oxide charges and contact potential difference fluctuations in Atomic Layer Deposited AL203 on Si. Journal of Applied Physics, 97 (6). 063709. ISSN 0021-8979

Sturm, J.M. and Zinine, A.I. and Wormeester, H. and Poelsema, B. and Bankras, R.G. and Holleman, J. and Schmitz, J. (2005) Nanoscale topography-capacitance correlation in high-K films: Interface heterogeneity related electrical properties. Journal of Applied Physics, 98 (7). 076104-1. ISSN 0021-8979

This list was generated on Fri Dec 19 05:37:23 2014 CET.