Author Publications

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Jump to: 2005 | 2004 | 2003 | 2002
Number of items: 8.

2005

Sowariraj, Mary Sheela Bobby (2005) Full chip modelling of ICs under CDM stress. thesis.

Sowariraj, M.S.B. and Jong, P.C. de and Salm, C. and Mouthaan, A.J. and Kuper, F.G. (2005) A 3-D circuit model to evaluate CDM performance of ICs. Microelectronics Reliability, 45 (9-11). pp. 1425-1429. ISSN 0026-2714

Sowariraj, M.S.B. and Jong, Peter C. de and Salm, Cora and Smedes, Theo and Mouthaan, A.J. Ton and Kuper, Fred G. (2005) Significance of Including Substrate Capacitance in the Full Chip Circuit Model of ICs under CDM Stress. In: 43th Annual International Reliability Physics Symposium, April 17-21, 2005, San Jose, CA, USA (pp. pp. 608-609).

2004

Sowariraj, M.S.B. and Salm, Cora and Smedes, Theo and Mouthaan, A.J. Ton and Kuper, Fred G. (2004) Full chip model of CMOS Integrated Circuits under Charged Device Model stress. In: SAFE 2004, 7th Annual Workshop on Semiconductor Advances for Future Electronics, 25-26 Nov 2004, Veldhoven, the Netherlands (pp. pp. 801-807).

2003

Sowariraj, M.S.B. and Smedes, Theo and Salm, Cora and Mouthaan, Ton and Kuper, Fred G. (2003) Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels - An explantion and die protection strategy. Microelectronics Reliability, 43 (9-11). pp. 1569-1575. ISSN 0026-2714

Sowariraj, M.S.B. and Smedes, Theo and Salm, Cora and Mouthaan, Ton and Kuper, Fred G. (2003) Study on the influence of package parasitics and substrate resistance on the Charged Device Model(CDM) failure levels - possible protection methodology. In: 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2003, 25-26 November 2003, Veldhoven, The Netherlands (pp. pp. 657-662).

2002

Sowariraj, M.S.B. and Kuper, F.G. and Salm, C. and Mouthaan, A.J. and Smedes, T. (2002) Impact of layout and technology variation on the CDM performance of ggNMOSTs and SCRs. In: Proceedings of the 5th annual workshop on Semiconductors Advances for Future Electronics SAFE 2002, 27-28 November 2002, Veldhoven, The Netherlands (pp. pp. 104-107).

Sowariraj, M.S.B. and Salm, C. and Mouthaan, A.J. and Smedes, T. and Kuper, F.G. (2002) The influence of technology variation on ggNMOSTs and SCRs against CDM ESD stress. Microelectronics Reliability, 42 (9-11). pp. 1287-1292. ISSN 0026-2714

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