Author Publications

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Number of items: 8.

2002

Golo, Natasa (2002) Electrostatic Discharge Effects in Thin Film Transistors. thesis.

Golo, N. and Jenneboer, T. and Mouthaan, T. (2002) Dealing with electrostatic discharge in a capacitive fingerprint sensor fabricated in amorphous silicon thin film technology. In: SESENS 2002, November 29-30, 2002, Veldhoven, The Netherlands (pp. pp. 616-621).

Tosic Golo, N. and Kuper, F.G. and Mouthaan, A.J. (2002) Zapping thin film transistors. Microelectronics Reliability, 42 (4). pp. 747-765. ISSN 0026-2714

Tosic Golo, Natasa and Kuper, Fred G. and Mouthaan, Ton J. (2002) Analysis of the Electrical Breakdown in Hydrogenated Amorphous Silicon Thin-Film Transistors. IEEE Transactions on Electron Devices, 49 (6). pp. 1012-1018. ISSN 0018-9383

Tosic Golo, Natasa and Wal, Siebrigje van der and Kuper, F.G. and Mouthaan, A.J. (2002) Estimation of the impact of electrostatic discharge on density of states in hydrogenated amorphous silicon thin-film transistors. Applied Physics Letters, 80 (18). pp. 3337-3339. ISSN 0003-6951

2001

Tosic Golo, N. and Wal, S. van der and Kuper, F.G. and Mouthaan, A.J. (2001) The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin film transistors. Microelectronics Reliability, 41 (9-10). pp. 1391-1396. ISSN 0026-2714

2000

Tosic, N. and Kuper, F.G. and Mouthaan, A.J. (2000) Degradation of -Si:H TFTs caused by electrostatic discharge. In: 22nd International Conference on Microelectronics, 2000, 14-17 May 2000 , Nis, Yugoslavia (pp. pp. 359-362).

Tosic, N. and Kuper, F.G. and Mouthaan, A.J. (2000) Transmission Line Model Testing of Top-Gate Amorphous Silicon Thin Film Transistors. In: 38th Annual IEEE International Reliability Physics Symposium, 10-13 April 2000, San Jose, CA (pp. pp. 289-294).

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