Author Publications

Article

Boselli, Gianluca and Meeuwsen, Stan and Mouthaan, Ton and Kuper, Fred (2001) Investigations on double-diffused MOS transistors under ESD zap conditions. Microelectronics Reliability, 41 (3). pp. 395-405. ISSN 0026-2714

Boselli, Gianluca and Mouthaan, Ton and Kuper, Fred (2000) Rise-time effects in ggnMOSt under TLP stress. Microelectronics Reliability, 40 (12). pp. 2061-2067. ISSN 0026-2714

Conference or Workshop Item

Boselli, G. and Mouthaan, A.J. and Kuper, F.G. (2000) Rise-time effects in ggnMOSt under TLP stress. In: 22nd International Conference on Microelectronics, 2000, 14-17 May, 2000, Nis, Serbia.

Boselli, Gianluca and Meeuwsen, Stan and Mouthaan, Ton and Kuper, Fred (1999) Investigations on Double-Diffused MOS (DMOS) transistors under ESD zap conditions. In: Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD, 1999, 28-30 Sept. 1999, Florida, USA.

Thesis

Boselli, Gianluca (2001) On High Injection Mechanisms in Semiconductor Devices under ESD Conditions. thesis.