Author Publications

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Jump to: 2000 | 1999 | 1998 | 1996
Number of items: 7.

2000

Willemsen, Oscar H. and Kuipers, Laurens and Werf, Kees O. van der and Grooth, Bart G. de and Greve, Jan (2000) Reconstruction of the Tip-Surface Interaction Potential by Analysis of the Brownian Motion of an Atomic Force Microscope Tip. Langmuir, 16 (9). pp. 4339-4347. ISSN 0743-7463

Willemsen, Oscar H. and Snel, Margot M.E. and Cambi, Alessandra and Greve, Jan and Grooth, Bart G. de and Figdor, Carl G. (2000) Biomolecular Interactions Measured by Atomic Force Microscopy. Biophysical Journal, 79 (6). pp. 3267-3281. ISSN 0006-3495

1999

Noort, S. John T. van and Willemsen, Oscar H. and Werf, Kees O. van der and Grooth, Bart G. de and Greve, Jan (1999) Mapping Electrostatic Forces Using Higher Harmonics Tapping Mode Atomic Force Microscopy in Liquid. Langmuir, 15 (21). pp. 7101-7107. ISSN 0743-7463

Willemsen, O.H. and Snel, M.M.E. and Noort, S.J.T. van and Werf, K.O. van der and Grooth, B.G. de and Figdor, C.G. and Greve, J. (1999) Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion. Ultramicroscopy, 80 (2). pp. 133-144. ISSN 0304-3991

Willemsen, Oscar H. and Snel, Margot M.E. and Kuipers, Laurens and Figdor, Carl G. and Greve, J. and Grooth, Bart G. de (1999) A Physical Approach to Reduce Nonspecific Adhesion in Molecular Recognition Atomic Force Microscopy. Biophysical Journal, 76 (2). pp. 716-724. ISSN 0006-3495

1998

Willemsen, Oscar H. and Snel, Margot M.E. and Werf, Kees O. van der and Grooth, Bart G. de and Greve, Jan and Hinterdorfer, Peter and Gruber, Hermann J. and Schindler, Hansgeorg and Kooyk, Yvette van and Figdor, Carl G. (1998) Simultaneous Height and Adhesion Imaging of Antibody-Antigen Interactions by Atomic Force Microscopy. Biophysical Journal, 75 (5). pp. 2220-2228. ISSN 0006-3495

1996

Willemsen, O.H. and Noordman, O.F.J. and Segerink, F.B. and Ruiter, A.G.T. and Moers, M.H.P. and Hulst, N.F. van (1996) Fluorescence Lifetime Contrast Combined with Probe Microscopy. In: Optics at the Nanometer Scale. NATO ASI Series, vol. E319. Imaging and Storing with Photonic Near Fields. Kluwer Academic Publishers, Dordrecht, pp. 223-233. ISBN 9780792340201

This list was generated on Wed Apr 16 05:34:55 2014 CEST.