Author Publications

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Jump to: 2002 | 1999
Number of items: 9.

2002

Kim, P.L. and Lodder, J.C. (2002) Thickness dependence of structural,magnetic properties and reversal mechanism of Co Cr Ta/Cr longitudinal recording media. Journal of Magnetism and Magnetic Materials, 242-24 (Part 1). pp. 395-397. ISSN 0304-8853

Kim, Phan Le and Lodder, Cock (2002) Iterative Method for Intrinsic Viscosity Measurements on Perpendicular Recording Media. IEEE Transactions on Magnetics, 38 (5). pp. 2003-2005. ISSN 0018-9464

Kim, Phan Le and Lodder, Cock (2002) A new method for intrinsic viscosity measurements on perpendicular recording media. In: IEEE International Magnetics Conference, INTERMAG Europe 2002, 28 April-2 May 2002, Amsterdam, The Netherlands.

Kim, Phan Le and Thuy, Nguyen Phu and Le Minh, Phuong and Manh, Dinh Hung (2002) Narrow-range angle sensor based on wiggles in angular dependence of pseudo-Hall effect. Sensors and Actuators A: Physical, 97-98 . pp. 308-317. ISSN 0924-4247

Nguyen, L.T. and Lisfi, A. and Kim, P.L. and Lodder, J.C. and Keim, E.G. (2002) Effect of Cr underlayer on obliquely sputtered Co on PET substrate. In: IEEE International Magnetics Conference, INTERMAG Europe 2002, 28 April-2 May 2002, Amsterdam, The Netherlands.

1999

Kim, Phan Le (1999) CoCrTa thin films for magnetic recording media: structure, magnetic properties and time-dependence effect. thesis.

Kim, Phan Le and Lodder, Cock (1999) Time-Dependence effect in alumite recording media with perpendicular anisotropy. IEICE Transactions on Electronics, E82-C (12). pp. 2176-2183. ISSN 0916-8524

Kim, Phan Le and Lodder, Cock and Luong, Nguyen Hoang and Hien, Than Duc (1999) The influence of Tantalum content in relation to substrate temperature on magnetic and structural properties of Co-Cr-Ta thin films. Journal of Magnetism and Magnetic Materials, 193 (1-3). pp. 117-120. ISSN 0304-8853

Kim, Phan Le and Lodder, Cock and Popma, Th.J.A. (1999) Field dependence of magnetic viscosity of CoCrTa in-plane media. Journal of Magnetism and Magnetic Materials, 193 (1-3). pp. 249-252. ISSN 0304-8853

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