Author Publications

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Number of items: 6.


Meer, R. van der and Kozhevnikov, I.V. and Krishnan, B. and Huskens, J. and Hegeman, P.E. and Brons, C. and Vratzov, B. and Bastiaens, H.M.J. and Boller, K.J. and Bijkerk, F. (2013) Single-order operation of lamellar multilayer gratings in the soft x-ray spectral range. AIP advances, 3 (1). 012103 - 012109. ISSN 2158-3226


Bijkerk, Frederik and Wiel, Wilfred Gerard van der and Meer, Robert van der and Hegeman, Petra E. (2011) Method for manufacturing a multilayer structure with a lateral pattern for application in the XUV wavelenght range, and BF and LMAG structures manufactured according to this method. Patent.

Meer, R. van der and Krishnan, B. and Kozhevnikov, I.V. and Boer, M.J. de and Vratzov, B. and Bastiaens, H.M.J. and Huskens, J. and Wiel, W.G. van der and Hegeman, P.E. and Brons, G.C.S. and Boller, K.-J. and Bijkerk, F. (2011) Improved resolution for soft-x-ray monochromatization using lamellar multilayer gratings. In: Advances in X-ray/EUV Optics and Components VI, 22 August 2011 , San Diego, CA, USA (pp. 81390Q-1-81390Q-8).


Hegeman, Petra E. and Zandvliet, Harold J.W. and Kip, Gerard A.M. and Kersten, Bart A.G. and Poelsema, Bene (1995) Experimental investigation of criteria for thermal roughening. Surface Science, 331-33 (2). pp. 1110-1114. ISSN 0039-6028

Zandvliet, H.J.W. and Louwsma, H.K. and Hegeman, P.E. and Poelsema, Bene (1995) Energetics of Ni-Induced Vacancy Line Defects on Si(001). Physical Review Letters, 75 (21). pp. 3890-3893. ISSN 0031-9007


Hegeman, P.E. and Zandvliet, H.J.W. and Kip, G.A.M. and Silfhout, A. van (1994) Kinetic roughening of vicinal Si(001). Surface Science, 311 (1-2). L655-L660. ISSN 0039-6028

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