Author Publications

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Number of items: 54.

2014

Boksteen, B.K. and Ferrara, A. and Heringa, A. and Steeneken, P.G. and Hueting, R.J.E. (2014) Impact of interface charge on the electrostatics of field-plate assisted RESURF devices. IEEE transactions on electron devices . ISSN 0018-9383

Kaleli, B. and Nguyen, M.D. and Schmitz, J. and Wolters, R.A.M. and Hueting, R.J.E. (2014) Analysis of thin-film PZT/LNO stacks on an encapsulated TiN electrode. Microelectronic engineering, 119 . 16 - 19. ISSN 0167-9317

Kaleli, Buket and Hueting, Raymond J.E. and Nguyen, Minh D. and Wolters, Rob A.M. (2014) Integration of a Piezoelectric Layer on Si FinFETs for Tunable Strained Device Applications. IEEE transactions on electron devices, 61 (6). 1929 - 1935. ISSN 0018-9383

2013

Boksteen, B.K. and Ferrara, A. and Heringa, A. and Steeneken, P.G. and Koops, G.E.J. and Hueting, R.J.E. (2013) Design optimization of field-plate assisted RESURF devices. In: 25th International Symposium on Power Semiconductor Devices & ICs, ISPSD 2013, 26-30 May 2013, Kanazawa, Japan (pp. pp. 237-240).

Ferrara, A. and Steeneken, P.G. and Heringa, A. and Boksteen, B.K. and Swanenberg, M. and Scholten, A.J. and Dijk, L. van and Schmitz, J. and Hueting, R.J.E. (2013) The safe operating volume as a general measure for the operating limits of LDMOS transistors. In: International Electron Devices Meeting, IEDM 2013, 9-11 December 2013, Washington, DC, USA (pp. 6.7.1-6.7.4).

Ferrara, A. and Steeneken, P.G. and Reimann, K. and Heringa, A. and Yan, L. and Boksteen, B.K. and Swanenberg, M. and Koops, G.E.J. and Scholten, A.J. and Surdeanu, R. and Schmitz, J. and Hueting, R.J.E. (2013) Comparison of electrical techniques for temperature evaluation in power MOS transistors. In: IEEE International Conference on Microelectronic Test Structures, ICMTS 2013, 25-28 March 2013, San Diego, CA, USA (pp. pp. 115-120).

Hemert, T. van and Kaleli, B. and Hueting, R.J.E. and Esseni, D. and Dal, M.J.H. van and Schmitz, J. (2013) Strain and conduction-band offset in narrow n-type finFETs. IEEE transactions on electron devices, 60 (3). pp. 1005-1010. ISSN 0018-9383

Hemert, Tom van and Hueting, Raymond J.E. (2013) Piezoelectric strain modulation in FETs. IEEE transactions on electron devices, 60 . pp. 3265-3270. ISSN 0018-9383

Kaleli, B. and Hemert, T. van and Hueting, R.J.E. and Wolters, R.A.M. (2013) Strain characterization of FinFETs using Raman spectroscopy. Thin solid films, 541 . pp. 57-61. ISSN 0040-6090

Piccolo, G. and Sammak, A. and Hueting, R.J.E. and Schmitz, J. and Nanver, L.K. (2013) Role of junction depth in light emission from silicon p-i-n LEDs. In: 43rd European Solid-State Device Research Conference, ESSDERC 2013, 16-20 September 2013, Bucharest, Romania (pp. pp. 119-122).

2012

Boksteen, B.K. and Dhar, S. and Ferrara, A. and Heringa, A. and Hueting, R.J.E. and Koops, G.E.J. and Salm, C. and Schmitz, J. (2012) On the degradation of field-plate assisted RESURF power devices. In: IEEE International Electron Devices Meeting, IEDM 2012 , 10-13 December 2012, San Francisco, CA, USA (pp. pp. 311-314).

Boksteen, B.K. and Dhar, S. and Heringa, A. and Koops, G.E.J. and Hueting, R.J.E. (2012) Extraction of the electric field in field plate assisted RESURF devices. In: 24th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2012, 3-7 June 2012, Bruges, Belgium (pp. pp. 145-148).

Hemert, Tom van and Reimann, Klaus and Hueting, Raymond J.E. (2012) Extraction of second order piezoelectric parameters in bulk acoustic wave resonators. Applied physics letters, 100 (23). p. 232901. ISSN 0003-6951

Hemert, Tom van and Hueting, R.J.E. (2012) Active strain modulation in field effect devices. In: European Solid-State Device Research Conference, ESSDERC 2012, 17-21 September 2012, Bordeaux, France (pp. pp. 125-128).

Puliyankot, Vidhu and Hueting, Raymond J.E. (2012) One-Dimensional Physical Model to Predict the Internal Quantum Efficiency of Si-Based LEDs. IEEE Transactions on Electron Devices, 59 (1). pp. 26-34. ISSN 0018-9383

2011

Hemert, T. van and Kaleli, B. and Hueting, R.J.E. and Esseni, D. and Dal, M.J.H. van and Schmitz, J. (2011) Extracting the Conduction Band Offset in Strained FinFETs from Subthreshold-Current Measurements. In: 41st European Solid-State Device Research Conference, ESSDERC 2011, 12-16 September 2011, Helsinki, Finland (pp. pp. 275-278).

Hemert, T. van and Sakriotis, D. and Hueting, R.J.E. and Schmitz, J. (2011) Exploring capacitance-voltage measurements to find the piezoelectric coefficient of aluminum nitride. In: 24th International Conference on Microelectronic Test Structures, ICMTS 2011, 4-7 April 2011, Amsterdam, the Netherlands (pp. pp. 69-73).

Jose, S. and Hueting, R.J.E. (2011) Experimental investigation of dual wave optimized reflector stacks in solidly mounted resonators. In: IEEE International Ultrasonics Symposium, IUS 2011, 18-21 October 2011, Orlando, FL, USA (pp. pp. 1234-1237).

Jose, S. and Hueting, R.J.E. and Jansman, A.B.M. (2011) On the rule of thumb for flipping the dispersion relation in BAW devices. In: IEEE International Ultrasonics Symposium, IUS 2011, 18-21 October 2011, Orlando, FL, USA (pp. pp. 1712-1715).

Piccolo, G. and Puliyankot, V. and Kovalgin, A.Y. and Hueting, R.J.E. and Heringa, A. and Schmitz, J. (2011) Light emission enhancement by geometrical scaling of carrier injectors in Si-based LEDs. In: 41st European Solid-State Device Research Conference, ESSDERC 2011, 12-16 September 2011, Helsinki, Finland (pp. pp. 175-178).

Puliyankot, V. and Hueting, R.J.E. (2011) Modelling and optimisation of the internal quantum efficiency of Si-based LEDs. In: 11th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2011, 5-8 September 2011, Rome, Italy.

Puliyankot, V. and Piccolo, G. and Hueting, R.J.E. and Heringa, A. and Kovalgin, A. and Schmitz, J. (2011) Increased light emission by geometrical changes in Si LEDs. In: 8th International Conference on Group IV Photonics, GFP 2011, 14-16 September 2011, London, UK (pp. pp. 287-289).

2010

Boksteen, B.K. and Hueting, R.J.E. and Salm, C. and Schmitz, J. (2010) An Initial study on The Reliability of Power Semiconductor Devices. In: STW.ICT Conference 2010, 18-19 Nov 2010, Veldhoven, The Netherlands (pp. pp. 68-72).

Hemert, T. van and Hueting, R.J.E. and Rajasekharan, B. and Salm, C. and Schmitz, J. (2010) On the modelling and optimisation of a novel Schottky based silicon rectifier. In: 40th European Solid-State Device Research, Essderc 2010, 13-17 Sep 2010, Sevilla, Spain (pp. pp. 460-463).

Jose, S. and Hueting, R.J.E. and Jansman, A.B.M. (2010) Acoustic dispersion of solidly mounted resonators with an optimized reflector stack for dual wave reflection. In: IEEE International Ultrasonics Symposium, IUS 2010, 11-14 Oct 2010, San Diego, CA (pp. pp. 91-94).

Jose, S. and Jansman, A.B.M. and Hueting, R.J.E. (2010) A design procedure for an acoustic mirror providing dual reflection of longitudinal and shear waves in Solidly Mounted BAW Resonators (SMRs). In: IEEE International Ultrasonics Symposium, IUS, 20-23 September 2009, Rome, Italy (pp. pp. 2111-2114).

Jose, Sumy and Jansman, André B.M. and Hueting, Raymond J.E. and Schmitz, Jurriaan (2010) Optimized reflector stacks for solidly mounted bulk acoustic wave resonators. IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 57 (12). pp. 2753-2763. ISSN 0885-3010

Kaleli, B. and Aarnink, A.A.I. and Smits, S.M. and Hueting, R.J.E. and Wolters, R.A.M. and Schmitz, J. (2010) Electron Beam Lithography of HSQ and PMMA Resists and Importance of their Properties to Link the Nano World to the Micro World. In: STW.ICT Conference 2010, 18-19 Nov 2010, Veldhoven, The Netherlands (pp. pp. 105-108).

Rajasekharan, B. and Hueting, R.J.E. and Salm, C. and Hemert, T. van and Wolters, R.A.M. and Schmitz, J. (2010) Fabrication and characterization of the charge-plasma diode. IEEE electron device letters, 31 (6). pp. 528-530. ISSN 0741-3106

Steen, J.-L.P.J. van der and Palestri, P. and Esseni, D. and Hueting, R.J.E. (2010) A new model for the backscatter coefficient in nanoscale MOSFETs. In: 40th European Solid-State Device Research, Essderc 2010, 13-17 Sep 2010, Sevilla, Spain (pp. pp. 234-237).

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Mauczok, R. and Keur, W. and Hueting, R.J.E. (2010) BaxSr1−xTi1.02O3 metal–insulator–metal capacitors on planarized alumina substrates. Thin Solid Films, 518 (10). pp. 2854-2959. ISSN 0040-6090

2009

Jose, S. and Jansman, A.B.M. and Hueting, R.J.E. (2009) Solidly Mounted Resonator with Optimized Acoustic Reflector. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 159-162).

Puliyankot, V. and Hueting, R.J.E. and Schmitz, J. (2009) An initial modelling and simulation study on the 1D Si-Based LED. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 170-173).

Rajasekharan, Bijoy and Salm, Cora and Hueting, Ray and Wolters, Rob and Schmitz, Jurriaan (2009) Metal contacts to lowly doped Si and ultra thin SOI. In: 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, 26-27 November 2009, Veldhoven, The Netherlands (pp. pp. 103-104).

Steen, Jan-Laurens P.J. van der and Hueting, R.J.E. and Schmitz, J. (2009) Extracting Energy Band Offsets on Long-Channel Thin Silicon-on-Insulator MOSFETs. IEEE Transactions on Electron Devices, 56 (9). pp. 1999-2007. ISSN 0018-9383

Tiggelman, M.P.J. and Reimann, K. and Van Rijs, F. and Schmitz, J. and Hueting, R.J.E. (2009) On the Trade-Off Between Quality Factor and Tuning Ratio in Tunable High-Frequency Capacitors. IEEE Transactions on Electron Devices, 56 (9). pp. 2128-2136. ISSN 0018-9383

2008

Hueting, R.J.E. and Rajasekharan, B. and Salm, C. and Schmitz, J. (2008) The charge plasma P-N diode. IEEE electron device letters, 29 (12). pp. 1367-1369. ISSN 0741-3106

Jose, S. and Hueting, R.J.E. and Jansman, A.B.M. (2008) Modelling of bulk acoustic wave resonators for microwave filters. In: 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2008, 27-28 November 2008, Veldhoven, The Netherlands (pp. pp. 558-561).

Rajasekharan, B. and Salm, C. and Hueting, R.J.E. and Hoang, T. and Schmitz, J. (2008) Dimensional scaling effects on transport properties of ultrathin body p-i-n diodes. In: Proceedings of the 9th Conference on ULtimate Integration on Silicon, 12-14 Mar 2008, Udine, Italy (pp. pp. 195-198).

Rajasekharan, B. and Hueting, R.J.E. and Salm, C. and Hoang, T. and Schmitz, J. (2008) Charge plasma diode - a novel device concept. In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands (pp. pp. 576-579).

Schmitz, J. and Vries, R. de and Salm, C. and Hoang, T. and Hueting, R.J.E. and Holleman, J. (2008) On the switching speed of SOI LEDs. In: Proceedings of the Fourth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits, 23-25 Jan 2008, Cork, Ireland (pp. pp. 101-102).

Steen, J.-L.P.J. van der and Hueting, R.J.E. and Schmitz, J. (2008) Extracting energy band offsets on Thin Silicon–On–Insulator MOSFETs. In: 38th European Solid-State Device Research Conference, 15-19 September 2008, Edinburgh, Schotland (pp. pp. 242-245).

Steen, J.-L.P.J. van der and Hueting, R.J.E. and Schmitz, J. (2008) Energy band offset extraction – a comparative study –. In: 11th annual workshop on semiconductor advances for future electronics and sensors, SAFE 2008, 27-28 Nov 2008, Veldhoven, The Netherlands (pp. pp. 592-595).

Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Keur, W. and Mauczock, R. and Schmitz, J. and Hueting, R.J.E. (2008) Identifying dielectric and resistive electrode losses in high-density capacitors at radio frequencies. In: 21st ICMTS 2008 IEEE Conference on Microelectronic Test Structures, 24-27 March 2008, Edinburgh, Schotland (pp. pp. 190-195).

Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Mauczok, R. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2008) The trade-off between tuning ratio and quality factor of BaxSr1-xTiO3 MIM capacitors on alumina substrates. In: 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2008, 27-28 November 2008, Veldhoven, The Netherlands (pp. pp. 506-508).

2007

Rajasekharan, B. and Salm, C. and Hueting, R.J.E. and Hoang, T. and Wiel, W.G. van der and Schmitz, J. (2007) Dimensional scaling effects on transport properties of p-i-n diodes. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 457-459).

Steen, J.-L.P.J. van der and Hueting, R.J.E. and Smit, G.D.J. and Hoang, T. and Holleman, J. and Schmitz, J. (2007) Valence Band Offset Measurements on Thin Silicon-on-Insulator MOSFETs. IEEE Electron Device Letters, 28 (9). pp. 821-824. ISSN 0741-3106

Steen, J.-L.P.J. van der and Hueting, R.J.E. and Smit, G.D.J. and Hoang, T. and Holleman, J. and Schmitz, J. (2007) Band Offset Measurements on Ultra-Thin (100) SOI MOSFETs. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 460-464).

Steen, Jan-Laurens P.J. van der and Esseni, David and Palestri, Pierpalo and Selmi, Luca and Hueting, Raymond J.E. (2007) Validity of the parabolic effective mass approximation in silicon and germanium n-MOSFETs with different crystal orientations. IEEE Transactions on Electron Devices, 54 (8). pp. 1843-1851. ISSN 0018-9383

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Schmitz, J. and Hueting, R.J.E. and Liu, J. and Furukawa, Y. and Mauczok, R. and Keur, W. (2007) Separation of intrinsic dielectric and resistive electrode losses in ferroelectric capacitors at radio frequencies. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 465-467).

2006

Hueting, R.J.E. and Heringa, Anco (2006) Analysis of the subthreshold current of pocket or halo-implanted nMOSFETs. IEEE Transactions on Electron Devices, 53 (7). pp. 1641-1646. ISSN 0018-9383

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Beelen, D. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2006) Electrical characterization of thin film ferroelectric capacitors. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands (pp. pp. 439-443).

2005

Hueting, Raymond J.E. and Toorn, Ramses van der (2005) Analysis of the Kirk effect in silicon-based bipolar transistors with a nonuniform collector profile. IEEE Transactions on Electron Devices, 52 (11). 2489 - 2495. ISSN 0018-9383

2003

Heuvel, M.G.L. van den and Hueting, R.J.E. and Hijzen, E.A. and Zandt, M.A.A. in 't (2003) An improved method for determining the inversion layer mobility of electrons in trench MOSFETs. In: IEEE 15th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2003, April 14-17 2003, Cambridge, UK (pp. pp. 173-176).

This list was generated on Wed Aug 20 05:15:09 2014 CEST.