Author Publications

Group by: Date | Item Type

Jump to: 2000 | 1996 | 1995 | 1994

Number of items: 4.

2000

Mouthaan, A.J. and Salm, C. and Lunenborg, M.M. and Wolf de, M.A.R.C. and Kuper, F.G. (2000) Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations. Microelectronics Reliability, 40 (1). pp. 909-917. ISSN 0026-2714

1996

Lunenborg, M.M. and Graaff de, H.C. and Mouthaan, A.J. and Verweij, J.F. (1996) Comprehensive physical modeling of NMOSFET hot-carrier-induced degradation. Microelectronics Reliability, 36 (11/12). pp. 1667-1670. ISSN 0026-2714

1995

Verweij, Jan and Lunenborg, Meindert (1995) On the design of a reliability circuit simulator. Microelectronics Reliability, 35 (1). pp. 101-103. ISSN 0026-2714

1994

Verweij, J.F. and Brombacher, A.C. and Lunenborg, M.M. (1994) Component lifetime modelling. Quality and Reliability Engineering International, 10 (4). pp. 263-271. ISSN 0748-8017

This list was generated on Wed May 22 05:37:21 2013 CEST.