Author Publications

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Number of items: 6.


Vries, R.Y. de and Feil, D. and Tsirelson, V.G. (2000) Extracting charge density distributions from diffraction data: a model study on urea. Acta crystallographica Section B: Structural science, 56 (1). pp. 118-123. ISSN 0108-7681


Graafsma, H. and Vries, R.Y. de (1999) Deconvolution of the two-dimensional point-spread function of area detectors using the maximum-entropy algorithm. Journal of Applied Crystallography, 32 . pp. 683-691. ISSN 0021-8898

Zavodnik, Valery and Stash, Adam and Tsirelson, Vladimir and Vries, Roelof de and Feil, Dirk (1999) Electron density study of urea using TDS-corrected X-ray diffraction data: quantitative comparison of experimental and theoretical results. Acta Crystallographica Section B: Structural Science, 55 . pp. 45-54. ISSN 0108-7681


Vries, R.Y. de and Briels, W.J. and Feil, D. (1996) Critical Analysis of Non-Nuclear Electron-Density Maxima and the Maximum Entropy Method. Physical Review Letters, 77 (9). pp. 1719-1711. ISSN 0031-9007

Vries, R.Y. de and Briels, W.J. and Feil, D. and Velde, G. te and Baerends, E.J. (1996) Charge density study with the Maximum Entropy Method on model data of silicon. A search for non-nuclear attractors. Canadian Journal of Chemistry, 76 (6). pp. 1054-1058. ISSN 0008-4042


Vries, R.Y. de and Briels, W.J. and Feil, D. (1994) Novel treatment of the experimental data in the application of the maximum-entropy method to the determination of the electron-density distribution from X-ray experiments. Acta crystallographica Section A: Foundations of crystallography, 50 . pp. 383-391. ISSN 0108-7673

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