Meneghesso, G. and Luchies, J.R.M. and Kuper, F.G. and Mouthaan, A.J. (1996) Turn-on speed of grounded gate NMOS ESD protection transistors. Microelectronics Reliability, 36 (11/12). pp. 1735-1738. ISSN 0026-2714
Meneghesso, G. and Luchies, J.R.M. and Kuper, F.G. and Mouthaan, A.J. (1996) Turn-on speed of grounded gate NMOS ESD protection transistors. In: 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 8-11 October 1996, Enschede, The Netherlands (pp. pp. 1735-1738).
Luchies, J.R.M. and Kort, C.G.M. de and Verweij, J.F. (1995) Fast turn-on of an NMOS ESD protection transistor: measurements and simulations. Journal of Electrostatics, 36 (1). pp. 81-92. ISSN 0304-3886
Kort, Kees de and Luchies, Jan Marc and Vrehen, J.J. (1994) The transient behaviour of an input protection. Microelectronic Engineering, 24 (1-4). pp. 355-362. ISSN 0167-9317
Kuper, Fred and Luchies, Jan Marc and Bruines, Joop (1994) Suppression and origin of soft ESD failures in a submicron CMOS process. Journal of Electrostatics, 33 (3). pp. 313-325. ISSN 0304-3886
Luchies, Jan Marc and Kuper, Fred and Verweij, Jan (1993) On the use of DC measurements for ESD-related process monitoring. Quality and Reliability Engineering International, 9 (4). pp. 309-313. ISSN 0748-8017