Author Publications

1994

Flueraru, C. and Dascula, D. and Osiceanu, P. and Hulst van, N.F. and Werf van der, K.O. and Putman, C.A.J. and Segerink, F.B. and Schipper, E.F. (1994) Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy. In: 17th Annual Semiconductor Conference, 11-16 October, 1994, Sinaia, Romania.

Neagu, C. and Werf van der, K.O. and Putman, C.A.J. and Kraan, Y.M. and Grooth de, B.G. and Hulst van, N.F. and Greve, J. (1994) Analysis of Immunolabeled Cells by Atomic Force Microscopy, Optical Microscopy, and Flow Cytometry. Journal of Structural Biology, 112 (1). pp. 32-40. ISSN 1047-8477

Putman, Constant A.J. and Werf van der, Kees O. and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1994) Viscoelasticity of Living Cells Allows High Resolution Imaging by Tapping Mode Atomic Force Microscopy. Biophysical Journal, 67 (4). pp. 1749-1753. ISSN 0006-3495

Putman, Constant A.J. and Werf van der, Kees O. and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1994) Tapping mode atomic force microscopy in liquid. Applied Physics Letters, 64 (18). pp. 2454-2456. ISSN 0003-6951

1993

Doornbos, R.M.P. and Hennink, E.J. and Putman, C.A.J. and Grooth de, Bart G. and Greve, Jan (1993) White blood cell differentiation using a solid state flow cytometer. Cytometry Part A, 14 (6). pp. 589-594. ISSN 0196-4763

Putman, Constant A.J. and Leeuwen van, Anne Marie and Grooth de, Bart G. and Radosevic, Katarina and Werf van der, Kees O. and Hulst van, Niek F. and Greve, Jan (1993) Atomic force microscopy combined with confocal laser scanning microscopy: a new look at cells. Bioimaging, 1 (2). pp. 63-70. ISSN 0966-9051

Putman, C.A.J. and Grooth de, B.G. and Wiegant, J. and Raap, A.K. and Werf van der, K.O. and Hulst van, N.F. and Greve, J. (1993) Detection of in situ hybridization to human chromosomes with the Atomic Force Microscope. Cytometry Part A, 14 (4). pp. 356-361. ISSN 0196-4763

Putman, C.A.J. and Dietrich, A.J.J. and Grooth de, B.G. and Marle van, J. and Heyting, C. and Hulst van, N.F. and Greve, J. (1993) An atomic force microscopical study of the synaptonemal complex. Micron, 24 (3). pp. 273-277. ISSN 0047-7206

Putman, Constant A.J. and Grooth de, Bart G. and Hansma, Paul K. and Hulst van, Niek F. and Greve, Jan (1993) Immunogold labels: cell-surface markers in atomic force microscopy. Ultramicroscopy, 48 (1-2). pp. 177-182. ISSN 0304-3991

Putman, Constant A.J. and Werf van der, Kees O. and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1993) Stand-alone atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of liquid operation. In: Scanning probe microscopies II, 18-19 January 1993, Los Angeles, California. International Society for Optical Engineering, Los Angeles, CA, U.S.A., pp. 202-208. ISBN 9780819410818

Werf van der, Kees O. and Putman, Constant A.J. and Grooth de, Bart G. and Segerink, Frans B. and Hulst van, Niek F. and Greve, Jan and Schipper, Eric H. (1993) Compact stand-alone atomic force microscope. Review of Scientific Instruments, 64 (10). pp. 2892-2897. ISSN 0034-6748

1992

Grooth de, Bart G. and Putman, Constant A. and Werf van der, Kees O. and Hulst van, Niko F. and Oort van, Geeske and Greve, Jan (1992) Chromosome structure investigated with the atomic force microscope. In: Scanning Probe Microscopies. SPIE, Los Angeles, CA, U.S.A., pp. 205-211. ISBN 9780819407856

Hulst van, N.F. and Putman, C.A.J. and Oort van, G. and Werf van der, K.O. and Grooth de, B.G. and Greve, J. (1992) Application of an atomic force microscope with an integrated optical microscope to biological samples. Proceedings Royal Microscopical Society, 27 (3). p. 152. ISSN 0035-9017

Putman, C.A.J. and Werf van der, K.O. and Grooth de, B.G. and Hulst van, N.F. and Greve, J. and Hansma, P.K. (1992) A new imaging mode in Atomic Force Microscopy based on the error signal. In: 1639 SPIE Proceedings "Scanning Probe Microscopies", January 20–22, 1992, Los Angeles, California, USA.

Putman, Constant A.J. and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1992) Atomic force microscope featuring an integrated optical microscope. Ultramicroscopy, 42-44 (2). pp. 1549-1552. ISSN 0304-3991

Putman, Constant A.J. and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1992) A detailed analysis of the optical beam deflection technique for use in atomic force microscopy. Journal of Applied Physics, 72 (1). pp. 6-12. ISSN 0021-8979

Putman, Constant A.J. and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1992) A theoretical comparison between interferometric and optical beam deflection technique for the measurement of cantilever displacement in AFM. Ultramicroscopy, 42-44 (2). pp. 1509-1513. ISSN 0304-3991

Putman, Constant A.J. and Hansma, Helen G. and Gaub, Hermann E. and Hansma, Paul K. (1992) Polymerized LB films imaged with a combined atomic force microscope-fluorescence microscope. Langmuir, 8 (12). pp. 3014-3019. ISSN 0743-7463

Putman, Constant A.J. and Werf van der, Kees O. and Grooth de, Bart G. and Hulst van, Niek F. and Segerink, Frans B. and Greve, Jan (1992) Atomic force microscope with integrated optical microscope for biological applications. Review of Scientific Instruments, 63 (3). pp. 1914-1917. ISSN 0034-6748

Putman, Constant A.J. and Werf van der, Kees O. and Oort van, Geeske and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1992) Vacuum chamber for sample attachment in atomic force microscopy. Review of Scientific Instruments, 63 (8). pp. 4012-4013. ISSN 0034-6748