Author Publications

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Number of items: 85.

2013

Munirathinam, R. and Ricardi, R. and Egberink, R.J.M. and Huskens, J. and Holtkamp, M. and Wormeester, H. and Karst, U. and Verboom, W. (2013) Gallium-containing polymer brush film as efficient supported Lewis acid catalyst in a glass microreactor. Beilstein journal of organic chemistry, 9 . 1698 - 1704. ISSN 1860-5397

Ogieglo, W. and Grooth, J. de and Wormeester, H. and Wessling, M. and Nijmeijer, D.C. and Benes, N.E. (2013) Relaxation induced optical anisotropy during dynamic overshoot swelling of zwitterionic polymer films. Thin solid films, 545 . 320 - 326. ISSN 0040-6090

Ogieglo, W. and Werf, J.C.A. van der and Tempelman, K. and Wormeester, H. and Wessling, M. and Nijmeijer, A. and Benes, N.E. (2013) n-Hexane induced swelling of thin PDMS films under non-equilibrium nanofiltration permeation conditions, resolved by spectroscopic ellipsometry. Journal of membrane science, 431 . 233 - 243. ISSN 0376-7388

Ogieglo, W. and Wormeester, H. and Wessling, M. and Benes, N.E. (2013) Temperature-induced transition of the diffusion mechanism of n-hexane in ultra-thin polystyrene films, resolved by in-situ Spectroscopic Ellipsometry. Polymer, 54 (1). 341 - 348. ISSN 0032-3861

Ogieglo, Wojciech and Wormeester, H. and Wessling, M. and Benes, N.E. (2013) Probing the surface swelling in ultra-thin supported polystyrene films during case II diffusion of n-hexane. Macromolecular chemistry and physics, 214 (21). 2480 - 2488. ISSN 1022-1352

Wormeester, H. and Oates, T.W.H. (2013) Thin films of nanostructured Noble Metals. In: Ellipsometry at the Nanoscale. Springer Verlag, Berlin, Heidelberg, New York. ISBN 9783642339554

Yanguas-Gil, A. and Wormeester, H. (2013) Relationship Between Surface Morphology and Effective Medium Roughness. In: Ellipsometry at the Nanoscale. Springer-Verlag, Heidelberg, Berlin, New York. ISBN 9783642339554

2012

Bollmann, T.R.J. and Gastel, R. van and Wormeester, H. and Zandvliet, H.J.W. and Poelsema, B. (2012) Growth and decay of hcp-like Cu hut-shaped structures on W(100). Physical review B: Condensed matter and materials physics, 85 (12). p. 125417. ISSN 1098-0121

Colak, A. and Wormeester, H. and Zandvliet, H.J.W. and Poelsema, B. (2012) Surface adhesion and its dependence on surface roughness and humidity measured with a flat AFM tip. Applied surface science, 258 (18). 6938 - 6942. ISSN 0169-4332

Jin, Mingliang and Wolferen, Henk van and Wormeester, Herbert and Berg, Albert van den and Carlen, Edwin T. (2012) Large-area nanogap plasmon resonator arrays for plasmonics applications. Nanoscale, 4 (15). pp. 4712-4718. ISSN 20403364

Ogieglo, W. and Wormeester, H. and Wessling, M. and Benes, N.E. (2012) Spectroscopic Ellipsometry analysis of a thin film composite membrane consisting of polysulfone on a porous α-alumina support. ACS Applied materials & interfaces, 4 (2). 935 - 943. ISSN 1944-8244

Stoian, F.G. and Gastel, R. van and Wormeester, H. and Poelsema, B. (2012) Measurement of the sputter yield after mild ion erosion of a pristine Cu(001) surface. Surface science, 606 (21-22). 1618 - 1622. ISSN 0039-6028

2011

Chen, Juequan and Louis, Eric and Wormeester, Herbert and Harmsen, Rob and Kruijs, Robbert van de and Lee, Chris J. and Schaik, Willem van and Bijkerk, Fred (2011) Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry. Measurement Science and Technology, 22 (10). p. 105705. ISSN 0957-0233

Hendriksen, Bas L.M. and Martin, Florent and Qi, Yabing and Mauldin, Clayton and Vukmirovic, Nenad and Ren, JunFeng and Wormeester, Herbert and Katan, Allard J. and Altoe, Virginia and Aloni, Shaul and Frechet, Jean M.J. and Wang, Lin-Wang and Salmeron, Miquel (2011) Electrical Transport Properties of Oligothiophene-Based Molecular Films Studied by Current Sensing Atomic Force Microscopy. Nano Letters, 11 (10). pp. 4107-4112. ISSN 1530-6984

Oates, T.W.H. and Wormeester, H. and Arwin, H. (2011) Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry. Progress in Surface Science, 86 (11-12). pp. 328-376. ISSN 0079-6816

2009

Chen, Juequan and Louis, Eric and Bijkerk, Fred and Lee, Chris J. and Wormeester, Herbert and Kunze, Reinhard and Schmidt, Hagen and Schneider, Dieter and Moors, Roel and Schaik, Willem van and Lubomska, Monika (2009) Ellipsometric and surface acoustic wave sensing of carbon contamination on EUV optics. In: Alternative Lithographic Technologies. Proceedings of SPIE, 7271 . SPIE, p. 727140. ISBN 9780819475244

Loenhout, Marijn T.J. and Kooij, E. Stefan and Wormeester, Herbert and Poelsema, Bene (2009) Hydrodynamic flow induced anisotropy in colloid adsorption. Colloids and Surfaces A: Physicochemical and Engineering Aspects, 342 (1-3). pp. 46-52. ISSN 0927-7757

Rabbering, Frits and Kara, Abdelkader and Wormeester, Herbert and Warnaar, Teun and Trushin, Oleg and Rahman, Talat S. and Poelsema, Bene (2009) Dispersed Forces from Measured Shape Anisotropy of Adatom Islands: Revelations from an Accelerated Simulation Scheme. Physical Review Letters, 103 (9). 096105. ISSN 0031-9007

Rabbering, Frits and Wormeester, Herbert and Everts, Frank and Poelsema, Bene (2009) Quantitative understanding of the growth of Cu/Cu(001) including the determination of the Ehrlich-Schwoebel barrier at straight steps and kinks. Physical Review B: Condensed matter and materials physics, 79 (7). 075402. ISSN 1098-0121

Wormeester, Herbert and Poelsema, Bene (2009) Ion erosion induced nanogrooves: temporal evolution and azimuth dependence. Journal of physics: Condensed matter, 21 (22). p. 224002. ISSN 0953-8984

2008

Everts, Frank and Wormeester, Herbert and Poelsema, Bene (2008) Optical anisotropy induced by ion bombardment of Ag(001). Physical Review B: Condensed matter and materials physics, 78 (15). p. 155419. ISSN 1098-0121

Wormeester, Herbert and Kooij, E. Stefan and Poelsema, Bene (2008) Effective dielectric response of nanostructured layers. Physica Status Solidi A: Applied research, 205 (4). pp. 756-763. ISSN 0031-8965

2007

Sturm, J.M. and Croes, G.O. and Wormeester, H. and Poelsema, Bene (2007) Metastable precursor for oxygen dissociation on Si(0 0 1) 2 × 1 resolved by high lateral resolution work function measurements. Surface Science, 601 (12). pp. 2498-2507. ISSN 0039-6028

Sturm, J.M. and Wormeester, H. and Poelsema, Bene (2007) Heterogeneous oxidation of Si(1 1 1) 7 × 7 monitored with Kelvin probe force microscopy. Surface Science, 601 (19). pp. 4598-4602. ISSN 0039-6028

Vries, Anna Jo de and Kooij, E. Stefan and Wormeester, Herbert and Mewe, Agnes A. and Poelsema, Bene (2007) Ellipsometric study of percolation in electroless deposited silver films. Journal of Applied Physics, 101 (5). 053703. ISSN 0021-8979

2006

Bankras, R.G. and Holleman, J. and Schmitz, J. and Sturm, J.M. and Zinine, A. and Wormeester, H. and Poelsema, B. (2006) In Situ Reflective High-Energy Electron Diffraction Analysis During the Initial Stage of a Trimethylaluminum/Water ALD Process. Chemical Vapor Deposition, 12 (5). pp. 275-280. ISSN 0948-1907

Kovalgin, A.Y. and Zinine, A. and Bankras, R.G. and Wormeester, H. and Poelsema, B. and Schmitz, J. (2006) On the growth of native oxides on hydrogen-terminated silicon surfaces in dark and under illumination with light. In: Proceedings of the Electrochemical Society, 29 okt - 3 nov 2006, Cancun, Mexico (pp. pp. 191-202).

Wormeester, Herbert and Henry, Anne-Isabelle and Kooij, E. Stefan and Poelsema, Bene and Pileni, Marie-Paule (2006) Ellipsometric identification of collective optical properties of silver nanocrystal arrays. Journal of Chemical Physics, 124 (20). p. 204713. ISSN 0021-9606

2005

Brouwer, E.A. Martijn and Kooij, E. Stefan and Hakbijl, Mark and Wormeester, Herbert and Poelsema, Bene (2005) Deposition kinetics of nanocolloidal gold particles. Colloids and Surfaces A: Physicochemical and Engineering Aspects, 267 (1-3). pp. 133-138. ISSN 0927-7757

Hüger, E. and Wormeester, H. and Osuch, K. (2005) Alloying of Pd thin films with Nb(0 0 1). Journal of Electron Spectroscopy and Related Phenomena, 148 (2). pp. 80-90. ISSN 0368-2048

Hüger, E. and Wormeester, H. and Osuch, K. (2005) Subsurface miscibility of metal overlayers with V, Nb and Ta substrates. Surface Science, 580 (1-3). pp. 173-194. ISSN 0039-6028

Sturm, J.M. and Zinine, A. and Wormeester, H. and Bankras, R.G. and Holleman, J. and Schmitz, J. and Poelsema, B. (2005) Laterally resolved electrical characterisation of high-L oxides with non-contact Atomic Force Microscopy. Microelectronic Engineering, 80 . pp. 78-81. ISSN 0167-9317

Sturm, J.M. and Zinine, A. and Wormeester, H. and Poelsema, B. and Bankras, R.G. and Holleman, J. and Schmitz, J. (2005) Imaging of oxide charges and contact potential difference fluctuations in Atomic Layer Deposited AL203 on Si. Journal of Applied Physics, 97 (6). 063709. ISSN 0021-8979

Sturm, J.M. and Zinine, A.I. and Wormeester, H. and Poelsema, B. and Bankras, R.G. and Holleman, J. and Schmitz, J. (2005) Nanoscale topography-capacitance correlation in high-K films: Interface heterogeneity related electrical properties. Journal of Applied Physics, 98 (7). 076104-1. ISSN 0021-8979

2004

Brouwer, E.A. Martijn and Kooij, E. Stefan and Wormeester, Herbert and Hempenius, Mark A. and Poelsema, Bene (2004) Application of Principal Component Analysis to Ellipsometric Spectra. Journal of Physical Chemistry B: Materials, surfaces, interfaces, & biophysical, 108 (23). pp. 7748-7753. ISSN 1520-6106

Esser, Marcus and Zoethout, Erwin and Zandvliet, Harold J.W. and Wormeester, Herbert and Poelsema, Bene (2004) Kinetic growth manipulation of Si(0 0 1) homoepitaxy. Surface Science, 552 (1-3). pp. 35-45. ISSN 0039-6028

Hens, Z. and Vanmaekelbergh, D. and Kooij, E.S. and Wormeester, H. and Allan, G. and Delerue, C. (2004) Effect of quantum confinement on the dielectric function of PbSe. Physical Review Letters, 92 (2). 026808. ISSN 0031-9007

Kooij, E. Stefan and Brouwer, E.A. Martijn and Mewe, Agnes A. and Wormeester, Herbert and Poelsema, Bene (2004) Self-Assembly of Nanocolloidal Gold Films. In: Dekker Encyclopedia of Nanoscience and Nanotechnology. Marcel Dekker, pp. 3459-3469. ISBN 9780849396397

Kooij, E. Stefan and Brouwer, E.A. Martijn and Wormeester, Herbert and Poelsema, Bene (2004) Ionic Strength Effects: Tunable Nanocrystal Distribution in Colloidal Gold Films. In: Dekker Encyclopedia of Nanoscience and Nanotechnology. Marcel Dekker, pp. 1515-1523. ISBN 9780849396397

Kooij, E. Stefan and Galca, Aurelian C. and Wormeester, Herbert and Poelsema, Bene (2004) Structural and Optical Anisotropy in Nanoporous Anodic Aluminum Oxide. In: Dekker Encyclopedia of Nanoscience and Nanotechnology. Marcel Dekker, pp. 3685-3695. ISBN 9780849396397

Ovsyanko, Mikhail and Stoian, Georgiana and Wormeester, Herbert and Poelsema, Bene (2004) Novel local free energy minimum on the Cu(001) surface. Physical Review Letters, 93 (8). ISSN 0031-9007

Wormeester, Herbert and Benes, Nieck E. and Spijksma, Gerald I. and Verweij, Henk and Poelsema, Bene (2004) CO2 sorption of a ceramic separation membrane. Thin Solid Films, 455-456 . pp. 747-751. ISSN 0040-6090

Wormeester, Herbert and Kooij, E. Stefan and Mewe, Agnes and Rekveld, Sander and Poelsema, Bene (2004) Ellipsometric characterisation of heterogeneous 2D layers. Thin Solid Films, 455-45 . pp. 323-334. ISSN 0040-6090

Wormeester, Herbert and Kooij, E. Stefan and Poelsema, Bene (2004) Self-Assembled Thin Films: Optical Characterization. In: Dekker Encyclopedia of Nanoscience and Nanotechnology. Marcel Dekker, pp. 3361-3371. ISBN 9780849396397

2003

Brouwer, E.A. Martijn and Kooij, E. Stefan and Wormeester, Herbert and Poelsema, Bene (2003) Ionic Strength Dependent Kinetics of Nanocolloidal Gold Deposition. Langmuir, 19 (19). pp. 8102-8108. ISSN 0743-7463

Galca, Aurelian C. and Kooij, E. Stefan and Wormeester, Herbert and Salm, Cora and Leca, Victor and Rector, Jan H. and Poelsema, Bene (2003) Structural and optical characterization of porous anodic aluminium oxide. Journal of Applied Physics, 94 (7). pp. 4296-4305. ISSN 0021-8979

Kooij, E. Stefan and Wormeester, Herbert and Galca, Aurelian C. and Poelsema, Bene (2003) Optical Anisotropy and Porosity of Anodic Aluminum Oxide Characterized by Spectroscopic Ellipsometry. Electrochemical and Solid-State Letters, 6 (11). B52-B54. ISSN 1099-0062

Kooij, E.S. and Brouwer, E.A.M. and Wormeester, H. and Poelsema, B. (2003) Formation and optical characterisation of colloidal gold monolayers. Colloids and Surfaces A: Physicochemical and Engineering Aspects, 222 (1-3). pp. 103-111. ISSN 0927-7757

Wormeester, Herbert and Kooij, E. Stefan and Poelsema, Bene (2003) Unambiguous optical characterization of nanocolloidal gold films. Physical Review B: Condensed matter and materials physics, 68 (8). 085406. ISSN 1098-0121

2002

Broekmann, Peter and Mewe, Agnes and Wormeester, Herbert and Poelsema, Bene (2002) Step edge selection during ion erosion of Cu(001). Physical Review Letters, 89 (14). 146102-1-146102-4. ISSN 0031-9007

Kooij, E. Stefan and Brouwer, E.A. Martijn and Wormeester, Herbert and Poelsema, Bene (2002) Ionic Strength Mediated Self-Organization of Gold Nanocrystals: An AFM Study. Langmuir, 18 (20). pp. 7677-7682. ISSN 0743-7463

Kooij, E. Stefan and Wormeester, Herbert and Brouwer, E.A. Martijn and Vroonhoven, Esther van and Silfhout, Arend van and Poelsema, Bene (2002) Optical Characterization of Thin Colloidal Gold Films by Spectroscopic Ellipsometry. Langmuir, 18 (11). pp. 4401-4413. ISSN 0743-7463

Lisfi, A. and Lodder, J.C. and Wormeester, H. and Poelsema, B. (2002) Reorientation of magnetic anisotropy in obliquely sputtered metallic thin films. Physical Review B: Condensed matter and materials physics, 66 (17). p. 174420. ISSN 1098-0121

Wormeester, Herbert and Poelsema, Bene (2002) Flux heterogeniety through incidence angle and particle energy in steering-enhanced growth. Physical Review B: Condensed matter and materials physics, 66 (16). p. 165406. ISSN 1098-0121

2001

Benes, Nieck E. and Spijksma, Gerald and Verweij, Henk and Wormeester, Herbert and Poelsema, Bene (2001) CO2 sorption of a thin silica layer determined by spectroscopic ellipsometry. AIChE Journal, 47 (5). pp. 1212-1218. ISSN 0001-1541

Esser, Marcus and Wormeester, Herbert and Poelsema, Bene (2001) Breakdown of the simple kinematic approximation models in high-resolution LEED characterization of the initial growth of Si/Si(111). Surface Science, 482-48 (Part 2). pp. 1355-1361. ISSN 0039-6028

2000

Groenewoud, L.M.H. and Engbers, G.H.M. and Terlingen, J.G.A. and Wormeester, H. and Feijen, J. (2000) Pulsed Plasma Polymerization of Thiophene. Langmuir, 16 (15). pp. 6278-6286. ISSN 0743-7463

1999

Hueger, E. and Wormeester, H. and Bauer, E. (1999) Hexagonal metal modifications and thin-film ferromagnetism. Surface Science, 438 (1-3). pp. 185-190. ISSN 0039-6028

Lohner, T. and Fried, M. and Khanh, N.Q. and Petrik, P. and Wormeester, H. and El-Sherbiny, M.A. (1999) Comparative study of ion implantation caused anomalous surface damage in silicon studied by spectroscopic ellipsometry and Rutherford backscattering spectrometry. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 147 (1-4). pp. 90-95. ISSN 0168-583X

Noordmans, Jaap and Wormeester, Herbert and Busscher, Henk J. (1999) Simultaneous monitoring of protein adsorption at the solid–liquid interface from sessile solution droplets by ellipsometry and axisymmetric drop shape analysis by profile. Colloids and Surfaces B: Biointerfaces, 15 (3-4). pp. 227-233. ISSN 0927-7765

1998

Bijlsma, Marcel E. and Wormeester, Herbert and Blank, Dave H.A. and Span, Edward and Silfhout, Arend van and Rogalla, Horst (1998) The temperature dependence of the 4-eV optical transition in YBa2Cu3O6. Physical Review B: Condensed matter and materials physics, 1998 (57). pp. 13418-13421. ISSN 1098-0121

Fried, M. and Wormeester, H. and Zoethout, E. and Lohner, T. and Polgar, O. and Barsony, I. (1998) In situ spectroscopic ellipsometric investigation of vacuum annealed and oxidized porous silicon layers. Thin Solid Films, 313-31 . pp. 459-463. ISSN 0040-6090

Span, Edward A.F. and Wormeester, Herbert and Blank, Dave H.A. and Rogalla, Horst (1998) Oxygen diffusion in laserablated YBa2Cu3Ox thin films studied by spectroscopic ellipsometry. Materials Science and Engineering B: Solid-state materials for advanced technology, 56 (2-3). pp. 123-129. ISSN 0921-5107

Wormeester, H. and Huger, E. and Bauer, E. (1998) Importance of the Surface Electronic Structure in Heteroepitaxy. Physical Review Letters, 81 (4). pp. 854-857. ISSN 0031-9007

1997

Bijlsma, M.E. and Blank, D.H.A. and Wormeester, H. and Silfhout, A. van and Rogalla, H. (1997) In-situ growth studies of sputtered ybco thin films by spectroscopic ellipsometry. Journal of Alloys and Compounds, 251 (1-2). pp. 15-18. ISSN 0925-8388

1996

El-Sherbiny, M.A. and Khanh, N.Q. and Wormeester, H. and Fried, M. and Lohner, T. and Pinter, I. and Gyulai, J. (1996) Surface disorder production during plasma immersion implantation and high energy ion implantation. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 118 (1-4). pp. 728-732. ISSN 0168-583X

1993

Wormeester, H. and Wentink, D.J. and Boeij, P.L. de and Silfhout, A. van (1993) Optical anisotropy of Ge(001). Thin Solid Films, 233 (1-2). pp. 14-18. ISSN 0040-6090

Zandvliet, H.J.W. and Wormeester, H. and Wentink, D.J. and Silfhout, A. van and Elswijk, H.B. (1993) Why monatomic steps on Si(001) are always rough. Physical Review Letters, 70 (14). pp. 2122-2125. ISSN 0031-9007

1992

Keim, Enrico G. and Wormeester, Herbert (1992) Interaction of atomic oxygen (N2O) with a clean Si(001) surface: O adsorption geometries as derived from the O KVV Auger Lineshape. Surface Science, 260 (1-3). pp. 23-30. ISSN 0039-6028

Keim, Enrico G. and Wormeester, Herbert (1992) "Coverage dependent interaction of N2O and O2 with Si(001)2x1 as monitored by the O KLL Auger intensity ratio". Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 10 (4). pp. 2507-2510. ISSN 0734-2101

Wentink, Derk Jan and Wormeester, Herbert and Boeij, Paul de and Wijers, Chris and Silfhout, Arend van (1992) Optical anisotropy of Ge(001)2x1. Surface Science, 274 (2). pp. 270-276. ISSN 0039-6028

Wormeester, H. and Molenbroek, A.M. and Wijers, C.M.J. and Silfhout, A. van (1992) Change of the surface induced optical anisotropy of the clean Si(110) surface by oxidation. Surface Science, 260 (1-3). pp. 31-36. ISSN 0039-6028

Wormeester, Herbert and Keim, Enrico G. and Silfhout, Arend van (1992) Kinetics of the adsorption of atomic oxygen (N2O) on the Si(001)2x1 surface as revealed by the change in the surface conductance. Surface Science, 271 (3). pp. 340-348. ISSN 0039-6028

1991

Wormeester, H. and Borg, H.J. and Terpstra, D. and Keim, E.G. and Silfhout, A. van (1991) Adsorption of atomic and molecular oxygen on Si(100)2x1: coverage dependence of the Auger O KVV lineshape. Solid State Communications, 77 (3). pp. 239-242. ISSN 0038-1098

Wormeester, Herbert and Borg, Herman J. and Silfhout, Arend van (1991) The influence of inter-atomic transitions in Auger valence band spectroscopy: oxygen on Si(001)2x1. Surface Science, 258 (1-3). pp. 197-209. ISSN 0039-6028

1990

Keim, Enrico G. and Wormeester, Herbert and Silfhout, Arend van (1990) Chemical titration of clean silicon surfaces with N2O and O2: Atomic nature of "5x1" reconstructed Si(110). Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 8 (3). pp. 2747-2754. ISSN 0734-2101

Wormeester, H. and Keim, E.G. (1990) Atomic nature of '5x1' reconstructed Si(110) as revealed by chemical titration with N2O and O2: AES and LEED results. Vacuum, 41 (1-3). pp. 596-599. ISSN 0042-207X

Wormeester, H. and Silfhout, A. van and Keim, E.G. and Sasse, A.G.B.M. (1990) Comment on 'Nitric oxide adsorption on the Si(100)(2x1) surface - a vibrational study by Y. Taguchi, M. Fujisawa, Y. Kuwahara, M. Onchi and M. Nishijima'. Surface Science Letters, 233 (233). L249-L250. ISSN 0167-2584

1989

Sasse, A.G.B.M. and Hoef, M.A. van der and Wormeester, H. and Silfhout, A. van (1989) The influence of the (2 × 1) reconstruction of the Si(1 0 0) surface on the Si---L2,3 VV Auger lineshape. Solid State Communications, 71 (1). pp. 65-69. ISSN 0038-1098

Sasse, A.G.B.M. and Wormeester, H. and Hoef, M.A. van der and Keim, E.G. and Silfhout, A. van (1989) Use of a partial local density of states calculation to characterize the Auger electron Si-L2,3 VV transitions of thin oxide layers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 7 (3). pp. 1623-1628. ISSN 0734-2101

Sasse, A.G.B.M. and Wormeester, H. and Hoef, M.A. van der and Silfhout, A. van (1989) Calculated and measured Auger lineshapes in clean Si(100)2×1, SiOx and Si-NO. Journal of Physics: Condensed matter, 1 (50). p. 10175. ISSN 0953-8984

Sasse, A.G.B.M. and Wormeester, H. and Hoef, M.A. van der and Silfhout, A. van (1989) Transition density of states (TDOS) of the Si(100)2 × 1 surface derived from the L2,3VV Auger lineshape compared with cluster calculations. Surface Science, 218 (2-3). pp. 553-568. ISSN 0039-6028

Wormeester, H. (1989) Response to the comments of S. Kovatchev and A. Losev on "New approach for correction of distortions in spectral line profiles in Auger electron spectroscopy" by A.G.B.M. Sasse, H. Wormeester and A. van Silfhout. Surface and Interface Analysis, 14 (8). p. 487. ISSN 0142-2421

1988

Sasse, A.G.B.M. and Wormeester, H. and Silfhout, A. van (1988) New approach for correction of distortions in spectral line profiles in Auger electron spectroscopy. Surface and Interface Analysis, 13 (4). pp. 228-232. ISSN 0142-2421

Wormeester, H. and Sasse, A.G.B.M. and Silfhout, A. van (1988) Deconvolution, differentiation and Fourier transformation algorithms for noise-containing data based on splines and global approximation. Computer Physics Communications, 52 (1). pp. 19-27. ISSN 0010-4655

This list was generated on Sat Apr 19 05:13:36 2014 CEST.