Author Publications

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Number of items: 9.


San Segundo Bello, David and Tangelder, Ronald and Kerkhoff, Hans (2001) Modeling a verification test system for mixed-signals circuits. IEEE Design & Test of Computers, 18 (1). pp. 63-71. ISSN 0740-7475


Tangelder, R.J.W.T. and Gerez, S.H. and Kerkhoff, H.G. and Klumperink, E.A.M. and Smit, J. and Snijders, H. and Speek, H. and Vries, H. de (2000) The Mixed-Signal ASIC design course at Twente. In: 3rd European Workshop on Microelectronics Education, January 27, 2000, Fuveau, France (pp. pp. 205-208).

Zivkovic, V.A. and Tangelder, R.J.W.T. and Kerkhoff, H.G. (2000) Design and Test Space Exploration of Transport-Triggered Architectures. In: Design, Automation and Test in Europe Conference and Exhibition 2000, 27-30 March 2000, Paris, France (pp. pp. 146-151).

Zivkovic, V.A. and Tangelder, R.J.W.T. and Kerkhoff, H.G. (2000) Computer-Aided Test Flow in Core-Based Design. In: 22nd International Conference on Microelectronics, 2000, 14-17 May 2000 , Nis, Yugoslavia (pp. pp. 715-718).

Zivkovic, V.A. and Tangelder, R.J.W.T. and Kerkhoff, H.G. (2000) Computer-aided test flow in core-based design. Microelectronics Journal, 31 (11-12). pp. 999-1008. ISSN 0026-2692


Beurze, R.H. and Xing, Y. and Kleef, R. van and Tangelder, R.J.W.T. and Engin, N. (1999) Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier. In: IEEE European Test Workshop, 1999, 25-28 May 1999 , Constance, Germany (pp. pp. 28-33).

Tangelder, R.J.W.T. and Vries, H. de and Rosing, R. and Kerkhoff, H.G. and Sachdev, M. (1999) Jitter and Decision-level Noise Separation in A/D Converters. In: 16th IEEE Instrumentation and Measurement Technology Conference, IMTC 1999, 24-26 May 1999, Venice, Italy (pp. pp. 1558-1562).


Tangelder, Ronald J.W.T. and Diemel, Guido and Kerkhoff, Hans G. (1997) Smart Sensor System Application: An Integrated Compass. In: European Design and Test Conference, ED&TC 1997, 17-20 March 1997, Paris, France (pp. pp. 195-199).


Kerkhoff, Hans and Tangelder, Ronald and Speek, Han and Engin, Nur (1996) MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation. In: Third IEEE International Electronics, Circuits, and Systems, ICECS '96, 13-16 Oct. 1996, Rodos, Greece (pp. pp. 75-80).

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