Author Publications

1991

Riessen van, R.P. and Kerkhoff, H.G. and Janssen, J.M.J. (1991) A design for testability expert system for silicon compilers. In: VLSI Test Symposium, 15-17 April 1991, Atlantic City, NJ.

1990

Riessen van, R.P. and Kerkhoff, H.G. and Kloppenburg, A. (1990) Designing and implementing an architecture with boundary scan. IEEE Design & Test of Computers, 7 (1). pp. 9-19. ISSN 0740-7475

1989

Riessen van, R.P. and Kerkhoff, H.G. and Kloppenburg, A. (1989) Design and implementation of a hierarchical testable architecture using the boundary scan standard. In: 1st European Test Conference, 1989, 12-14 April 1989, Paris, France.