Author Publications

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Jump to: 1990 | 1989 | 1988 | 1985
Number of items: 10.

1990

Nijs, J.M.M. de and Silfhout, A. van (1990) The kinetics of titanium monosilicide growth studied by three-wavelength ellipsometry. Materials Science and Engineering B: Solid-state materials for advanced technology, 5 (2). pp. 313-317. ISSN 0921-5107

Nijs, J.M.M. de and Silfhout, A. van (1990) The Ti/c-Si solid state reaction : I. An ellipsometrical study. Applied Surface Science, 40 (4). pp. 333-347. ISSN 0169-4332

Nijs, J.M.M. de and Silfhout, A. van (1990) An ellipsometric and RBS study of TiSi2 formation. Materials Science and Engineering B: Solid-state materials for advanced technology, 5 (2). pp. 319-323. ISSN 0921-5107

Nijs, J.M.M. de and Silfhout, A. van (1990) The Ti/c-Si solid state reaction : II. Additional measurements by means of RBS, XPS and AES. Applied Surface Science, 40 (4). pp. 349-358. ISSN 0169-4332

Nijs, J.M.M. de and Silfhout, A. van (1990) The Ti/c-Si solid state reaction : III. The low-temperature reaction kinetics. Applied Surface Science, 40 (4). pp. 359-366. ISSN 0169-4332

1989

Fried, M. and Lohner, T. and Nijs, J.M.M. de and Silfhout, A. van and Hanekamp, L.J. and Khanh, N.Q. and Laczik, Z. and Gyulai, J. (1989) Non-destructive characterization of nitrogen-implanted silicon-on-insulator structures by spectroscopic ellipsometry. Materials Science and Engineering B: Solid-state materials for advanced technology, 2 (1-3). pp. 131-137. ISSN 0921-5107

Nijs, J.M.M. de and Silfhout, A. van (1989) A novel derivative ellipsometric method for the study of the growth of thin films: Titanium. Thin Solid Films, 173 (1). pp. 1-12. ISSN 0040-6090

1988

Nijs, J.M.M. de and Holtslag, A.H.M. and Hoekstra, A and Silfhout, A. van (1988) Calibration method for rotating-analyzer ellipsometers. Journal of the Optical Society of America A: Optics and image science, 5 (9). p. 1466. ISSN 0740-3232

Nijs, J.M.M. de and Silfhout, A. van (1988) Systematic and random errors in rotating-analyzer, ellipsometry. Journal of the Optical Society of America A: Optics and image science, 5 (6). pp. 773-781. ISSN 0740-3232

1985

Opheusden, J.H.J. van and Nijs, J.M.M. de and Wiegel, F.W. (1985) The behaviour of an ideal polymer chain interacting with two parallel surfaces. Physica A: Theoretical and statistical physics, 134 (1). pp. 59-83. ISSN 0378-4371

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