Author Publications

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Jump to: 1990 | 1989 | 1988
Number of items: 12.

1990

Hanekamp, Lambertus J. and Berg, Albert H.J. van den and Bouwmeester, Henny J.M. and Sasse, Antonius G.B.M. and Kruidhof, Henk (1990) In-depth compositional analysis of ceramic $(Bi_2O_3)_{0.75}(Er_2O_3)_{0.25}$ by AES and XPS. Microchimica acta, 101 (1-6). pp. 189-194. ISSN 0026-3672

Wormeester, H. and Silfhout, A. van and Keim, E.G. and Sasse, A.G.B.M. (1990) Comment on 'Nitric oxide adsorption on the Si(100)(2x1) surface - a vibrational study by Y. Taguchi, M. Fujisawa, Y. Kuwahara, M. Onchi and M. Nishijima'. Surface Science Letters, 233 (233). L249-L250. ISSN 0167-2584

1989

Sasse, A.G.B.M. and Hoef, M.A. van der and Wormeester, H. and Silfhout, A. van (1989) The influence of the (2 × 1) reconstruction of the Si(1 0 0) surface on the Si---L2,3 VV Auger lineshape. Solid State Communications, 71 (1). pp. 65-69. ISSN 0038-1098

Sasse, A.G.B.M. and Silfhout, A. van (1989) Adsorption of nitric oxide on the Si(100)2×1 surface: A theoretical and experimental approach. Physical review B: Condensed matter, 40 (3). pp. 1773-1782. ISSN 1095-3795

Sasse, A.G.B.M. and Wormeester, H. and Hoef, M.A. van der and Keim, E.G. and Silfhout, A. van (1989) Use of a partial local density of states calculation to characterize the Auger electron Si-L2,3 VV transitions of thin oxide layers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 7 (3). pp. 1623-1628. ISSN 0734-2101

Sasse, A.G.B.M. and Wormeester, H. and Hoef, M.A. van der and Silfhout, A. van (1989) Calculated and measured Auger lineshapes in clean Si(100)2×1, SiOx and Si-NO. Journal of Physics: Condensed matter, 1 (50). p. 10175. ISSN 0953-8984

Sasse, A.G.B.M. and Wormeester, H. and Hoef, M.A. van der and Silfhout, A. van (1989) Transition density of states (TDOS) of the Si(100)2 × 1 surface derived from the L2,3VV Auger lineshape compared with cluster calculations. Surface Science, 218 (2-3). pp. 553-568. ISSN 0039-6028

1988

Sasse, A.G.B.M. and Lakerveld, D.G. and Silfhout, A. van (1988) Summary Abstract: Self‐deconvolution in CVV Auger electron spectroscopy. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 6 (3). p. 1045. ISSN 0734-2101

Sasse, A.G.B.M. and Kleinherenbrink, P.M. and Silfhout, A. van (1988) Missing dimer defects investigated by adsorption of nitric oxide (NO) on silicon (100) 2 × 1. Surface Science, 199 (1-2). pp. 243-260. ISSN 0039-6028

Sasse, A.G.B.M. and Lakerveld, D.G. and Silfhout, A. van (1988) The adsorption of nitric oxide on a silicon (100) 2 × 1 surface studied with Auger electron spectroscopy. Surface Science, 195 (3). L167-L172. ISSN 0039-6028

Sasse, A.G.B.M. and Wormeester, H. and Silfhout, A. van (1988) New approach for correction of distortions in spectral line profiles in Auger electron spectroscopy. Surface and Interface Analysis, 13 (4). pp. 228-232. ISSN 0142-2421

Wormeester, H. and Sasse, A.G.B.M. and Silfhout, A. van (1988) Deconvolution, differentiation and Fourier transformation algorithms for noise-containing data based on splines and global approximation. Computer Physics Communications, 52 (1). pp. 19-27. ISSN 0010-4655

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