Author Publications

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Number of items: 78.

2007

Salm, Cora and Hoekstra, Eric and Kolhatkar, Jay S. and Hof, André J. and Wallinga, Hans and Schmitz, Jurriaan (2007) Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectronics Reliability, 47 (4-5). pp. 577-580. ISSN 0026-2714

Wel, Arnoud P. van der and Klumperink, Eric A.M. and Kolhatkar, Jay S. and Hoekstra, Eric and Snoeij, Martijn F. and Salm, Cora and Wallinga, Hans and Nauta, Bram (2007) Low-Frequency Noise Phenomena in Switched MOSFETs. IEEE Journal of Solid-State Circuits, 42 (3). pp. 540-550. ISSN 0018-9200

2006

Salm, C. and Hoekstra, E. and Kolhatkar, J.S. and Hof, A.J. and Wallinga, H. and Schmitz, J. (2006) Low-Frequency noise in hot-carrier degraded MOSFETs. In: 14th workshop on dielectrics in microelectronics WODIM, 26-28 june 2006, Santa Tecla, Italy (pp. pp. 64-65).

2005

Klumperink, Eric and Wel, Arnoud van der and Kolhatkar, Jay and Hoekstra, Eric and Salm, Cora and Wallinga, Hans and Nauta, Bram (2005) Reduction of 1/f Noise by Switched Biasing: an Overview. In: ProRISC 2005, 16th Workshop on Circuits, Systems and Signal Processing, 17-18 November 2005, Veldhoven, The Netherlands (pp. pp. 307-311).

Kolhatkar, Jay and Hoekstra, Eric and Hof, André and Salm, Cora and Schmitz, Jurriaan and Wallinga, Hans (2005) Impact of Hot-Carrier Degradation on the Low-Frequency Noise in MOSFETs Under Steady-State and Periodic Large-Signal Excitation. IEEE Electron Device Letters, 26 (10). pp. 764-766. ISSN 0741-3106

2004

Isai, Gratiela I. and Holleman, Jisk and Wallinga, Hans and Woerlee, Pierre H. (2004) Low Hydrogen Content Silicon Nitride Films Deposited at Room Temperature with an ECR Plasma Source. Journal of the Electrochemical Society, 151 (10). C649-C654. ISSN 0013-4651

Isai, Gratiela I. and Holleman, Jisk and Wallinga, Hans and Woerlee, Pierre H. (2004) Conduction and trapping mechanisms in SiO2 films grown near room temperature by multipolar electron cyclotron resonance plasma enhanced chemical vapor deposition. Journal of Vacuum Science & Technology B: Microelectronics and nanometer structures, 22 (3). pp. 1022-1029. ISSN 1071-1023

Kolhatkar, J.S. and Hoekstra, E. and Salm, C. and Wel, A.P. van der and Klumperink, E.A.M. and Schmitz, J. and Wallinga, H. (2004) Modeling of RTS Noise in MOSFETs under Steady-State and Large-Signal Excitation. In: IEEE International Electron Devices Meeting, IEDM, 13-15 Dec. 2004, San Francisco, CA, USA (pp. pp. 759-762).

2003

Hoang, T. and Le Minh, P. and Holleman, J. and Schmitz, J. and Wallinga, H. (2003) High external quantum efficiency of the lateral P-I-N diodes realized of silicon on insulator (SOI) material. In: Proceedings of the 6th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2003, 25 - 26 November 2003, Veldhoven, The Netherlands (pp. pp. 610-613).

Kolhatkar, J.S. and Wel, A.P. van der and Klumperink, E.A.M. and Salm, C. and Nauta, B. and Wallinga, H. (2003) Measurement and extraction of RTS Parameters under 'Switched Biased' conditions in MOSFETS. In: 17th International Conference on Noise and Fluctuations, ICNF, August 18-22, 2003, Prague, Czech Republic (pp. pp. 237-240).

Kolhatkar, J.S. and Salm, C. and Wallinga, H. (2003) Separation of random telegraph signals from 1/f noise in MOSFETs. In: Proceedings of the 6th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2003, 25 - 26 November 2003, Veldhoven, The Netherlands (pp. pp. 614-617).

Kolhatkar, J.S. and Vandamme, L.K.J. and Salm, C. and Wallinga, H. (2003) Separation of Random Telegraph Signals from 1/f Noise in MOSFETs under Constant and Switched Bias Conditions. In: 33rd Conference on European Solid-State Device Research, ESSDERC, 16-18 Sept. 2003 , Lisboa, Portugal (pp. pp. 549-552).

LeMinh, P. and Holleman, J. and Wallinga, H. and Berenschot, J.W. and Tas, N.R. and Berg, A. van den (2003) Novel integration of a microchannel with a silicon light emitting diode antifuse. Journal of Micromechanics and Microengineering, 13 (3). pp. 425-429. ISSN 0960-1317

2002

Bearda, T. and Woerlee, P.H. and Wallinga, H. and Heyns, M.M. (2002) Charge transport after hard breakdown in gate oxides. Japanese Journal of Applied Physics, Part 1: Regular papers, brief communications, and review papers, 41 (4B). pp. 2431-2436. ISSN 0021-4922

Isai, I.G. and Holleman, J. and Woerlee, P.H. and Wallinga, H. (2002) Silicon nitride layers obtained by ECR PECVD. In: 5th Annual Workshop on Semiconductors Advances for Future Electronics, SAFE 2002, 27-28 November 2002, Veldhoven, The Netherlands (pp. pp. 39-41).

Kolhatkar, J.S. and Salm, C. and Knitel, M.J. and Wallinga, H. (2002) Constant and Switched Bias Low Frequency Noise in p-MOSFETs with Varying Gate Oxide Thickness. In: 32nd European Solid-State Device Research Conference, ESSDERC, 24-26 September 2002, Firenze, Italy (pp. pp. 83-86).

Kolhatkar, J.S. and Salm, C. and Wallinga, H. (2002) Analysis of 'Switched Biased' random telegraph signals in MOSFETs. In: Proceedings of the 5th annual workshop on Semiconductors Advances for Future Electronics SAFE 2002, 27-28 November 2002, Veldhoven, The Netherlands (pp. pp. 42-45).

LeMinh, P. and Holleman, J. and Wallinga, H. and Berg, A. van den (2002) Dislocation Loop Engineering Silicon Light emitting Diode. In: 1st International Conference on Materials Processing for Properties and Performance (MP3), August 1-3, 2002, Singapore, Thailand.

2001

Isai, Gratiela and Holleman, Jisk and Woerlee, Pierre and Wallinga, Hans (2001) Electronic conduction processes in SiO2 films obtained by ECR PECVD. In: 4th annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2001, 28-30 Nov 2001, Veldhoven, The Netherlands (pp. pp. 76-81).

Kolhatkar, J.S. and Salm, C. and Wallinga, H. (2001) 1/f noise and switched bias noise measurement in p-MOSFET with varying gate oxide thickness. In: Proceedings of the 4th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2001, 28-30 Nov 2001, Veldhoven, The Netherlands (pp. pp. 92-95).

Kovalgin, A.Y. and Holleman, J. and Berg, A. van den and Wallinga, H. (2001) Thin-film Antifuses for Pellistor Type Gas Sensors. In: Semiconductor Sensor and Actuator Technology, SeSens, November 30, 2001, Veldhoven, The Netherlands (pp. pp. 809-812).

Le Minh, P. and Wallinga, H. and Woerlee, P.H. and Berg, A. van den and Holleman, J. (2001) Novel Technique for Reliability Testing of Silicon Integrated Circuits. In: In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II, 31 May - 1 June 2001, Edinburgh, UK (pp. pp. 185-190).

LeMinh, P. and Holleman, J. and Wallinga, H. and Berg, A. van den (2001) Photochemical Reaction by Nanometer-scale Light Emitting Diode-Antifuses. In: Transducers '01-Eurosensors XV, June 10-14th 2001, Munich, Germany (pp. pp. 544-547).

2000

Akil, N. and Houtsma, V.E. and Le Minh, P. and Holleman, J. and Zieren, V. and Mooij, D. de and Woerlee, P.H. and Berg, A. van den and Wallinga, H. (2000) Modeling of Light Emission Spectra Measured on Silicon Nanometer-Scale Diode-Antifuses. Journal of Applied Physics, 88 (4). pp. 1916-1922. ISSN 0021-8979

Bearda, Twan and Mertens, Paul W. and Heyns, Marc M. and Wallinga, Hans and Woerlee, Pierre (2000) Breakdown and Recovery of Thin Gate Oxides. Japanese Journal of Applied Physics, Part 2: Letters, 39 (6b). L582-L584. ISSN 0021-4922

Bearda, Twan and Mertens, Paul W. and Heyns, Marc M. and Woerlee, Pierre and Wallinga, Hans (2000) Breakdown and recovery of thin gate oxides. In: 30th European Solid-State Device research Conference, 11-13 September 2000, Cork, Ireland (pp. pp. 116-119).

Isai, G.I. and Kovalgin, A.Y. and Holleman, J. and Woerlee, P.H. and Wallinga, H. and Cobianu, C. (2000) Electrical Characterisation of Gate Dielectrics Deposited with Multipolar Electron Cyclotron Resonance Plasma Source. In: 30th European Solid State Device Research Conference, 11-13 September 2000, Cork, Ireland (pp. pp. 424-427).

Kovalgin, A.Y. and Akil, N.A. and Le Minh, P. and Holleman, J. and Berg, A. van den and Houtsma, V.E. and Wallinga, H. (2000) Nano-scale hotspots: a route to fast, real time and reliable gas sensing. In: SeSens workshop on Semiconductor Sensor and Actuator Technology, Nov. 30 - Dec. 1, 2000, Veldhoven, The Netherlands (pp. pp. 651-654).

Le Minh, P. and Akil, N.A. and Wallinga, H. and Woerlee, P.H. and Berg, A. van den and Holleman, J. (2000) New Efficient CMOS-Compatible Electro-Optical Device. In: SAFE 2000, Nov. 29-30, 2000, Veldhoven, The Netherlands (pp. pp. 93-95).

LeMinh, P. and Akil, N. and Wallinga, H. and Woerlee, P.H. and Berg, A. van den and Holleman, J. (2000) A Novel Silicon Electro-Optic Device for sensor applications. In: IEEE 13th Annual Meeting Lasers and Electro-Optics Society, LEOS 2000, 13-16 November 2000, Rio Grande, Puerto Rico (pp. pp. 523-524).

LeMinh, P. and Holleman, J. and Wallinga, H. (2000) Highly Efficient Silicon Light Emitting Diode. In: SAFE 2002, 5th Annual Workshop on Semiconductor Advances for Future Electronics, November 27-28, 2002, Veldhoven, the Netherlands (pp. pp. 46-50).

Wel, A.P. van der and Klumperink, E.A.M. and Gierkink, S.L.J. and Wassenaar, R.F. and Wallinga, H. (2000) MOSFET 1/f noise measurement under switched bias conditions. IEEE Electron Device Letters, 21 (1). pp. 43-46. ISSN 0741-3106

1999

Houtsma, V.E. and Holleman, J. and Akil, N.A. and Le Minh, P. and Zieren, V. and Berg, A. van den and Wallinga, H. and Woerlee, P.H. (1999) Visible light emission from reverse-biased silicon nanometer-scale diode-antifuses. In: International Semiconductor Conference, CAS 1999, 5-9 October 1999, Sinaia, Romania (pp. pp. 461-465).

Klootwijk, Johan H. and Kranenburg, Herma van and Woerlee, Pierre H. and Wallinga, Hans (1999) Deposited Inter-Polysilicon Dielectrics for Nonvolatile Memories. IEEE Transactions on Electron Devices, 1999 (7). pp. 1435-1445. ISSN 0018-9383

Le Minh, P. and Akil, N.A. and Houtsma, V.E. and Woerlee, P.H. and Wallinga, H. and Berg, A. van den and Holleman, J. (1999) Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure. In: SAFE'99, Annual Workshop on Semiconductor Advances for Future Electronics, Nov. 24-25, 1999, Mierlo, The Netherlands (pp. pp. 265-268).

Le Minh, P. and Dao Khac An, and Nguyen Duc Chien, and Holleman, J. and Berg, A. van den and Woerlee, P.H. and Wallinga, H. (1999) New Phenomenon of Slow Boron Diffusion from Spin-on-Dopant Source. In: Third International Workshop on Materials Science, IWOMS 1999, 2-4 November 1999, Hanoi, Vietnam (pp. pp. 517-520).

1998

Cobianu, C. and Savaniu, C. and Dumitrescu, M. and Iorgulescu, R. and Arnautu, A. and Barsony, I. and Pecz, B. and Ducso, C.S. and Szilagyi, E. and Paszti, F. and Niinisto, L. and Utriaino, M. and Kolev, S.D. and Berg, A. van den and Holleman, J. and Wallinga, H. (1998) Sn02 sol-gel derived thin layers for gas sensing applications. In: 5th NEXUSPAN Workshop on Thermal Aspects in Microsystem Technology, 6-8 May 1998, Budapest, Hungary (pp. pp. 82-87).

Klootwijk, J.H. and Kranenburg, H. van and Weusthof, M.H.H. and Woerlee, P.H. and Wallinga, H. (1998) RTP annealings for high-quality LPCVD interpolysilicon dielectric layers. Microelectronics Reliability, 38 (2). pp. 277-280. ISSN 0026-2714

Klumperink, Eric A.M. and Gierkink, S.L.J. and Wallinga, H. and Nauta, B. (1998) Reduction of 1/f Noise in MOSFETS by Switched Bias Techniques. In: 9th IEEE/ProRISC Workshop on Circuits, Systems and Signal Processing, 25-27 November 1998, Mierlo, The Netherlands (pp. pp. 285-290).

Redei, Laszlo and Fried, Miklós and Barsony, István and Wallinga, Hans (1998) A modified learning strategy for neural networks to support spectroscopic ellipsometric data evaluation. Thin Solid Films, 313-31 . pp. 149-155. ISSN 0040-6090

Sanduleanu, M.A.T. and Tuijl, A.J.M. van and Wassenaar, R.F. and Lammers, M.C. and Wallinga, H. (1998) A low noise, low residual offset, chopped amplifier for mixed level applications. In: 5th IEEE International Conference on Electronics, Circuits ad Systems ICECS 98, Sept. 7-10, 1998, Lisbon, Portugal (pp. pp. 233-236).

Sanduleanu, M.A.T. and Tuijl, A.J.M. van and Wassenaar, R.F. and Wallinga, Hans (1998) A 16-bit D/A interface with Sinc approximated semidigital reconstruction filter and reduced number of coefficients. In: 24th European Solid-State Circuits Conference, ESSCIRC 1998, Sept. 22-24, 1998, The Hague The Netherlands (pp. pp. 180-183).

1997

Mensink, Clemens H.J. and Nauta, Bram and Wallinga, Hans (1997) A CMOS "Soft-Switched" transconductor and its application in gain control and filters. IEEE Journal of Solid-State Circuits, 32 (7). pp. 989-997. ISSN 0018-9200

Redei, Laszlo and Wallinga, Hans (1997) A novel modification to backpropagation sample selection strategy. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 389 (1-2). pp. 233-236. ISSN 0168-9002

Sanduleanu, M.A.T. and Nauta, B. and Wallinga, H. (1997) Low-power low-voltage chopped transconductance amplifier for noise and offset reduction. In: 23rd European Solid-State Circuits Conference, ESSCIRC 1997, 16-18 Sept. 1997, Southampton, United Kingdom (pp. pp. 204-207).

1996

Klootwijk, J.H. and Weusthof, M.H.H. and Kranenburg, H. van and Woerlee, P.H. and Wallinga, H. (1996) Improvements of deposited interpolysilicon dielectric characteristics with RTP N2O-anneal. IEEE Electron Device Letters, 17 (7). pp. 358-359. ISSN 0741-3106

Mensink, Clemens H.J. and Nauta, Bram and Wallinga, Hans (1996) A 5.5 MHz CMOS low-pass filter using a "soft-switched" transconductor. In: 22nd European Solid-State Circuits Conference, ESSCIRC 1996, 17-19 September 1996, Neuchatel, Switzerland (pp. pp. 84-87).

1994

Annema, A.J. and Hoen, K. and Wallinga, H. (1994) Precision requirements for single-layer feedforward neural networks. In: Fourth International Conference on Microelectronics for Neural Networks and Fuzzy Systems, 26-28 September 1994, Turin, Italy (pp. pp. 145-151).

Annema, Anne-Johan and Hoen, Klaas and Wallinga, Hans (1994) Learning behavior and temporary minima of two-layer neural networks. Neural Networks, 7 (9). pp. 1387-1403. ISSN 0893-6080

Liefting, Reinoud and Wijburg, Rutger C. and Custer, Jonathan S. and Wallinga, Hans and Saris, Frans W. (1994) Improved device performance by multistep or carbon co-implants. IEEE Transactions on Electron Devices, 41 (1). pp. 50-55. ISSN 0018-9383

Masa, P. and Hoen, K. and Wallinga, H. (1994) 70 input, 20 nanosecond pattern classifier. In: IEEE International Conference on Neural Networks, 1994, 27 June - 2 July 1994, Orlando, FL, USA (pp. pp. 1854-1859).

Masa, P. and Hoen, K. and Wallinga, H. (1994) High speed VLSI neural network for high-energy physics. In: Fourth International Conference on Microelectronics for Neural Networks and Fuzzy Systems, 26-28 Sept. 1994, Turin, Italy (pp. pp. 422-428).

Masa, Peter and Hoen, Klaas and Wallinga, Hans (1994) A high-speed analog neural processor. IEEE Micro, 14 (3). pp. 40-50. ISSN 0272-1732

Zhou, M.-J. and Holleman, J. and Wallinga, H. (1994) Elimination or Minimisation of Optoelectronic Crosstalk between Photodiodes and Electronic Device in OEIC on Si. Electronics Letters, 30 (11). pp. 895-897. ISSN 0013-5194

1993

Steenwijk, Gijs van and Hoen, Klaas and Wallinga, Hans (1993) A Nonvolatile Analog Programmable Voltage Source Using the VIPMOS EEPROM Structure. IEEE Journal of Solid-State Circuits, 28 (7). pp. 784-788. ISSN 0018-9200

1992

Nauta, B. and Wallinga, H. (1992) Analoge CMOS filters voor zeer hoge frequenties. In: Themadag Analoog Ontwerpen -nieuwe methoden en technieken- (pp. pp. 12-16).

Saris, F.W. and Custer, J.S. and Schreutelkamp, R.J. and Liefting, J.R. and Wijburg, R. and Wallinga, H. (1992) Avoiding dislocations in ion-implanted silicon. Microelectronic Engineering, 19 (1-4). pp. 357-362. ISSN 0167-9317

Wijburg, R.C.M. and Liefting, J.R. and Custer, J.S. and Wallinga, H. and Saris, F.W. (1992) Improvement of device characteristics by multiple step implants or introducing a C gettering layer. Microelectronic Engineering, 19 (1-4). pp. 543-546. ISSN 0167-9317

1991

Hemink, G.J. and Wijburg, R.C.M. and Wolbert, P.B.M. and Wallinga, H. (1991) Modeling of VIPMOS hot electron gate currents. Microelectronic Engineering, 15 (1-4). pp. 65-68. ISSN 0167-9317

Ning, Zhen-Qiu and Mouthaan, Ton and Wallinga, Hans (1991) SEAS: A simulated evolution approach for analog circuit synthesis. In: IEEE Custom Integrated Circuits Conference, CICC, 12-15 May, 1991, San Diego, California, USA (pp. 5.2.1-5.2.4).

Ragay, F.W. and Aarnink, A.A.I. and Wallinga, H. (1991) Complementary vertical bipolar transistor process using high-energy ion implantation. Electronics Letters, 27 (23). pp. 2141-2143. ISSN 0013-5194

Rijns, J.J.F. and Wallinga, H. (1991) Spectral Analysis of Double-Sampling Switched-Capacitor Filters. IEEE Transactions on Circuits and Systems, 38 (11). pp. 1269-1279. ISSN 0098-4094

Rijns, J.J.F. and Wallinga, H. (1991) Stray-insensitive switched-capacitor sample-delay-hold buffers for video frequency applications. Electronics Letters, 27 (8). pp. 639-640. ISSN 0013-5194

Rijns, J.J.F. and Wallinga, H. (1991) Stray-insensitive sample-delay-hold buffers for high-frequency switched-capacitor filters. In: IEEE International Sympoisum on Circuits and Systems, ISCAS, 11-14 June 1991, Singapore (pp. pp. 1665-1668).

Wijburg, Rutger C. and Hemink, Gertjan J. and Middelhoek, Jan and Wallinga, Hans and Mouthaan, Ton J. (1991) VIPMOS-A novel buried injector structure for EPROM applications. IEEE Transactions on Electron Devices, 38 (1). pp. 111-120. ISSN 0018-9383

1990

Rijns, J.J.F. and Wallinga, H. (1990) A CMOS class-AB transconductance amplifier for switched-capacitor applications. In: IEEE International Symposium on Circuits and Systems, ISCAS, 1-3 May 1990, New Orleans, LA, USA (pp. pp. 2801-2804).

1989

Wallinga, Hans and Bult, Klaas (1989) Design and analysis of CMOS analog signal processing circuits by means of a graphical MOST model. IEEE Journal of Solid-State Circuits, 24 (3). pp. 672-680. ISSN 0018-9200

1988

Bult, Klaas and Wallinga, Hans (1988) A CMOS analog continuous-time delay line with adaptive delay-time control. IEEE Journal of Solid-State Circuits, 23 (3). pp. 759-766. ISSN 0018-9200

1985

Penning De Vries, R.G.M. and Wallinga, H. (1985) Charge loss experiments in surface channel CCD's explained by the McWhorter interface states model. Physica B+C, 129 (1-3). pp. 301-305. ISSN 0378-4363

1984

Penning De Vries, René G.M. and Wallinga, Hans (1984) Small-signal charge transfer inefficiency experiments explained by the McWhorter interface state model. IEEE Transactions on Electron Devices, 31 (10). pp. 1454-1462. ISSN 0018-9383

1982

Bhattacharyya, A.B. and Wallinga, Hans (1982) An area-variable MOS varicap and its application in programmable TAP weighting of CCD transversal filters. IEEE Transactions on Electron Devices, 29 (5). pp. 827-833. ISSN 0018-9383

1979

Bult, Klaas and Wallinga, Hans (1979) A class of analog CMOS circuits based on the square-law characteristic of an MOS transistor in saturation. IEEE Journal of Solid-State Circuits, 22 (3). pp. 357-365. ISSN 0018-9200

Bult, Klaas and Wallinga, Hans (1979) A CMOS Four-Quadrant Analog Multiplier. IEEE Journal of Solid-State Circuits, 21 (3). pp. 430-435. ISSN 0018-9200

Wallinga, Hans (1979) A general model for the frequency response of multiphase charge transfer delay lines. IEEE Journal of Solid-State Circuits, 14 (3). pp. 653-655. ISSN 0018-9200

Wallinga, Hans and Hylkema, Ike (1979) An electrically programmable CCD transversal filter with variable capacitance weight factors. IEEE Journal of Solid-State Circuits, 14 (3). pp. 538-542. ISSN 0018-9200

Wallinga, Hans and Pelgrom, Marcel J.M. (1979) An Electrically Programmable Split-Electrode Charge-Coupled Transversal Filter (EPSEF). IEEE Journal of Solid-State Circuits, 15 (5). pp. 899-907. ISSN 0018-9200

1974

Wallinga, Hans and Ruyven, Hans L.M. van (1974) Diagnostic analysis of the charge transfer in CCDs. In: 27th IEEE International Solid-State Circuits Conference, Digest of Technical Papers, 1974, February 1974, Philadelphia (pp. pp. 148-149).

1971

Wallinga, H. (1971) A method for the measurement of the turn-on condition in MOS transistors. Solid-State Electronics, 14 (11). pp. 1093-1098. ISSN 0038-1101

This list was generated on Sat Jul 26 05:15:26 2014 CEST.