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Aarnink, W.A.M. and Reuvekamp, E.M.C.M. and Verhoeven, M.A.J. and Pedyash, M.V. and Gerritsma, G.J. and Silfhout van, A. and Rogalla, H. and Ryan, T.W. (1992) (305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films. Applied Physics Letters, 61 (5). pp. 607-609. ISSN 0003-6951
Aarnink, W.A.M. and Blank, D.H.A. and Adelerhof, D.J. and Flokstra, J. and Rogalla, H. and Silfhout van, A. and Reus de, R. (1991) Interdiffusion studies on high-Tc superconducting YBa2Cu3O7−δ thin films on Si(111) with a NiSi2/ZrO2 buffer layer. Applied Surface Science, 47 (3). pp. 195-203. ISSN 0169-4332
Aarnink, W.A.M. and Gao, J. and Rogalla, H. and Silfhout van, A. (1992) Quantitative analysis of X-ray photo emission spectra, acquired on c-axis oriented high-Tc superconducting YBa2Cu3O7-delta thin films. Applied Surface Science, 55 (2-3). pp. 117-133. ISSN 0169-4332
Aarnink, W.A.M. and Gao, J. and Rogalla, H. and Silfhout van, A. (1990) Composition and thickness of the surface layer on high Tc superconducting YBa2Cu3O7−d thin films, studied by ARXPS. Journal of the Less-Common Metals, 164-16 (Part 1). pp. 321-328. ISSN 0022-5088
Aarnink, W.A.M. and IJsselsteijn, R.P.J. and Gao, J. and Silfhout van, A. and Rogalla, H. (1992) Oxygen transport in c-axis-oriented high-Tc superconducting YBa2Cu3O7-δ thin films, studied in situ by ellipsometry. Physical review B: Condensed matter, 45 (22). pp. 13002-13007. ISSN 1095-3795
Aarnink, W.A.M. and Weishaupt, A. and Silfhout van, A. (1990) Angle-resolved X-ray photoelectron spectroscopy (ARXPS) and a modified Levenberg-Marquardt fit procedure: a new combination for modeling thin layers. Applied Surface Science, 45 (1). pp. 37-48. ISSN 0169-4332
Ahmed, Waqqar and Kooij, E. Stefan and Silfhout van, Arend and Poelsema, Bene (2010) Controlling the morphology of multi-branched gold nanoparticles. Nanotechnology, 21 (12). p. 125605. ISSN 0957-4484
Ahmed, Waqqar and Kooij, E. Stefan and Silfhout van, Arend and Poelsema, Bene (2009) Quantitative Analysis of Gold Nanorod Alignment after Electric Field-Assisted Deposition. Nano Letters, 9 (11). pp. 3786-3794. ISSN 1530-6984
Ahmed, Waqqar and Kooij, Stefan and Silfhout van, Arend (2010) Ingelijst: Sterren van goud. Nederlands tijdschrift voor natuurkunde, 76 (8). p. 291. ISSN 0926-4264
Ahmed, Waqqar and Laarman, Robbin P.B. and Hellenthal, Chris and Kooij, E. Stefan and Silfhout van, Arend and Poelsema, Bene (2010) Dipole directed ring assembly of Ni-coated Au-nanorods. Chemical Communications, 46 . pp. 6711-6713. ISSN 1359-7345
Baikie, I.D. and Werf van der, K.O. and Oerbekke, H. and Broeze, J. and Silfhout van, A. (1989) Automatic kelvin probe compatible with ultrahigh vacuum. Review of Scientific Instruments, 60 (5). p. 930. ISSN 0034-6748
Bijlsma, Marcel E. and Wormeester, Herbert and Blank, Dave H.A. and Span, Edward and Silfhout van, Arend and Rogalla, Horst (1998) The temperature dependence of the 4-eV optical transition in YBa2Cu3O6. Physical Review B: Condensed matter and materials physics, 1998 (57). pp. 13418-13421. ISSN 1098-0121
Bijlsma, M.E. and Blank, D.H.A. and Wormeester, H. and Silfhout van, A. and Rogalla, H. (1997) In-situ growth studies of sputtered ybco thin films by spectroscopic ellipsometry. Journal of Alloys and Compounds, 251 (1-2). pp. 15-18. ISSN 0925-8388
Blank, D.H.A. and Aarnink, W.A.M. and Flokstra, J. and Rogalla, H. and Silfhout van, A. (1990) Physical properties and interface studies of YBa2Cu3O7 thin films deposited by laser ablation on S1 (111) with buffer layer. Journal of the Less-Common Metals, 164-16 (Part 2). pp. 1178-1185. ISSN 0022-5088
Bootsma, G.A. and Rooij de, N.F. and Silfhout van, A. (1981) The solid/liquid interface. Sensors and Actuators, 1 . pp. 111-136. ISSN 0250-6874
Busscher, H.J. and Kip, G.A.M. and Silfhout van, A. and Arends, J. (1986) Spreading pressures of water and n-propanol on polymer surfaces. Journal of Colloid and Interface Science, 114 (2). pp. 307-313. ISSN 0021-9797
Chibowski, E. and Hołysz, L. and Kip, G.A.M. and Silfhout van, A. and Busscher, H.J. (1989) Surface free energy components of glass from ellipsometry and zeta potential measurements. Journal of Colloid and Interface Science, 132 (1). pp. 54-61. ISSN 0021-9797
Dekker, J. and Zandvliet, H.J.W. and Silfhout van, A. (1990) Low energy ion bombardment on c-Ge surfaces. Vacuum, 41 (7-9). pp. 1690-1691. ISSN 0042-207X
Fried, M. and Lohner, T. and Aarnink, W.A.M. and Hanekamp, L.J. and Silfhout van, A. (1992) Determination of complex dielectric functions of ion implanted and implanted‐annealed amorphous silicon by spectroscopic ellipsometry. Journal of Applied Physics, 71 (10). pp. 5260-5262. ISSN 0021-8979
Fried, M. and Lohner, T. and Nijs de, J.M.M. and Silfhout van, A. and Hanekamp, L.J. and Khanh, N.Q. and Laczik, Z. and Gyulai, J. (1989) Non-destructive characterization of nitrogen-implanted silicon-on-insulator structures by spectroscopic ellipsometry. Materials Science and Engineering B: Solid-state materials for advanced technology, 2 (1-3). pp. 131-137. ISSN 0921-5107
Fried, M. and Silfhout van, A. (1994) Optical dispersion relations in two types of amorphous silicon using Adachi’s expression. Physical review B: Condensed matter, 49 (8). pp. 5699-5702. ISSN 1095-3795
Hauser, B. and Keim, E.G. and Rogalla, H. and Silfhout van, A. (1988) C-axis oriented growth of magnetron sputtered YBaCuO thin films on MgO substrates. Applied physics A: Materials science & processing, 46 (4). pp. 339-341. ISSN 0947-8396
Hegeman, P.E. and Zandvliet, H.J.W. and Kip, G.A.M. and Silfhout van, A. (1994) Kinetic roughening of vicinal Si(001). Surface Science, 311 (1-2). L655-L660. ISSN 0039-6028
Hellenthal, C. and Ahmed, W. and Kooij, E.S. and Silfhout van, A. and Poelsema, B. and Zandvliet, H.J.W. (2012) Tuning the dipole directed assembly of core-shell nickel coated gold nanorods. Journal of nanoparticle research, 14 . p. 1107. ISSN 1388-0764
Holtslag, A.H.M. and Silfhout van, A. (1987) Neon ion bombardment on silicon surfaces. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 19-20 (Part 2). pp. 585-589. ISSN 0168-583X
Holtslag, A.H.M. and Silfhout van, A. (1987) The desorption behaviour of implanted noble gases at low energy on silicon surfaces. Surface Science, 187 (1). pp. 36-57. ISSN 0039-6028
Holtslag, A.H.M. and Silfhout van, A. (1988) Noble-gas ion bombardment on clean silicon surfaces. Physical review B: Condensed matter, 38 (15). pp. 10556-10570. ISSN 1095-3795
Holtslag, A.H.M. and Slager, U.C. and Silfhout van, A. (1985) The interpretation of ellipsometric measurements of ion bombardment of noble gases on semiconductor surfaces. Surface Science, 152-15 (Part 2). pp. 1079-1085. ISSN 0039-6028
Keim, E.G. and Silfhout van, A. (1985) An investigation of the interaction of N2O with the Si(111)-7 × 7 surface using AES and optical reflectometry; A comparison with O2. Surface Science, 152-15 (2). pp. 1096-1102. ISSN 0039-6028
Keim, E.G. and Silfhout van, A. and Wolterbeek, L. (1987) Adsorption of atomic oxygen on the Si(110)5×1 surface via interaction with N2O. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 5 (4). pp. 1019-1023. ISSN 0734-2101
Keim, E.G. and Wolterbeek, L. and Silfhout van, A. (1987) Adsorption of atomic oxygen (N2O) on a clean Si(100) surface and its influence on the surface state density; A comparison with O2. Surface Science, 180 (2-3). pp. 565-598. ISSN 0039-6028
Keim, Enrico G. and Silfhout van, Arend (1989) Decomposition of N2O on the Si(100)2 × 1 and Si(111)7 × 7 surfaces: Determination of the density of broken bonds. Surface Science, 216 (1-2). L337-L341. ISSN 0039-6028
Keim, Enrico G. and Silfhout van, Arend (1987) The adsorption behaviour of O2 on the clean Si(110) surface in the early stage. Surface Science, 186 (3). L557-L560. ISSN 0039-6028
Keim, Enrico G. and Silfhout van, Arend and Wolterbeek, Lambert (1988) Adsorption of oxygen on the Si(110)5×1 surface via interaction with O2. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 6 (1). pp. 57-62. ISSN 0734-2101
Keim, Enrico G. and Wormeester, Herbert and Silfhout van, Arend (1990) Chemical titration of clean silicon surfaces with N2O and O2: Atomic nature of "5x1" reconstructed Si(110). Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 8 (3). pp. 2747-2754. ISSN 0734-2101
Kersten, B.A.G. and Zandvliet, H.J.W. and Blank, D.H.A. and Silfhout van, A. (1995) Reply to "comment on 'Step structure of vicinal Ge(001) surfaces' by T. Sato, T. Sueyoshi, T. Amakusa, M. Iwatsuki and H. Tochihara. Surface Science, 340 (3). pp. 333-337. ISSN 0039-6028
Kersten, Bart A.G. and Zandvliet, Harold J.W. and Blank, Dave H.A. and Silfhout van, A. (1995) Step structure of vicinal Ge (001) surfaces. Surface Science, 322 (1-3). pp. 1-7. ISSN 0039-6028
Kono, S. and Hanekamp, L.J. and Silfhout van, A. (1977) Effects on ellipsometric parameters caused by heat treatment of silicon (111) surface. Surface Science, 65 (2). pp. 633-640. ISSN 0039-6028
Kooij, E. Stefan and Wormeester, Herbert and Brouwer, E.A. Martijn and Vroonhoven van, Esther and Silfhout van, Arend and Poelsema, Bene (2002) Optical Characterization of Thin Colloidal Gold Films by Spectroscopic Ellipsometry. Langmuir, 18 (11). pp. 4401-4413. ISSN 0743-7463
Lisowski, W. and Berg van den, A.H.J. and Hanekamp, L.J. and Silfhout van, A. (1992) Composition and thickness of surface layer on molybdenum tips for scanning tunnelling microscopy (STM) studied by SEM/AES/(AR)XPS. Surface and Interface Analysis, 19 (1-12). pp. 93-99. ISSN 0142-2421
Lisowski, W. and Hemmes, H. and Jäger, D and Stöver, D. and Silfhout van, A. (1992) Interaction between plasma sprayed YBaCuO and nimonic substrates. Applied Surface Science, 62 (1-2). pp. 13-20. ISSN 0169-4332
Lohner, T. and Fried, M. and Gyulai, J. and Vedam, K. and Nguyen, N.V. and Hanekamp, L.J. and Silfhout van, A. (1993) Ion-implantation-caused special damage profiles determined by spectroscopic ellipsometry in crystalline and in relaxed (annealed) amorphous silicon. Thin Solid Films, 233 (1-2). pp. 117-121. ISSN 0040-6090
Lohner, T. and Kotai, E. and Khanh, N.Q. and Toth, L. and Fried, M. and Vedam, K. and Nguyen, N.V. and Hanekamp, L.J. and Silfhout van, A. (1994) Ion-implantation induced anomalous surface amorphization in silicon. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 85 (1-4). pp. 335-339. ISSN 0168-583X
Lohner, T. and Toth, L. and Fried, M. and Khanh, N.Q. and Yang, Gen Qing and Lu, Lin Chen and Zou, Shichang and Hanekamp, L.J. and Silfhout van, A. and Gyulai, J. (1994) Comparative investigation of damage induced by diatomic and monoatomic ion implantation in silicon. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 85 (1-4). pp. 524-527. ISSN 0168-583X
Louwsma, H.K. and Zandvliet, H.J.W. and Kersten, B.A.G. and Chesneau, J. and Silfhout van, A. and Poelsema, B. (1997) Strain relaxation induced 1-dimensional and 0-dimensional nanostructures: Bi on Ge(001). Surface Science, 381 (2-3). L594-L598. ISSN 0039-6028
Martens, J.W.D. and Bogert van den, W.F. and Silfhout van, A. (1981) The influence of argon ion bombardment on the electrical and optical properties of clean silicon surfaces. Surface Science, 105 (1). pp. 275-288. ISSN 0039-6028
Nijs de, J.M.M. and Holtslag, A.H.M. and Hoekstra, A and Silfhout van, A. (1988) Calibration method for rotating-analyzer ellipsometers. Journal of the Optical Society of America A: Optics and image science, 5 (9). p. 1466. ISSN 0740-3232
Nijs de, J.M.M. and Silfhout van, A. (1989) A novel derivative ellipsometric method for the study of the growth of thin films: Titanium. Thin Solid Films, 173 (1). pp. 1-12. ISSN 0040-6090
Nijs de, J.M.M. and Silfhout van, A. (1990) The kinetics of titanium monosilicide growth studied by three-wavelength ellipsometry. Materials Science and Engineering B: Solid-state materials for advanced technology, 5 (2). pp. 313-317. ISSN 0921-5107
Nijs de, J.M.M. and Silfhout van, A. (1990) The Ti/c-Si solid state reaction : I. An ellipsometrical study. Applied Surface Science, 40 (4). pp. 333-347. ISSN 0169-4332
Nijs de, J.M.M. and Silfhout van, A. (1990) An ellipsometric and RBS study of TiSi2 formation. Materials Science and Engineering B: Solid-state materials for advanced technology, 5 (2). pp. 319-323. ISSN 0921-5107
Nijs de, J.M.M. and Silfhout van, A. (1990) The Ti/c-Si solid state reaction : II. Additional measurements by means of RBS, XPS and AES. Applied Surface Science, 40 (4). pp. 349-358. ISSN 0169-4332
Nijs de, J.M.M. and Silfhout van, A. (1990) The Ti/c-Si solid state reaction : III. The low-temperature reaction kinetics. Applied Surface Science, 40 (4). pp. 359-366. ISSN 0169-4332
Nijs de, J.M.M. and Silfhout van, A. (1988) Systematic and random errors in rotating-analyzer, ellipsometry. Journal of the Optical Society of America A: Optics and image science, 5 (6). pp. 773-781. ISSN 0740-3232
Poppe, G.P.M. and Wijers, C.M.J. and Silfhout van, A. (1991) The double cell technique: a discrete dipole approach towards surface optics. Solid State Communications, 78 (8). pp. 773-777. ISSN 0038-1098
Poppe, G.P.M. and Wijers, C.M.J. and Silfhout van, A. (1991) Microscopic treatment of the IR spectroscopy of CO physisorbed onNaCl(100). Surface Science, 251-25 . pp. 321-324. ISSN 0039-6028
Poppe, G.P.M. and Wijers, C.M.J. and Silfhout van, A. (1991) ir spectroscopy of CO physisorbed on NaCl(100): Microscopic treatment. Physical review B: Condensed matter, 44 (15). pp. 7917-7929. ISSN 1095-3795
Raza, Muhammad Akram and Kooij, E. Stefan and Silfhout van, Arend and Poelsema, Bene (2010) Superhydrophobic Surfaces by Anomalous Fluoroalkylsilane Self-Assembly on Silica Nanosphere Arrays. Langmuir, 26 (15). pp. 12962-12972. ISSN 0743-7463
Raza, Muhammad Akram and Kooij, E. Stefan and Silfhout van, Arend and Zandvliet, Harold J.W. and Poelsema, Bene (2011) Novel, highly selective gold nanoparticle patterning on surfaces using pure water. Journal of Colloid and Interface Science, 364 (2). pp. 304-310. ISSN 0021-9797
Sasse, A.G.B.M. and Lakerveld, D.G. and Silfhout van, A. (1988) Summary Abstract: Self‐deconvolution in CVV Auger electron spectroscopy. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 6 (3). p. 1045. ISSN 0734-2101
Sasse, A.G.B.M. and Hoef van der, M.A. and Wormeester, H. and Silfhout van, A. (1989) The influence of the (2 × 1) reconstruction of the Si(1 0 0) surface on the Si---L2,3 VV Auger lineshape. Solid State Communications, 71 (1). pp. 65-69. ISSN 0038-1098
Sasse, A.G.B.M. and Kleinherenbrink, P.M. and Silfhout van, A. (1988) Missing dimer defects investigated by adsorption of nitric oxide (NO) on silicon (100) 2 × 1. Surface Science, 199 (1-2). pp. 243-260. ISSN 0039-6028
Sasse, A.G.B.M. and Lakerveld, D.G. and Silfhout van, A. (1988) The adsorption of nitric oxide on a silicon (100) 2 × 1 surface studied with Auger electron spectroscopy. Surface Science, 195 (3). L167-L172. ISSN 0039-6028
Sasse, A.G.B.M. and Silfhout van, A. (1989) Adsorption of nitric oxide on the Si(100)2×1 surface: A theoretical and experimental approach. Physical review B: Condensed matter, 40 (3). pp. 1773-1782. ISSN 1095-3795
Sasse, A.G.B.M. and Wormeester, H. and Hoef van der, M.A. and Keim, E.G. and Silfhout van, A. (1989) Use of a partial local density of states calculation to characterize the Auger electron Si-L2,3 VV transitions of thin oxide layers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 7 (3). pp. 1623-1628. ISSN 0734-2101
Sasse, A.G.B.M. and Wormeester, H. and Hoef van der, M.A. and Silfhout van, A. (1989) Calculated and measured Auger lineshapes in clean Si(100)2×1, SiOx and Si-NO. Journal of Physics: Condensed matter, 1 (50). p. 10175. ISSN 0953-8984
Sasse, A.G.B.M. and Wormeester, H. and Hoef van der, M.A. and Silfhout van, A. (1989) Transition density of states (TDOS) of the Si(100)2 × 1 surface derived from the L2,3VV Auger lineshape compared with cluster calculations. Surface Science, 218 (2-3). pp. 553-568. ISSN 0039-6028
Sasse, A.G.B.M. and Wormeester, H. and Silfhout van, A. (1988) New approach for correction of distortions in spectral line profiles in Auger electron spectroscopy. Surface and Interface Analysis, 13 (4). pp. 228-232. ISSN 0142-2421
Stokkers, G.J. and Silfhout van, A. and Bootsma, G.A. and Fransen, T. and Gellings, P.J. (1983) Interaction of oxygen with an AISI 314 stainless steel surface studied by ellipsometry and auger electron spectroscopy in combination with ion bombardment. Corrosion Science, 23 (3). pp. 195-204. ISSN 0010-938X
Tang, Q. and Driessen, A. and Hoekstra, P. and Hilderink, L.H. and Silfhout van, A. and Popma, Th.J.A. (1990) Optical response of highly granular YBaCuO films prepared by non-vacuum aerosol deposition. Journal of the Less-Common Metals, 164-16 (Part 2). pp. 1587-1594. ISSN 0022-5088
Wentink, Derk Jan and Wormeester, Herbert and Boeij de, Paul and Wijers, Chris and Silfhout van, Arend (1992) Optical anisotropy of Ge(001)2x1. Surface Science, 274 (2). pp. 270-276. ISSN 0039-6028
Wierenga, P.E. and Sparnaay, M.J. and Silfhout van, A. (1980) Reflectometric study of surface states and oxygen adsorption on clean Si(100) and (110) surfaces. Surface Science, 99 (1). pp. 59-69. ISSN 0039-6028
Wolterbeek, L. and Akkerhuis, G.F. and Silfhout van, A. (1985) The optimization of differential reflectometry at surfaces of transparent crystals. Surface Science, 152-15 (Part 2). pp. 1071-1078. ISSN 0039-6028
Wormeester, H. and Borg, H.J. and Terpstra, D. and Keim, E.G. and Silfhout van, A. (1991) Adsorption of atomic and molecular oxygen on Si(100)2x1: coverage dependence of the Auger O KVV lineshape. Solid State Communications, 77 (3). pp. 239-242. ISSN 0038-1098
Wormeester, H. and Molenbroek, A.M. and Wijers, C.M.J. and Silfhout van, A. (1992) Change of the surface induced optical anisotropy of the clean Si(110) surface by oxidation. Surface Science, 260 (1-3). pp. 31-36. ISSN 0039-6028
Wormeester, H. and Sasse, A.G.B.M. and Silfhout van, A. (1988) Deconvolution, differentiation and Fourier transformation algorithms for noise-containing data based on splines and global approximation. Computer Physics Communications, 52 (1). pp. 19-27. ISSN 0010-4655
Wormeester, H. and Silfhout van, A. and Keim, E.G. and Sasse, A.G.B.M. (1990) Comment on 'Nitric oxide adsorption on the Si(100)(2x1) surface - a vibrational study by Y. Taguchi, M. Fujisawa, Y. Kuwahara, M. Onchi and M. Nishijima'. Surface Science Letters, 233 (233). L249-L250. ISSN 0167-2584
Wormeester, H. and Wentink, D.J. and Boeij de, P.L. and Silfhout van, A. (1993) Optical anisotropy of Ge(001). Thin Solid Films, 233 (1-2). pp. 14-18. ISSN 0040-6090
Wormeester, Herbert and Borg, Herman J. and Silfhout van, Arend (1991) The influence of inter-atomic transitions in Auger valence band spectroscopy: oxygen on Si(001)2x1. Surface Science, 258 (1-3). pp. 197-209. ISSN 0039-6028
Wormeester, Herbert and Keim, Enrico G. and Silfhout van, Arend (1992) Kinetics of the adsorption of atomic oxygen (N2O) on the Si(001)2x1 surface as revealed by the change in the surface conductance. Surface Science, 271 (3). pp. 340-348. ISSN 0039-6028
Zandvliet, H.J.W. and Terpstra, D. and Silfhout van, A. (1991) Reconstructions and phase transitions of the Ge(001) surface. Journal of Physics: Condensed matter, 3 (4). pp. 409-415. ISSN 0953-8984
Zandvliet, H.J.W. and Caspers, W.J. and Silfhout van, A. (1991) Order-disorder phase transition of the Ge(001) surface. Solid State Communications, 78 (5). pp. 455-458. ISSN 0038-1098
Zandvliet, H.J.W. and Keim, E.G. and Silfhout van, A. (1990) Adsorption of atomic oxygen (N2O) on a clean Ge(001) surface. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 8 (3). pp. 2581-2584. ISSN 0734-2101
Zandvliet, H.J.W. and Poppe, G.P.M. and Wijers, C.M.J. and Silfhout van, A. (1989) Reconstructions of the Ge(0 0 1) surface. Solid State Communications, 71 (1). pp. 63-64. ISSN 0038-1098
Zandvliet, H.J.W. and Poppe, G.P.M. and Wijers, C.M.J. and Silfhout van, A. (1989) Reconstructions of the Ge(0 0 1) surface. Solid State Communications, 71 (1). pp. 63-64. ISSN 0038-1098
Zandvliet, H.J.W. and Silfhout van, A. (1988) Surface states on clean Ge(111) surfaces. Surface Science, 195 (1-2). pp. 138-150. ISSN 0039-6028
Zandvliet, H.J.W. and Silfhout van, A. (1988) The optical and the electronic response of the Ge(111)-c(2 × 8) surface to O2 exposure. Solid State Communications, 65 (11). pp. 1425-1427. ISSN 0038-1098
Zandvliet, H.J.W. and Silfhout van, A. (1989) Surface states on clean Ge(001)2 × 1 surfaces. Surface Science, 211-21 . pp. 544-551. ISSN 0039-6028
Zandvliet, H.J.W. and Silfhout van, A. and Sparnaay, M.J. (1989) Metallic properties of the Ge(001) surface. Physical review B: Condensed matter, 39 (8). pp. 5576-5578. ISSN 1095-3795
Zandvliet, H.J.W. and Wormeester, H. and Wentink, D.J. and Silfhout van, A. and Elswijk, H.B. (1993) Why monatomic steps on Si(001) are always rough. Physical Review Letters, 70 (14). pp. 2122-2125. ISSN 0031-9007
Conference or Workshop Item
Kersten, B.A.G. and Sjerps-Koomen, L. and Zandvliet, H.J.W. and Blank, D.H.A. and Silfhout van, A. (1995) Step-step interactions on the vicinal Ge(001) surface. In: Symposium on Evolution of Thin Film Structure and Morphology, November 28 - December 2, 1994, Boston, Massachusetts, USA.