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Article

Aarnink, W.A.M. and Reuvekamp, E.M.C.M. and Verhoeven, M.A.J. and Pedyash, M.V. and Gerritsma, G.J. and Silfhout, A. van and Rogalla, H. and Ryan, T.W. (1992) (305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films. Applied Physics Letters, 61 (5). pp. 607-609. ISSN 0003-6951

Aarnink, W.A.M. and Blank, D.H.A. and Adelerhof, D.J. and Flokstra, J. and Rogalla, H. and Silfhout, A. van and Reus, R. de (1991) Interdiffusion studies on high-Tc superconducting YBa2Cu3O7−δ thin films on Si(111) with a NiSi2/ZrO2 buffer layer. Applied Surface Science, 47 (3). pp. 195-203. ISSN 0169-4332

Aarnink, W.A.M. and Gao, J. and Rogalla, H. and Silfhout, A. van (1992) Quantitative analysis of X-ray photo emission spectra, acquired on c-axis oriented high-Tc superconducting YBa2Cu3O7-delta thin films. Applied Surface Science, 55 (2-3). pp. 117-133. ISSN 0169-4332

Aarnink, W.A.M. and Gao, J. and Rogalla, H. and Silfhout, A. van (1990) Composition and thickness of the surface layer on high Tc superconducting YBa2Cu3O7−d thin films, studied by ARXPS. Journal of the Less-Common Metals, 164-16 (Part 1). pp. 321-328. ISSN 0022-5088

Aarnink, W.A.M. and IJsselsteijn, R.P.J. and Gao, J. and Silfhout, A. van and Rogalla, H. (1992) Oxygen transport in c-axis-oriented high-Tc superconducting YBa2Cu3O7-δ thin films, studied in situ by ellipsometry. Physical review B: Condensed matter, 45 (22). pp. 13002-13007. ISSN 1095-3795

Aarnink, W.A.M. and Weishaupt, A. and Silfhout, A. van (1990) Angle-resolved X-ray photoelectron spectroscopy (ARXPS) and a modified Levenberg-Marquardt fit procedure: a new combination for modeling thin layers. Applied Surface Science, 45 (1). pp. 37-48. ISSN 0169-4332

Ahmed, Waqqar and Kooij, E. Stefan and Silfhout, Arend van and Poelsema, Bene (2010) Controlling the morphology of multi-branched gold nanoparticles. Nanotechnology, 21 (12). p. 125605. ISSN 0957-4484

Ahmed, Waqqar and Kooij, E. Stefan and Silfhout, Arend van and Poelsema, Bene (2009) Quantitative Analysis of Gold Nanorod Alignment after Electric Field-Assisted Deposition. Nano Letters, 9 (11). pp. 3786-3794. ISSN 1530-6984

Ahmed, Waqqar and Kooij, Stefan and Silfhout, Arend van (2010) Ingelijst: Sterren van goud. Nederlands tijdschrift voor natuurkunde, 76 (8). p. 291. ISSN 0926-4264

Ahmed, Waqqar and Laarman, Robbin P.B. and Hellenthal, Chris and Kooij, E. Stefan and Silfhout, Arend van and Poelsema, Bene (2010) Dipole directed ring assembly of Ni-coated Au-nanorods. Chemical Communications, 46 . pp. 6711-6713. ISSN 1359-7345

Baikie, I.D. and Werf, K.O. van der and Oerbekke, H. and Broeze, J. and Silfhout, A. van (1989) Automatic kelvin probe compatible with ultrahigh vacuum. Review of Scientific Instruments, 60 (5). p. 930. ISSN 0034-6748

Bijlsma, Marcel E. and Wormeester, Herbert and Blank, Dave H.A. and Span, Edward and Silfhout, Arend van and Rogalla, Horst (1998) The temperature dependence of the 4-eV optical transition in YBa2Cu3O6. Physical Review B: Condensed matter and materials physics, 1998 (57). pp. 13418-13421. ISSN 1098-0121

Bijlsma, M.E. and Blank, D.H.A. and Wormeester, H. and Silfhout, A. van and Rogalla, H. (1997) In-situ growth studies of sputtered ybco thin films by spectroscopic ellipsometry. Journal of Alloys and Compounds, 251 (1-2). pp. 15-18. ISSN 0925-8388

Blank, D.H.A. and Aarnink, W.A.M. and Flokstra, J. and Rogalla, H. and Silfhout, A. van (1990) Physical properties and interface studies of YBa2Cu3O7 thin films deposited by laser ablation on S1 (111) with buffer layer. Journal of the Less-Common Metals, 164-16 (Part 2). pp. 1178-1185. ISSN 0022-5088

Bootsma, G.A. and Rooij, N.F. de and Silfhout, A. van (1981) The solid/liquid interface. Sensors and Actuators, 1 . pp. 111-136. ISSN 0250-6874

Busscher, H.J. and Kip, G.A.M. and Silfhout, A. van and Arends, J. (1986) Spreading pressures of water and n-propanol on polymer surfaces. Journal of Colloid and Interface Science, 114 (2). pp. 307-313. ISSN 0021-9797

Chibowski, E. and Hołysz, L. and Kip, G.A.M. and Silfhout, A. van and Busscher, H.J. (1989) Surface free energy components of glass from ellipsometry and zeta potential measurements. Journal of Colloid and Interface Science, 132 (1). pp. 54-61. ISSN 0021-9797

Dekker, J. and Zandvliet, H.J.W. and Silfhout, A. van (1990) Low energy ion bombardment on c-Ge surfaces. Vacuum, 41 (7-9). pp. 1690-1691. ISSN 0042-207X

Fried, M. and Lohner, T. and Aarnink, W.A.M. and Hanekamp, L.J. and Silfhout, A. van (1992) Determination of complex dielectric functions of ion implanted and implanted‐annealed amorphous silicon by spectroscopic ellipsometry. Journal of Applied Physics, 71 (10). pp. 5260-5262. ISSN 0021-8979

Fried, M. and Lohner, T. and Nijs, J.M.M. de and Silfhout, A. van and Hanekamp, L.J. and Khanh, N.Q. and Laczik, Z. and Gyulai, J. (1989) Non-destructive characterization of nitrogen-implanted silicon-on-insulator structures by spectroscopic ellipsometry. Materials Science and Engineering B: Solid-state materials for advanced technology, 2 (1-3). pp. 131-137. ISSN 0921-5107

Fried, M. and Silfhout, A. van (1994) Optical dispersion relations in two types of amorphous silicon using Adachi’s expression. Physical review B: Condensed matter, 49 (8). pp. 5699-5702. ISSN 1095-3795

Hauser, B. and Keim, E.G. and Rogalla, H. and Silfhout, A. van (1988) C-axis oriented growth of magnetron sputtered YBaCuO thin films on MgO substrates. Applied physics A: Materials science & processing, 46 (4). pp. 339-341. ISSN 0947-8396

Hegeman, P.E. and Zandvliet, H.J.W. and Kip, G.A.M. and Silfhout, A. van (1994) Kinetic roughening of vicinal Si(001). Surface Science, 311 (1-2). L655-L660. ISSN 0039-6028

Hellenthal, C. and Ahmed, W. and Kooij, E.S. and Silfhout, A. van and Poelsema, B. and Zandvliet, H.J.W. (2012) Tuning the dipole directed assembly of core-shell nickel coated gold nanorods. Journal of nanoparticle research, 14 (9). p. 1107. ISSN 1388-0764

Holtslag, A.H.M. and Silfhout, A. van (1987) Neon ion bombardment on silicon surfaces. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 19-20 (Part 2). pp. 585-589. ISSN 0168-583X

Holtslag, A.H.M. and Silfhout, A. van (1987) The desorption behaviour of implanted noble gases at low energy on silicon surfaces. Surface Science, 187 (1). pp. 36-57. ISSN 0039-6028

Holtslag, A.H.M. and Silfhout, A. van (1988) Noble-gas ion bombardment on clean silicon surfaces. Physical review B: Condensed matter, 38 (15). pp. 10556-10570. ISSN 1095-3795

Holtslag, A.H.M. and Slager, U.C. and Silfhout, A. van (1985) The interpretation of ellipsometric measurements of ion bombardment of noble gases on semiconductor surfaces. Surface Science, 152-15 (Part 2). pp. 1079-1085. ISSN 0039-6028

Keim, E.G. and Silfhout, A. van (1985) An investigation of the interaction of N2O with the Si(111)-7 × 7 surface using AES and optical reflectometry; A comparison with O2. Surface Science, 152-15 (2). pp. 1096-1102. ISSN 0039-6028

Keim, E.G. and Silfhout, A. van and Wolterbeek, L. (1987) Adsorption of atomic oxygen on the Si(110)5×1 surface via interaction with N2O. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 5 (4). pp. 1019-1023. ISSN 0734-2101

Keim, E.G. and Wolterbeek, L. and Silfhout, A. van (1987) Adsorption of atomic oxygen (N2O) on a clean Si(100) surface and its influence on the surface state density; A comparison with O2. Surface Science, 180 (2-3). pp. 565-598. ISSN 0039-6028

Keim, Enrico G. and Silfhout, Arend van (1989) Decomposition of N2O on the Si(100)2 × 1 and Si(111)7 × 7 surfaces: Determination of the density of broken bonds. Surface Science, 216 (1-2). L337-L341. ISSN 0039-6028

Keim, Enrico G. and Silfhout, Arend van (1987) The adsorption behaviour of O2 on the clean Si(110) surface in the early stage. Surface Science, 186 (3). L557-L560. ISSN 0039-6028

Keim, Enrico G. and Silfhout, Arend van and Wolterbeek, Lambert (1988) Adsorption of oxygen on the Si(110)5×1 surface via interaction with O2. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 6 (1). pp. 57-62. ISSN 0734-2101

Keim, Enrico G. and Wormeester, Herbert and Silfhout, Arend van (1990) Chemical titration of clean silicon surfaces with N2O and O2: Atomic nature of "5x1" reconstructed Si(110). Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 8 (3). pp. 2747-2754. ISSN 0734-2101

Kersten, B.A.G. and Zandvliet, H.J.W. and Blank, D.H.A. and Silfhout, A. van (1995) Reply to "comment on 'Step structure of vicinal Ge(001) surfaces' by T. Sato, T. Sueyoshi, T. Amakusa, M. Iwatsuki and H. Tochihara. Surface Science, 340 (3). pp. 333-337. ISSN 0039-6028

Kersten, Bart A.G. and Zandvliet, Harold J.W. and Blank, Dave H.A. and Silfhout, A. van (1995) Step structure of vicinal Ge (001) surfaces. Surface Science, 322 (1-3). pp. 1-7. ISSN 0039-6028

Kono, S. and Hanekamp, L.J. and Silfhout, A. van (1977) Effects on ellipsometric parameters caused by heat treatment of silicon (111) surface. Surface Science, 65 (2). pp. 633-640. ISSN 0039-6028

Kooij, E. Stefan and Wormeester, Herbert and Brouwer, E.A. Martijn and Vroonhoven, Esther van and Silfhout, Arend van and Poelsema, Bene (2002) Optical Characterization of Thin Colloidal Gold Films by Spectroscopic Ellipsometry. Langmuir, 18 (11). pp. 4401-4413. ISSN 0743-7463

Lisowski, W. and Berg, A.H.J. van den and Hanekamp, L.J. and Silfhout, A. van (1992) Composition and thickness of surface layer on molybdenum tips for scanning tunnelling microscopy (STM) studied by SEM/AES/(AR)XPS. Surface and Interface Analysis, 19 (1-12). pp. 93-99. ISSN 0142-2421

Lisowski, W. and Hemmes, H. and Jäger, D and Stöver, D. and Silfhout, A. van (1992) Interaction between plasma sprayed YBaCuO and nimonic substrates. Applied Surface Science, 62 (1-2). pp. 13-20. ISSN 0169-4332

Lohner, T. and Fried, M. and Gyulai, J. and Vedam, K. and Nguyen, N.V. and Hanekamp, L.J. and Silfhout, A. van (1993) Ion-implantation-caused special damage profiles determined by spectroscopic ellipsometry in crystalline and in relaxed (annealed) amorphous silicon. Thin Solid Films, 233 (1-2). pp. 117-121. ISSN 0040-6090

Lohner, T. and Kotai, E. and Khanh, N.Q. and Toth, L. and Fried, M. and Vedam, K. and Nguyen, N.V. and Hanekamp, L.J. and Silfhout, A. van (1994) Ion-implantation induced anomalous surface amorphization in silicon. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 85 (1-4). pp. 335-339. ISSN 0168-583X

Lohner, T. and Toth, L. and Fried, M. and Khanh, N.Q. and Yang, Gen Qing and Lu, Lin Chen and Zou, Shichang and Hanekamp, L.J. and Silfhout, A. van and Gyulai, J. (1994) Comparative investigation of damage induced by diatomic and monoatomic ion implantation in silicon. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 85 (1-4). pp. 524-527. ISSN 0168-583X

Louwsma, H.K. and Zandvliet, H.J.W. and Kersten, B.A.G. and Chesneau, J. and Silfhout, A. van and Poelsema, B. (1997) Strain relaxation induced 1-dimensional and 0-dimensional nanostructures: Bi on Ge(001). Surface Science, 381 (2-3). L594-L598. ISSN 0039-6028

Martens, J.W.D. and Bogert, W.F. van den and Silfhout, A. van (1981) The influence of argon ion bombardment on the electrical and optical properties of clean silicon surfaces. Surface Science, 105 (1). pp. 275-288. ISSN 0039-6028

Nijs, J.M.M. de and Holtslag, A.H.M. and Hoekstra, A and Silfhout, A. van (1988) Calibration method for rotating-analyzer ellipsometers. Journal of the Optical Society of America A: Optics and image science, 5 (9). p. 1466. ISSN 0740-3232

Nijs, J.M.M. de and Silfhout, A. van (1989) A novel derivative ellipsometric method for the study of the growth of thin films: Titanium. Thin Solid Films, 173 (1). pp. 1-12. ISSN 0040-6090

Nijs, J.M.M. de and Silfhout, A. van (1990) The kinetics of titanium monosilicide growth studied by three-wavelength ellipsometry. Materials Science and Engineering B: Solid-state materials for advanced technology, 5 (2). pp. 313-317. ISSN 0921-5107

Nijs, J.M.M. de and Silfhout, A. van (1990) The Ti/c-Si solid state reaction : I. An ellipsometrical study. Applied Surface Science, 40 (4). pp. 333-347. ISSN 0169-4332

Nijs, J.M.M. de and Silfhout, A. van (1990) An ellipsometric and RBS study of TiSi2 formation. Materials Science and Engineering B: Solid-state materials for advanced technology, 5 (2). pp. 319-323. ISSN 0921-5107

Nijs, J.M.M. de and Silfhout, A. van (1990) The Ti/c-Si solid state reaction : II. Additional measurements by means of RBS, XPS and AES. Applied Surface Science, 40 (4). pp. 349-358. ISSN 0169-4332

Nijs, J.M.M. de and Silfhout, A. van (1990) The Ti/c-Si solid state reaction : III. The low-temperature reaction kinetics. Applied Surface Science, 40 (4). pp. 359-366. ISSN 0169-4332

Nijs, J.M.M. de and Silfhout, A. van (1988) Systematic and random errors in rotating-analyzer, ellipsometry. Journal of the Optical Society of America A: Optics and image science, 5 (6). pp. 773-781. ISSN 0740-3232

Poppe, G.P.M. and Wijers, C.M.J. and Silfhout, A. van (1991) The double cell technique: a discrete dipole approach towards surface optics. Solid State Communications, 78 (8). pp. 773-777. ISSN 0038-1098

Poppe, G.P.M. and Wijers, C.M.J. and Silfhout, A. van (1991) Microscopic treatment of the IR spectroscopy of CO physisorbed onNaCl(100). Surface Science, 251-25 . pp. 321-324. ISSN 0039-6028

Poppe, G.P.M. and Wijers, C.M.J. and Silfhout, A. van (1991) ir spectroscopy of CO physisorbed on NaCl(100): Microscopic treatment. Physical review B: Condensed matter, 44 (15). pp. 7917-7929. ISSN 1095-3795

Raza, Muhammad Akram and Kooij, E. Stefan and Silfhout, Arend van and Poelsema, Bene (2010) Superhydrophobic Surfaces by Anomalous Fluoroalkylsilane Self-Assembly on Silica Nanosphere Arrays. Langmuir, 26 (15). pp. 12962-12972. ISSN 0743-7463

Raza, Muhammad Akram and Kooij, E. Stefan and Silfhout, Arend van and Zandvliet, Harold J.W. and Poelsema, Bene (2011) Novel, highly selective gold nanoparticle patterning on surfaces using pure water. Journal of Colloid and Interface Science, 364 (2). pp. 304-310. ISSN 0021-9797

Sasse, A.G.B.M. and Lakerveld, D.G. and Silfhout, A. van (1988) Summary Abstract: Self‐deconvolution in CVV Auger electron spectroscopy. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 6 (3). p. 1045. ISSN 0734-2101

Sasse, A.G.B.M. and Hoef, M.A. van der and Wormeester, H. and Silfhout, A. van (1989) The influence of the (2 × 1) reconstruction of the Si(1 0 0) surface on the Si---L2,3 VV Auger lineshape. Solid State Communications, 71 (1). pp. 65-69. ISSN 0038-1098

Sasse, A.G.B.M. and Kleinherenbrink, P.M. and Silfhout, A. van (1988) Missing dimer defects investigated by adsorption of nitric oxide (NO) on silicon (100) 2 × 1. Surface Science, 199 (1-2). pp. 243-260. ISSN 0039-6028

Sasse, A.G.B.M. and Lakerveld, D.G. and Silfhout, A. van (1988) The adsorption of nitric oxide on a silicon (100) 2 × 1 surface studied with Auger electron spectroscopy. Surface Science, 195 (3). L167-L172. ISSN 0039-6028

Sasse, A.G.B.M. and Silfhout, A. van (1989) Adsorption of nitric oxide on the Si(100)2×1 surface: A theoretical and experimental approach. Physical review B: Condensed matter, 40 (3). pp. 1773-1782. ISSN 1095-3795

Sasse, A.G.B.M. and Wormeester, H. and Hoef, M.A. van der and Keim, E.G. and Silfhout, A. van (1989) Use of a partial local density of states calculation to characterize the Auger electron Si-L2,3 VV transitions of thin oxide layers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 7 (3). pp. 1623-1628. ISSN 0734-2101

Sasse, A.G.B.M. and Wormeester, H. and Hoef, M.A. van der and Silfhout, A. van (1989) Calculated and measured Auger lineshapes in clean Si(100)2×1, SiOx and Si-NO. Journal of Physics: Condensed matter, 1 (50). p. 10175. ISSN 0953-8984

Sasse, A.G.B.M. and Wormeester, H. and Hoef, M.A. van der and Silfhout, A. van (1989) Transition density of states (TDOS) of the Si(100)2 × 1 surface derived from the L2,3VV Auger lineshape compared with cluster calculations. Surface Science, 218 (2-3). pp. 553-568. ISSN 0039-6028

Sasse, A.G.B.M. and Wormeester, H. and Silfhout, A. van (1988) New approach for correction of distortions in spectral line profiles in Auger electron spectroscopy. Surface and Interface Analysis, 13 (4). pp. 228-232. ISSN 0142-2421

Stokkers, G.J. and Silfhout, A. van and Bootsma, G.A. and Fransen, T. and Gellings, P.J. (1983) Interaction of oxygen with an AISI 314 stainless steel surface studied by ellipsometry and auger electron spectroscopy in combination with ion bombardment. Corrosion Science, 23 (3). pp. 195-204. ISSN 0010-938X

Tang, Q. and Driessen, A. and Hoekstra, P. and Hilderink, L.H. and Silfhout, A. van and Popma, Th.J.A. (1990) Optical response of highly granular YBaCuO films prepared by non-vacuum aerosol deposition. Journal of the Less-Common Metals, 164-16 (Part 2). pp. 1587-1594. ISSN 0022-5088

Wentink, Derk Jan and Wormeester, Herbert and Boeij, Paul de and Wijers, Chris and Silfhout, Arend van (1992) Optical anisotropy of Ge(001)2x1. Surface Science, 274 (2). pp. 270-276. ISSN 0039-6028

Wierenga, P.E. and Sparnaay, M.J. and Silfhout, A. van (1980) Reflectometric study of surface states and oxygen adsorption on clean Si(100) and (110) surfaces. Surface Science, 99 (1). pp. 59-69. ISSN 0039-6028

Wolterbeek, L. and Akkerhuis, G.F. and Silfhout, A. van (1985) The optimization of differential reflectometry at surfaces of transparent crystals. Surface Science, 152-15 (Part 2). pp. 1071-1078. ISSN 0039-6028

Wormeester, H. and Borg, H.J. and Terpstra, D. and Keim, E.G. and Silfhout, A. van (1991) Adsorption of atomic and molecular oxygen on Si(100)2x1: coverage dependence of the Auger O KVV lineshape. Solid State Communications, 77 (3). pp. 239-242. ISSN 0038-1098

Wormeester, H. and Molenbroek, A.M. and Wijers, C.M.J. and Silfhout, A. van (1992) Change of the surface induced optical anisotropy of the clean Si(110) surface by oxidation. Surface Science, 260 (1-3). pp. 31-36. ISSN 0039-6028

Wormeester, H. and Sasse, A.G.B.M. and Silfhout, A. van (1988) Deconvolution, differentiation and Fourier transformation algorithms for noise-containing data based on splines and global approximation. Computer Physics Communications, 52 (1). pp. 19-27. ISSN 0010-4655

Wormeester, H. and Silfhout, A. van and Keim, E.G. and Sasse, A.G.B.M. (1990) Comment on 'Nitric oxide adsorption on the Si(100)(2x1) surface - a vibrational study by Y. Taguchi, M. Fujisawa, Y. Kuwahara, M. Onchi and M. Nishijima'. Surface Science Letters, 233 (233). L249-L250. ISSN 0167-2584

Wormeester, H. and Wentink, D.J. and Boeij, P.L. de and Silfhout, A. van (1993) Optical anisotropy of Ge(001). Thin Solid Films, 233 (1-2). pp. 14-18. ISSN 0040-6090

Wormeester, Herbert and Borg, Herman J. and Silfhout, Arend van (1991) The influence of inter-atomic transitions in Auger valence band spectroscopy: oxygen on Si(001)2x1. Surface Science, 258 (1-3). pp. 197-209. ISSN 0039-6028

Wormeester, Herbert and Keim, Enrico G. and Silfhout, Arend van (1992) Kinetics of the adsorption of atomic oxygen (N2O) on the Si(001)2x1 surface as revealed by the change in the surface conductance. Surface Science, 271 (3). pp. 340-348. ISSN 0039-6028

Zandvliet, H.J.W. and Terpstra, D. and Silfhout, A. van (1991) Reconstructions and phase transitions of the Ge(001) surface. Journal of Physics: Condensed matter, 3 (4). pp. 409-415. ISSN 0953-8984

Zandvliet, H.J.W. and Caspers, W.J. and Silfhout, A. van (1991) Order-disorder phase transition of the Ge(001) surface. Solid State Communications, 78 (5). pp. 455-458. ISSN 0038-1098

Zandvliet, H.J.W. and Keim, E.G. and Silfhout, A. van (1990) Adsorption of atomic oxygen (N2O) on a clean Ge(001) surface. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 8 (3). pp. 2581-2584. ISSN 0734-2101

Zandvliet, H.J.W. and Poppe, G.P.M. and Wijers, C.M.J. and Silfhout, A. van (1989) Reconstructions of the Ge(0 0 1) surface. Solid State Communications, 71 (1). pp. 63-64. ISSN 0038-1098

Zandvliet, H.J.W. and Poppe, G.P.M. and Wijers, C.M.J. and Silfhout, A. van (1989) Reconstructions of the Ge(0 0 1) surface. Solid State Communications, 71 (1). pp. 63-64. ISSN 0038-1098

Zandvliet, H.J.W. and Silfhout, A. van (1988) Surface states on clean Ge(111) surfaces. Surface Science, 195 (1-2). pp. 138-150. ISSN 0039-6028

Zandvliet, H.J.W. and Silfhout, A. van (1988) The optical and the electronic response of the Ge(111)-c(2 × 8) surface to O2 exposure. Solid State Communications, 65 (11). pp. 1425-1427. ISSN 0038-1098

Zandvliet, H.J.W. and Silfhout, A. van (1989) Surface states on clean Ge(001)2 × 1 surfaces. Surface Science, 211-21 . pp. 544-551. ISSN 0039-6028

Zandvliet, H.J.W. and Silfhout, A. van and Sparnaay, M.J. (1989) Metallic properties of the Ge(001) surface. Physical review B: Condensed matter, 39 (8). pp. 5576-5578. ISSN 1095-3795

Zandvliet, H.J.W. and Wormeester, H. and Wentink, D.J. and Silfhout, A. van and Elswijk, H.B. (1993) Why monatomic steps on Si(001) are always rough. Physical Review Letters, 70 (14). pp. 2122-2125. ISSN 0031-9007

Conference or Workshop Item

Kersten, B.A.G. and Sjerps-Koomen, L. and Zandvliet, H.J.W. and Blank, D.H.A. and Silfhout, A. van (1995) Step-step interactions on the vicinal Ge(001) surface. In: Symposium on Evolution of Thin Film Structure and Morphology, November 28 - December 2, 1994, Boston, Massachusetts, USA (pp. pp. 203-208).

This list was generated on Fri Apr 18 05:32:55 2014 CEST.