Author Publications

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Number of items: 62.

2009

Mouthaan, A.J. and Vegt, J.J.W. van der (2009) Self-Evaluation Applied Mathematics 2003-2008 University of Twente. [Report]

2007

Mouthaan, A.J. and Hartel, P.H. (2007) Interim research assessment 2003-2005 - Computer Science. [Report]

2006

Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2006) Current Degradation of a-Si:H/SiN TFTs at Room Temperature and Low Voltages. IEEE Transactions on Electron Devices, 53 (9). pp. 2273-2279. ISSN 0018-9383

Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2006) Determination of the contribution of defect creation and charge trapping to the degradation of a-Si:H/SiN TFTs at room temperature and low voltages. Journal of Non-Crystalline Solids, 352 (36-37). pp. 3849-3853. ISSN 0022-3093

2005

Sowariraj, M.S.B. and Jong, P.C. de and Salm, C. and Mouthaan, A.J. and Kuper, F.G. (2005) A 3-D circuit model to evaluate CDM performance of ICs. Microelectronics Reliability, 45 (9-11). pp. 1425-1429. ISSN 0026-2714

Sowariraj, M.S.B. and Jong, Peter C. de and Salm, Cora and Smedes, Theo and Mouthaan, A.J. Ton and Kuper, Fred G. (2005) Significance of Including Substrate Capacitance in the Full Chip Circuit Model of ICs under CDM Stress. In: 43th Annual International Reliability Physics Symposium, April 17-21, 2005, San Jose, CA, USA (pp. pp. 608-609).

2004

Mouthaan, Ton (2004) A case study of a microsystems MSc curriculum. In: Second IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2004, 28-30 Jan. 2004, Perth, Australia (pp. pp. 146-148).

Nguyen, H.V. and Salm, C. and Krabbenborg, B. and Weide-Zaage, K. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2004) Effect of Thermal Gradients on the Electromigration Lifetime in Power Electronics. In: IEEE 42nd Annual International Reliability Physics Symposium, 25-29 April 2004, Phoenix, Arizona, USA (pp. pp. 619-620).

Nguyen, H.V. and Salm, C. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. Ton and Kuper, Fred G. (2004) Fast Thermal Cycling-Enhanced Electromigration in Power Metallization. IEEE Transactions on Device and Materials Reliability, 4 (2). pp. 246-255. ISSN 1530-4388

Sowariraj, M.S.B. and Salm, Cora and Smedes, Theo and Mouthaan, A.J. Ton and Kuper, Fred G. (2004) Full chip model of CMOS Integrated Circuits under Charged Device Model stress. In: SAFE 2004, 7th Annual Workshop on Semiconductor Advances for Future Electronics, 25-26 Nov 2004, Veldhoven, the Netherlands (pp. pp. 801-807).

2003

Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2003) Progressive degradation in a-Si: H/SiN thin film transistors. Thin Solid Films, 427 (1-2). 60-66. ISSN 0040-6090

Mouthaan, Ton J. and Olthuis, Wouter and Vos, Henk (2003) Competence-based EE-learning: (how) can we implement it? In: IEEE International Conference on Microelectronic Systems Education, 2003, June 1-2 ,2003, Anaheim, California, USA (pp. pp. 33-34).

Nguyen, H.V. and Salm, C. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2003) A reliability model for interlayer dielectrics cracking during very fast thermal cycling. In: Advanced Metallization Conference 2003, September 29 - October 1, 2003 (Tokyo) and 21-23 October 2003 (Montreal), Tokyo, Japan and Montreal, Canada (pp. pp. 295-299).

Nguyen, H.V. and Salm, C. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2003) Electrothermomigration-induced failure in power IC metallization. In: 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2003, 25-26 November 2003, Veldhoven, The Netherlands (pp. pp. 622-630).

Sowariraj, M.S.B. and Smedes, Theo and Salm, Cora and Mouthaan, Ton and Kuper, Fred G. (2003) Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels - An explantion and die protection strategy. Microelectronics Reliability, 43 (9-11). pp. 1569-1575. ISSN 0026-2714

Sowariraj, M.S.B. and Smedes, Theo and Salm, Cora and Mouthaan, Ton and Kuper, Fred G. (2003) Study on the influence of package parasitics and substrate resistance on the Charged Device Model(CDM) failure levels - possible protection methodology. In: 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2003, 25-26 November 2003, Veldhoven, The Netherlands (pp. pp. 657-662).

2002

Golo, N. and Jenneboer, T. and Mouthaan, T. (2002) Dealing with electrostatic discharge in a capacitive fingerprint sensor fabricated in amorphous silicon thin film technology. In: SESENS 2002, November 29-30, 2002, Veldhoven, The Netherlands (pp. pp. 616-621).

Mouthaan, Ton J. and Brink, R.W. and Vos, H. (2002) Competencies of BSc and MSc programmes in electrical engineering and student portfolios. In: First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002, 29-31 Jan 2002 , Christchurch, New Zealand (pp. pp. 203-208).

Nguyen, H. and Salm, C. and Vroemen, J. and Voets, J. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2002) Fast temperature cycling stress-induced and electromigration-induced interlayer dielectric cracking failure in multilevel interconnection. In: Proceedings of the 5th annual workshop on Semiconductors Advances for Future Electronics SAFE 2002, 27-28 November 2002, Veldhoven, The Netherlands (pp. pp. 69-74).

Nguyen, H. and Salm, C. and Vroemen, J. and Voets, J. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2002) Fast temperature cycling and electromigration induced thin film cracking multilevel interconnection: experiments and modeling. Microelectronics Reliability, 42 (9-11). pp. 1415-1420. ISSN 0026-2714

Nguyen, H. and Salm, C. and Vroemen, J. and Voets, J. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2002) Test chip for detecting thin film cracking induced by fast temperature cycling and electromigration in multilevel interconnect systems. In: 9th International Symposium on Physics and Failure Analysis 2002, 8-12 Jul 2002, Singapore, Thailand (pp. pp. 135-139).

Nguyen, H. and Salm, C. and Wenzel, R. and Mouthaan, A.J. and Kuper, F.G. (2002) Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. Microelectronics Reliability, 42 (9-11). pp. 1421-1425. ISSN 0026-2714

Nguyen, H.V. and Salm, C. and Vroemen, J. and Voets, J. and Krabbenborg, B. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2002) Test chip for Detecting Thin Film Cracking Induced by Fast Temperature Cycling and Electromigration in Multilevel Interconnect Systems. In: 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 8-12 July 2002 , Singapore, Thailand (pp. pp. 135-139).

Sowariraj, M.S.B. and Kuper, F.G. and Salm, C. and Mouthaan, A.J. and Smedes, T. (2002) Impact of layout and technology variation on the CDM performance of ggNMOSTs and SCRs. In: Proceedings of the 5th annual workshop on Semiconductors Advances for Future Electronics SAFE 2002, 27-28 November 2002, Veldhoven, The Netherlands (pp. pp. 104-107).

Sowariraj, M.S.B. and Salm, C. and Mouthaan, A.J. and Smedes, T. and Kuper, F.G. (2002) The influence of technology variation on ggNMOSTs and SCRs against CDM ESD stress. Microelectronics Reliability, 42 (9-11). pp. 1287-1292. ISSN 0026-2714

Tosic Golo, N. and Kuper, F.G. and Mouthaan, A.J. (2002) Zapping thin film transistors. Microelectronics Reliability, 42 (4). pp. 747-765. ISSN 0026-2714

Tosic Golo, Natasa and Kuper, Fred G. and Mouthaan, Ton J. (2002) Analysis of the Electrical Breakdown in Hydrogenated Amorphous Silicon Thin-Film Transistors. IEEE Transactions on Electron Devices, 49 (6). pp. 1012-1018. ISSN 0018-9383

Tosic Golo, Natasa and Wal, Siebrigje van der and Kuper, F.G. and Mouthaan, A.J. (2002) Estimation of the impact of electrostatic discharge on density of states in hydrogenated amorphous silicon thin-film transistors. Applied Physics Letters, 80 (18). pp. 3337-3339. ISSN 0003-6951

Vos, Henk and Mouthaan, Ton and Gommer, Lisa (2002) Development of engineering competencies: A feedback method for use in a reflective digital portfolio. In: The renaissance engineer of tomorrow : proceedings of the 30th SEFI Annual Conference Firenze 8-11 September 2002. SEFI, Firenze. ISBN 9788883044793

Vos, Henk and Mouthaan, Ton and Olthuis, Wouter and Gommer, Lisa (2002) Competentieontwikkeling met een reflectieve portfolio: Een feedback- en beoordelingsmethode. Onderzoek van onderwijs, 31 (4). pp. 57-60. ISSN 0920-0665

2001

Boselli, Gianluca and Meeuwsen, Stan and Mouthaan, Ton and Kuper, Fred (2001) Investigations on double-diffused MOS transistors under ESD zap conditions. Microelectronics Reliability, 41 (3). pp. 395-405. ISSN 0026-2714

Merticaru, A.R. and Mouthaan, A.J. (2001) Dynamics of metastable defects in a-Si:H/SiN TFTs. Thin Solid Films, 383 (1-2). pp. 122-124. ISSN 0040-6090

Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2001) Study of dynamics of charge trapping in a-Si:H/SiN TFTs. In: Proceedings of the 4th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2001, 29-30 Nov 2001, Veldhoven, The Netherlands (pp. pp. 109-114).

Nguyen, H.V. and Salm, C. and Vroemen, J. and Voets, J. and Krabbenborg, B. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2001) Fast thermal cycling stress and degredation in multilayer interconnects. In: 4th Annual Workshop on Semiconductors Advances for Future Electronics, SAFE, 28-30 Nov 2001, Veldhoven, The Netherlands (pp. pp. 136-140).

Nguyen, Hieu V. and Salm, Cora and Mouthaan, Ton J. and Kuper, Fred G. (2001) Modeling of the Reservoir Effect on Electromigration Lifetime. In: 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA, July 9-13, 2001, Singapore (pp. pp. 169-173).

Tosic Golo, N. and Wal, S. van der and Kuper, F.G. and Mouthaan, A.J. (2001) The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin film transistors. Microelectronics Reliability, 41 (9-10). pp. 1391-1396. ISSN 0026-2714

2000

Boselli, G. and Mouthaan, A.J. and Kuper, F.G. (2000) Rise-time effects in ggnMOSt under TLP stress. In: 22nd International Conference on Microelectronics, 2000, 14-17 May, 2000, Nis, Serbia (pp. pp. 355-357).

Boselli, Gianluca and Mouthaan, Ton and Kuper, Fred (2000) Rise-time effects in ggnMOSt under TLP stress. Microelectronics Reliability, 40 (12). pp. 2061-2067. ISSN 0026-2714

Mouthaan, A.J. and Salm, C. and Lunenborg, M.M. and Wolf, M.A.R.C. de and Kuper, F.G. (2000) Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations. Microelectronics Reliability, 40 (1). pp. 909-917. ISSN 0026-2714

Tosic, N. and Kuper, F.G. and Mouthaan, A.J. (2000) Degradation of -Si:H TFTs caused by electrostatic discharge. In: 22nd International Conference on Microelectronics, 2000, 14-17 May 2000 , Nis, Yugoslavia (pp. pp. 359-362).

Tosic, N. and Kuper, F.G. and Mouthaan, A.J. (2000) Transmission Line Model Testing of Top-Gate Amorphous Silicon Thin Film Transistors. In: 38th Annual IEEE International Reliability Physics Symposium, 10-13 April 2000, San Jose, CA (pp. pp. 289-294).

1999

Boselli, Gianluca and Meeuwsen, Stan and Mouthaan, Ton and Kuper, Fred (1999) Investigations on Double-Diffused MOS (DMOS) transistors under ESD zap conditions. In: Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD, 1999, 28-30 Sept. 1999, Florida, USA (pp. pp. 11-18).

1998

Mouthaan, Ton J. and Petrescu, Violeta (1998) The modeling of resistance changes in the early phase of electromigration. Microelectronics Reliability, 38 (1). pp. 99-105. ISSN 0026-2714

Petrescu, V. and Mouthaan, A.J. and Schoenmaker, W. and Salm, C. (1998) Mechanical stress evolution and the blech length: 2D simulation of early electromigration effects. Microelectronics Reliability, 38 (6-8). pp. 1047-1050. ISSN 0026-2714

1997

Petrescu, V. and Mouthaan, A.J. (1997) 2D Modelling of Mechanical Stress Evolution and Electromigration in Confined Aluminium Interconnects. In: 21st International Conference on Microelectronics, MIEL 1997, NIS, Yugoslavia, 14-17 September 1997, Nis, Serbia (pp. pp. 629-632).

Petrescu, V. and Mouthaan, A.J. and Dima, G. and Govoreanu, B. and Mitrea, O. and Profirescu, M. (1997) Early resistance change and stress/electromigration evolution in near bamboo interconnects. In: International Semiconductor Conference, CAS, 7-11 Oct. 1997, Sinaia Romania (pp. pp. 311-314).

Petrescu, V. and Mouthaan, A.J. and Schoenmaker, W. (1997) Early resistance change and stress/electromigrationmodeling in aluminium interconnects. Microelectronics Reliability, 37 (10-11). pp. 1491-1494. ISSN 0026-2714

1996

Krabbenborg, B.H. and Bosma, A. and Graaff, H.C. de and Mouthaan, A.J. (1996) Layout to circuit extraction for three-dimensional thermal-electrical circuit simulation of device structures. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 15 (7). pp. 765-774. ISSN 0278-0070

Lunenborg, M.M. and Graaff, H.C. de and Mouthaan, A.J. and Verweij, J.F. (1996) Comprehensive physical modeling of NMOSFET hot-carrier-induced degradation. Microelectronics Reliability, 36 (11/12). pp. 1667-1670. ISSN 0026-2714

Meneghesso, G. and Luchies, J.R.M. and Kuper, F.G. and Mouthaan, A.J. (1996) Turn-on speed of grounded gate NMOS ESD protection transistors. Microelectronics Reliability, 36 (11/12). pp. 1735-1738. ISSN 0026-2714

Meneghesso, G. and Luchies, J.R.M. and Kuper, F.G. and Mouthaan, A.J. (1996) Turn-on speed of grounded gate NMOS ESD protection transistors. In: 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 8-11 October 1996, Enschede, The Netherlands (pp. pp. 1735-1738).

1995

Niehof, J. and Graaff, H.C. de and Mouthaan, A.J. and Verweij, J.F. (1995) An empirical model for early resistance changes due to electromigration. Solid-State Electronics, 38 (10). pp. 1817-1827. ISSN 0038-1101

1994

Wolbert, Philip B.M. and Wachutka, Gerhard K.M. and Krabbenborg, Benno H. and Mouthaan, Ton J. (1994) Nonisothermal device simulation using the 2-D numerical process/device simulator TRENDY and application to SOI-devices. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 13 (3). pp. 293-302. ISSN 0278-0070

1992

Krabbenborg, Benno and Beltman, R.A.M. and Wolbert, P.B.M. and Mouthaan, A.J. (1992) Physics of electro-thermal effects in ESD protection devices. Journal of Electrostatics, 28 (3). pp. 285-299. ISSN 0304-3886

Mullem, C.J. van and Tilmans, H.A.C. and Mouthaan, A.J. and Fluitman, J.H.J. (1992) Electrical cross-talk in two-port resonators the resonant silicon beam force sensor. Sensors and Actuators A: Physical, 31 (1-3). pp. 168-173. ISSN 0924-4247

1991

Eijk, Pieter D. van and Reglat, Muriel and Vassilief, Georges and Krijnen, Gijs J.M. and Driessen, Alfred and Mouthaan, Anton J. (1991) Analysis of the modal behavior of an antiguide diode laser array with Talbot filter. Journal of Lightwave Technology, 9 (5). pp. 629-634. ISSN 0733-8724

Ning, Zhen-Qiu and Mouthaan, Ton and Wallinga, Hans (1991) SEAS: A simulated evolution approach for analog circuit synthesis. In: IEEE Custom Integrated Circuits Conference, CICC, 12-15 May, 1991, San Diego, California, USA (pp. 5.2.1-5.2.4).

Wijburg, Rutger C. and Hemink, Gertjan J. and Middelhoek, Jan and Wallinga, Hans and Mouthaan, Ton J. (1991) VIPMOS-A novel buried injector structure for EPROM applications. IEEE Transactions on Electron Devices, 38 (1). pp. 111-120. ISSN 0018-9383

1987

Mouthaan, A.J. (1987) Buried injector logic, a vertical IIL using deep ion implantation. Solid-State Electronics, 30 (12). pp. 1243-1249. ISSN 0038-1101

1986

Mouthaan, Ton and Vertregt, Maarten (1986) A vertically integrated dynamic RAM-cell: Buried bit line memory cell with floating transfer layer. Solid-State Electronics, 29 (12). pp. 1289-1294. ISSN 0038-1101

1984

Mouthaan, A.J. (1984) Integrated cascade of photovoltaic cells as a power supply for integrated circuits. Sensors and Actuators, 5 (4). pp. 285-292. ISSN 0250-6874

1979

Smits, J.G. and Mouthaan, A.J. (1979) Vector representation of resonators in eigencoupling state space and eigenloss state space of piezoelectric ceramics. Applied scientific research, 35 (1). pp. 85-109. ISSN 0003-6994

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