Author Publications

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Number of items: 109.

Article

Hemink, Gertjan J. and Meijer, Berend W. and Kerkhoff, Hans G. (1990) Testability analysis of analog systems. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 9 (6). pp. 573-583. ISSN 0278-0070

Joseph, Arun A. and Heuvelmans, Sander and Gerritsma, Gerrit J. and Kerkhoff, Hans G. (2003) The Detection of Defects in a Niobium Tri-layer Process. IEEE Transactions on Applied Superconductivity, 13 (2). pp. 95-98. ISSN 1051-8223

Joseph, Arun A. and Heuvelmans, Sander and Gerritsma, Gerrit J. and Kerkhoff, Hans G. (2004) Test structures and their application in structural testing of digital RSFQ circuits. Physica C: Superconductivity, 403 (1-2). pp. 103-111. ISSN 0921-4534

Joseph, Arun A. and Sesé, Javier and Flokstra, Jaap and Kerkhoff, Hans G. (2005) Structural Testing of the HYPRES Niobium Process. IEEE Transactions on Applied Superconductivity, 15 (2, par). pp. 106-109. ISSN 1051-8223

Kerkhoff, H.G. and Zhang, Xiao and Mailly, F. and Nouet, P. and Liu, H. and Richardson, A. (2008) A dependable microelectronic peptide synthesizer using electrode data. VLSI Design, 2008 . pp. 1-9. ISSN 1065-514X

Kerkhoff, Hans G. (2007) Testing microelectronic biofluidic systems. IEEE Design & Test of Computers, 24 (1). pp. 72-82. ISSN 0740-7475

Kerkhoff, H.G. and Zhang, Xiao (2009) Fault co-simulation for test evaluation of heterogeneous integrated biological systems. Microelectronics Journal, 40 (7). pp. 1048-1053. ISSN 0026-2692

Kerkhoff, Hans G. (2001) Testing of a Microanalysis System. IEEE Transactions on Instrumentation and Measurement, 50 (6). pp. 1050-1055. ISSN 0018-9456

Kerkhoff, Hans G. (2005) The test search for true mixed-signal cores. Microelectronics Journal, 36 (12). pp. 1103-1111. ISSN 0026-2692

Kerkhoff, Hans G. and Kaminska, Bozena (2003) Analog and mixed signal test techniques for SoCs. Microelectronics Journal, 34 (10). pp. 887-888. ISSN 0026-2692

Krishnan, Shaji and Kerkhoff, Hans G. (2012) Exploiting multiple mahalanobis distance metric to screen outliers from analogue product manufacturing test responses. IEEE design and test of computers . ISSN 0740-7475

Nedelcu, Oana Tatiana and Barber, Robert W. and Kerkhoff, Hans G. and Emerson, David R. and Muller, Raluca and Wouden, Egbert van der (2005) Modeling of Micro-Electronic Fluidic Systems. Romanian Journal of Information Science and Technology (ROMJIST) , 8 (4). pp. 363-369. ISSN 1453-8245

Riessen, R.P. van and Kerkhoff, H.G. and Kloppenburg, A. (1990) Designing and implementing an architecture with boundary scan. IEEE Design & Test of Computers, 7 (1). pp. 9-19. ISSN 0740-7475

Rohani, Alireza and Kerkhoff, Hans G. (2012) Rapid transient fault insertion in large digital systems. Microprocessors and microsystems, 37 (2). pp. 147-154. ISSN 0141-9331

San Segundo Bello, David and Tangelder, Ronald and Kerkhoff, Hans (2001) Modeling a verification test system for mixed-signals circuits. IEEE Design & Test of Computers, 18 (1). pp. 63-71. ISSN 0740-7475

Sheng, Xiaoqin and Kerkhoff, Hans and Zjajo, Amir and Gronthoud, Guido (2012) ADC multi-site test based on a pre-test with digital input stimulus. Journal of electronic testing, 28 (4). pp. 393-404. ISSN 0923-8174

Stancic, M. and Kerkhoff, H.G. (2003) Testability-analysis driven test-generation of analogue cores. Microelectronics Journal, 34 (10). pp. 913-917. ISSN 0026-2692

Zivkovic, V.A. and Tangelder, R.J.W.T. and Kerkhoff, H.G. (2000) Computer-aided test flow in core-based design. Microelectronics Journal, 31 (11-12). pp. 999-1008. ISSN 0026-2692

Book Section

Ahonen, Tapani and Braak, Timon D. ter and Burgess, Stephen T. and Geißler, Richard and Heysters, Paul M. and Hurskainen, Heikki and Kerkhoff, Hans G. and Kokkeler, André B.J. and Nurmi, Jari and Raasakka, Jussi and Rauwerda, Gerard K. and Smit, Gerard J.M. and Sunesen, Kim and Zonneveld, Henk van and Vermeulen, Bart and Zhang, Xiao (2011) CRISP: Cutting Edge Reconfigurable ICs for Stream Processing. In: Reconfigurable Computing: From FPGAs to Hardware/Software Codesign. Springer Verlag, London, pp. 211-238. ISBN 9781461400608

Kerkhoff, Hans G. (2006) Testable Design and Testing of Microsystems. In: Design of Systems on a Chip: Design and Test. Springer, Berlin, pp. 211-222. ISBN 9780387324999

Conference or Workshop Item

Braak, T.D. ter and Burgess, S.T. and Hurskainen, H. and Kerkhoff, H.G. and Vermeulen, B. and Zhang, Xiao (2010) On-Line Dependability Enhancement of Multiprocessor SoCs by Resource Management. In: International Symposium on System-on-Chip, SoC 2010, 29-30 Sep 2010, Tampere, Finland (pp. pp. 103-110).

Brakel, G. van and Gläser, U. and Kerkhoff, H.G. and Vierhaus, H.T. (1995) Gate Delay Fault Test Generation for Non-Scan Circuits. In: IEEE European Design and Test Conference, ED&TC 1995, 6-9 March 1995, Paris, France (pp. pp. 308-312).

Brakel, Gerrit van and Xing, Yizi and Kerkhoff, Hans G. (1992) Scan cell design for enhanced delay fault testability. In: Fifth Annual IEEE International ASIC Conference and Exhibit, September 21-25, 1992, Rochester, NY (pp. pp. 372-375).

Frieswijk, Theo A. and Rutten, Wim L.C. and Kerkhoff, Hans G. and Lippe, Karel (1995) Control electronics for a neuro-electronic interface implemented in a gate array. In: IEEE 17th Annual Conference Engineering in Medicine and Biology Society, 20-23 Sept. 1995, Montreal, Canada (pp. pp. 1103-1104).

Hemink, G.J. and Meijer, B.W. and Kerkhoff, H.G. (1988) TASTE: a tool for analog system testability evaluation. In: International Test Conference, 1988, 12-14 Sept. 1988, Washington, DC (pp. pp. 829-838).

Joseph, Arun A. and Kerkhoff, Hans G. (2003) Towards Structural Testing of Superconductor Electronics. In: International Test Conference, ITC 2003, Sept. 30 - Oct. 2, 2003, Baltimore, USA (pp. pp. 1182-1191).

Joseph, Arun A. and Kerkhoff, Hans G. (2005) Testing Superconductor Logic Integrated Circuits. In: 10th IEEE European Test Symposium (ETS'05), 22-25 May 2005, Talinn, Estonia (pp. pp. 239-244).

Joseph, Arun A. and Kerkhoff, Hans G. and Flokstra, Jaap (2005) Structural Testing of RSFQ Circuits. In: 10th International Superconductive Electronics Conference, ISEC 2005, 5-9 September 2005, Noordwijkerhout, The Netherlands (pp. PB.13).

Joseph, Arun A. and Weusthof, Marcel H.H. and Kerkhoff, Hans G. (2004) Defect-Oriented Testing of an RSFQ D-type Flip-Flop. In: ProRISC 2004, 15th Annual Workshop on Circuits, Systems and Signal Processing, 25-26 Nov 2004, Veldhoven, the Netherlands (pp. pp. 415-420).

Kaal, Victor and Kerkhoff, Hans (1997) Compact Structural Test Generation for Analog Macros. In: European Design and Test Conference, ED&TC 1997, 17-20 March 1997, Paris, France (pp. pp. 581-589).

Kerkhoff, Hans G. and Zhang, Xiao (2010) Design of an Infrastructural IP Dependability Manager for a Dependable Reconfigurable Many-Core Processor. In: Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, 13-15 January 2010, Ho Chi Minh City, Vietnam (pp. pp. 270-275).

Kerkhoff, H. and Barber, R. and Emerson, D. and Wouden, E.J. van der (2005) Design and Test of Micro-Electronic Fluidic Systems. In: Proceedings Workshop on MEMS, DATE05 Workshops, 1 March 2005, Munich, Germany (pp. pp. 47-52).

Kerkhoff, H.G. and Barber, R.W. and Zhang, Xiao and Emerson, D.R. (2006) Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems. In: Third IEEE International Workshop on Electronic Design, Test & Applications, DELTA 2006, 17-19 January 2006, Kuala Lumpur, Malaysia (pp. pp. 177-182).

Kerkhoff, H.G. and Docherty, G. (1993) MISSED: an environment for mixed-signal microsystem testing and diagnosis. In: Second Asian Test Symposium, ATS 1993, November 16-18, 1993, Beijing, China (pp. pp. 88-93).

Kerkhoff, H.G. and Huijts, J.J.M. (2008) Testing of a highly reconfigurable processor core for dependable data streaming applications. In: Proceedings Fouth IEEE International Symposium on Electronic Design, Test and Applications DELTA 2008, 23-25 January 2008, Hong Kong, SAR, China (pp. pp. 38-44).

Kerkhoff, H.G. and Kuiken, O.J. and Zhang, Xiao (2008) Increasing SoC Dependability via Known Good Tile NoC Testing. In: FastAbs Track of The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN2008), 24-27 June 2009, Anchorage, Alaska.

Kerkhoff, H.G. and Zhang, X. and Liu, H. and Richardson, A. and Nouet, P. and Azais, F. (2005) Determining DfT Hardware by VHDL-AMS Fault Simulation for Biological Micro-Electronic Fluidic Arrays. In: ProRISC 2005, 16th Workshop on Circuits, Systems and Signal Processing, 17-18 November 2005, Veldhoven, The Netherlands (pp. pp. 378-382).

Kerkhoff, H.G. and Zhang, X. and Liu, H. and Richardson, A. and Nouet, P. and Azais, F. (2005) VHDL-AMS fault simulation for testing DNA bio-sensing arrays. In: IEEE Sensors, 2005, 30 Oct .- 3 Nov. 2005 , Irvine, CA, USA (pp. pp. 1030-1033).

Kerkhoff, H.G. and Zhao, Yong (2012) The design of dependable flexible multi-sensory System-on-Chips for security applications. In: 15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2012, 18-20 April 2012, Tallinn, Estonia (pp. pp. 133-138).

Kerkhoff, Hans and Tangelder, Ronald and Speek, Han and Engin, Nur (1996) MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation. In: Third IEEE International Electronics, Circuits, and Systems, ICECS '96, 13-16 Oct. 1996, Rodos, Greece (pp. pp. 75-80).

Kerkhoff, Hans G. (2004) Test-Signal Search for Mixed-Signal Cores in a System-on-Chip. In: ProRISC 2004, 15th Annual Workshop on Circuits, Systems and Signal Processing, 25-26 Nov 2004, Veldhoven, the Netherlands (pp. pp. 536-541).

Kerkhoff, Hans G. (2009) Dependable reconfigurable multi-sensor poles for security. In: IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop, IMS3TW 2009, June 10-12, 2009, Scottsdale, AZ, USA (pp. pp. 1-6).

Kerkhoff, Hans G. (2005) Testing of MEMS-based microsystems. In: 10th IEEE European Test Symposium, ETS 2005, 22-25 May 2005, Talinn, Estonia (pp. pp. 223-228).

Kerkhoff, Hans G. (2005) Testable Design and testing of Microsystems. In: 4th IEEE Conference on Sensors, IEEE Sensors 2005, 31 Oct- 3 Nov 2005, Irvine, California, USA.

Kerkhoff, Hans G. (2011) New View Requirements for Analogue/MS IPs for Dependability Optimization in Heterogeneous SoC Design. In: 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA (pp. pp. 5-11).

Kerkhoff, Hans G. and Joseph, Arun A. (2004) Testability issues in superconductor electronics. In: Second IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2004, 28-30 Jan. 2004, Perth, Australia (pp. pp. 9-14).

Kerkhoff, Hans G. and Joseph, Arun A. and Heuvelmans, Sander (2004) Testable design and testing of high-speed superconductor microelectronics. In: First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002, 29-31 Jan 2002 , Christchurch, New Zealand (pp. pp. 8-12).

Kerkhoff, Hans G. and Wan, Jinbo (2010) Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration. In: IEEE 16th InternationalMixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010, 7-9 June 2010, La Grande Motte, France (pp. pp. 1-6).

Kerkhoff, Hans G. and Wan, Jinbo and Zhao, Yong (2012) Hierarchical modeling of automotive sensor front-ends for structural diagnosis of aging faults. In: 18th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2012, 14-16 May 2012, Taipei, Taiwan, China (pp. pp. 91-96).

Kerzérho, V. and Kerkhoff, H.G. and Bollen, G.-J. and Xing, Y. (2011) The Search for Resilience Weak Spots in Automotive Mixed-Signal Circuits. In: 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA (pp. pp. 12-18).

Khan, Muhammad A. and Kerkhoff, Hans G. (2011) A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. In: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, 13-15 April 2011, Cottbus, Germany (pp. pp. 17-22).

Khan, Muhammad A. and Kerkhoff, Hans G. (2011) SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. In: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 3-5 October 2011, Vancouver, B.C. Canada (pp. pp. 374-381).

Khan, Muhammad Aamir and Kerkhoff, Hans G. (2013) Analysing degradation effects in charge-redistribution SAR ADCs. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, 2-4 October 2013, New York, NY, USA (pp. pp. 65-70).

Khan, Muhammad Aamir and Kerkhoff, Hans G. (2013) The essence of reliability estimation during operational life for achieving high system dependability. In: 16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 September 2013, Santander, Spain (pp. pp. 575-581).

Khan, Muhammad Aamir and Kerkhoff, Hans G. (2013) An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. In: 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, 8-10 April 2013, Karlovy Vary, Czech Republic (pp. pp. 159-164).

Khan, Muhammad Aamir and Kerkhoff, Hans G. (2013) Monitoring operating temperature and supply voltage in achieving high system dependability. In: 8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March 2013, Abu Dhabi, UAE (pp. pp. 108-112).

Koopman, R.J.H. and Kerkhoff, H.G. (1992) A general-purpose high-density sea-of-gates architecture. In: 35th Midwest Symposium on Circuits and Systems, 1992, 9-12 Aug. 1992, Washington, DC (pp. pp. 1388-1391).

Kraats, A. van de and Kerkhoff, H.G. (2005) Testability Analysis for true Mixed-Signal Integrated Circuits. In: Proceedings of IEEE 11th International Mixed Signal Test Workshop, 27-29 June 2005, Cannes, France (pp. pp. 1-6).

Kraats, Araldo van de and Kerkhoff, Hans G. (2005) Mixed-Signal Testability Analysis for Data-Converter IPs. In: ProRISC 2005, 16th Workshop on Circuits, Systems and Signal Processing, 17-18 November 2005, Veldhoven, The Netherlands (pp. pp. 524-529).

Krishnan, Shaji and Doornbosch, Klaas D. and Brand, Rudi and Kerkhoff, Hans G. (2010) BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, 8-12 March 2010, Dresden, Germany (pp. pp. 1767-1772).

Krishnan, Shaji and Kerkhoff, Hans G. (2010) Multivariate Model for Test Response Analysis. In: 15th IEEE European Test Symposium, ETS 2010, 24-28 May 2010, Praha, Czech Republic (pp. pp. 250-251).

Krishnan, Shaji and Kerkhoff, Hans G. (2011) A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. In: 16th IEEE European Test Symposium, ETS 2011 , 23-27 May 2011, Trondheim, Norway (pp. pp. 159-164).

Kuiken, Oscar J. and Zhang, Xiao and Kerkhoff, Hans G. (2008) Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications. In: 23rd IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, DFT 2008, 1-3 October 2008, Cambridge, MA, USA (pp. pp. 45-53).

Lippe, K. and Hasper, A. and Elfrink, G.W. and Niehof, J. and Kerkhoff, H.G. (1992) A test chip for automatic reliability measurements of interconnect vias. In: 30th Annual International Reliability Physics Symposium, 31 March-2 April 1992 , San Diego, CA (pp. pp. 247-250).

Lippe, K. and Kerkhoff, H. and Kloppers, G. and Morskieft, N. (1989) A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements. In: International Conference on Microelectronic Test Structures, ICMTS 1989, 13-14 March 1989 , Edinburgh, UK (pp. pp. 225-226).

Liu, H.Y. and Dumas, N. and Richardson, A. and Heal, R. and Kerkhoff, H.G. (2006) Built-in test of electrode degradation of multi-electrode array biosensors. In: 12th IEEE International Mixed-Signals Testing Workshop, IMSTW 2006, 21-23 June 2006, Edinburgh, United Kingdom (pp. pp. 136-141).

Liu, Hongyuan and Kerkhoff, Hans G. and Richardson, Andrew and Zhang, Xiao and Nouet, Pascal and Azais, Florence (2005) Design and Test of an Oscillation based System Architecture for DNA Sensor Arrays. In: Proceedings of 11th International Mixed Signal Test Workshop, 27-29 June 2005, Cannes, France (pp. pp. 1-6).

Nedelcu, Oana Tatiana and Barber, Robert W. and Kerkhoff, Hans G. and Emerson, David R. and Muller, Raluca and Wouden, Egbert van der (2005) Simulation of Micro-Electronic FlowFET Systems. In: Euromech Colloquium 472, Microfluidics and Transfer, 6-8 September 2005, Grenoble, France (pp. pp. 1-4).

Peset Llopis, R. and Koopman, R.J.H. and Kerkhoff, H.G. and Braat, J.A. (1991) A performance analysis tool for performance-driven micro-cell generation. In: European Conference on Design Automation, EDAC, 25-28 Feb. 1991, Amsterdam, The Netherlands (pp. pp. 576-580).

Petre, Octvian and Kerkhoff, Hans G. (2004) Small-Delay Fault BIST in High-Speed Chip Interfaces. In: ProRISC 2004, 15th Annual Workshop on Circuits, Systems and Signal Processing, 25-26 Nov 2004, Veldhoven, the Netherlands (pp. pp. 429-434).

Petre, Octvian and Kerkhoff, Hans G. (2003) Scan Test Strategy for Asynchronous-Synchronous Interfaces. In: Eighth IEEE European Test Workshop, 25-28 May 2003, Maastricht, The Netherlands (pp. pp. 43-48).

Riessen, R.P. van and Kerkhoff, H.G. and Janssen, J.M.J. (1991) A design for testability expert system for silicon compilers. In: VLSI Test Symposium, 15-17 April 1991, Atlantic City, NJ (pp. pp. 10-15).

Riessen, R.P. van and Kerkhoff, H.G. and Kloppenburg, A. (1989) Design and implementation of a hierarchical testable architecture using the boundary scan standard. In: 1st European Test Conference, 1989, 12-14 April 1989, Paris, France (pp. pp. 112-118).

Rohani, A. and Kerkhoff, H.G. (2012) An online soft error mitigation technique for control logic of VLIW processors. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 3-5 October 2012, Austin, TX, USA.

Rohani, Alireza and Kerkhoff, Hans G. (2011) Study of the effects of SET induced faults on submicron technologies. In: 41st IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN-W 2011, 27-30 June 2011, Hong Kong (pp. pp. 41-46).

Rohani, Alireza and Kerkhoff, Hans G. (2011) A Technique for Accelerating Injection of Transient Faults in Complex SoCs. In: 14th Euromicro Conference on Digital System Design, DSD 2001, 31 Aug - 2 Dec 2011, Oulu, Finland (pp. pp. 213-220).

Rohani, Alireza and Kerkhoff, Hans G. and Costenaro, Enrico and Alexandrescu, Dan (2013) Pulse-length determination techniques in the rectangular single event transient fault model. In: IEEE International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation, SAMOS 2013, 15-18 July 2013, Samos, Greece (pp. pp. 2013-2018).

Senouci, B. and Annema, A.J. and Bentum, M.J. and Kerkhoff, H.G. (2011) Functional framework and hardware platform for dependability study in short range wireless embedded systems. In: 17th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, 2011, 16-18 May 2011, Santa Barbara, California (pp. pp. 1-5).

Senouci, B. and Annema, A.J. and Bentum, M.J. and Kerkhoff, H.G. (2012) Investigating dependability of short-range wireless embedded systems through hardware platform based design. In: 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012, 25-28 June 2012, Boston, MA, USA (pp. pp. 1-7).

Sheng, Xiaoqin and Kerkhoff, Hans G. (2009) Two improved methods for testing ADC parametric faults by digital input signals. In: IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop, IMS3TW '09, 10-12 June 2009, Scottsdale, AZ.

Sheng, X. and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G. (2008) Exploring dynamics of embedded ADC through adapted digital input stimuli. In: 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE, 18-20 Jun 2008, Vancouver, BC (pp. pp. 1-7).

Sheng, Xiaoqin and Kerkhoff, Hans and Zjajo, Amir and Gronthoud, Guido (2009) Algorithms for ADC multi-site test with digital input stimulus. In: IEEE European Test Symposium, 25-29 May 2009, Seville, Spain (pp. pp. 45-50).

Sheng, Xiaoqin and Kerkhoff, Hans G. (2010) The test ability of an adaptive pulse wave for ADC testing. In: IEEE 19th Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China (pp. pp. 289-294).

Sheng, Xiaoqin and Kerkhoff, Hans G. (2010) Improved method for SNR prediction in machine-learning-based test. In: 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010, 7-9 June 2010, La Grande Motte, France (pp. pp. 1-4).

Sheng, Xiaoqin and Kerzérho, Vincent and Kerkhoff, Hans G. (2010) redicting dynamic specifications of ADCs with a low-quality digital input signal. In: 15th IEEE European Test Symposium, ETS 2010, May 24-28, 2010, Prague, Czech Republic (pp. pp. 158-163).

Speek, H. and Kerkhoff, H.G. and Sachdev, M. and Shashaani, M. (2000) Bridging the Testing Speed Gap: Design for Delay Testability. In: IEEE European Test Workshop, 2000, 23-26 May 2000, Cascais, Portugal (pp. pp. 3-8).

Speek, H. and Kerkhoff, H.G. and Shashaani, M. and Sachdev, M. (2000) A low-speed BIST framework for high-performance circuit testing. In: 18th IEEE VLSI Test Symposium, 2000, 30 April-4 May 2000, Montreal, Canada (pp. pp. 349-355).

Stancic, M. and Fang, L. and Weusthof, M.H.H. and Tijink, R.M.W. and Kerkhoff, H.G. (2002) A New Test Generation Approach for Embedded Analogue Cores in SoC. In: International Test Conference, 2002, 7-10 Oct. 2002, Baltimore, USA (pp. pp. 861-869).

Tangelder, R.J.W.T. and Gerez, S.H. and Kerkhoff, H.G. and Klumperink, E.A.M. and Smit, J. and Snijders, H. and Speek, H. and Vries, H. de (2000) The Mixed-Signal ASIC design course at Twente. In: 3rd European Workshop on Microelectronics Education, January 27, 2000, Fuveau, France (pp. pp. 205-208).

Tangelder, R.J.W.T. and Vries, H. de and Rosing, R. and Kerkhoff, H.G. and Sachdev, M. (1999) Jitter and Decision-level Noise Separation in A/D Converters. In: 16th IEEE Instrumentation and Measurement Technology Conference, IMTC 1999, 24-26 May 1999, Venice, Italy (pp. pp. 1558-1562).

Tangelder, Ronald J.W.T. and Diemel, Guido and Kerkhoff, Hans G. (1997) Smart Sensor System Application: An Integrated Compass. In: European Design and Test Conference, ED&TC 1997, 17-20 March 1997, Paris, France (pp. pp. 195-199).

Vermaak, H.J. and Kerkhoff, H.G. (2003) Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores. In: Eighth IEEE European Test Workshop, 2003, 25-28 May 2003, Maastricht, the Netherlands (pp. pp. 121-126).

Vermaak, H.J. and Kerkhoff, H.G. (2004) Using the Oscillation Test Method to test for Delay Faults in Embedded Cores. In: 7th IEEE Africon Conference in Africa, AFRICON 2004, 15-17 Sept. 2004, Gabarone, Botswana (pp. pp. 1105-1110).

Vermaak, H.J. and Kerkhoff, H.G. and Jordaan, G.D. (2002) Using a Pulsed Supply Voltage for Delay Faults Testing of Digital Circuits in a Digital Oscillation Environment. In: 6th IEEE Africon Conference in Africa, AFRICON 2002, 2-4 Oct. 2002, George, South Africa (pp. pp. 47-52).

Wan, Jinbo and Kerkhoff, Hans G. (2011) Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs. In: 2011 International SoC Design Conference, ISOCC 2011, 17-18 November 2011, Jeju, Korea (pp. pp. 294-297).

Wan, Jinbo and Kerkhoff, Hans G. (2013) An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. In: 2013 14th International Symposium on Quality Electronic Design, ISQED 2013, 4-6 March 2013, Santa Clara, CA, USA (pp. pp. 31-37).

Wan, Jinbo and Kerkhoff, Hans G. (2012) Monitoring active filters under automotive aging scenarios with embedded instrument. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, 12-16 March 2012, Dresden, Germany (pp. pp. 1096-1101).

Weening, Edward C. and Kerkhoff, Hans G. (1991) A new hierarchical approach to test-pattern generation. In: Fourth Annual IEEE International ASIC Conference and Exhibit, 23-27 Sept. 1991, Rochester, NY (pp. 6.1.1-6.1.4).

Zhang, X. and Kerkhoff, H.G. (2009) Design of a Highly Dependable Beamforming Chip. In: 12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2009, 27-29 August 2009, Patras, Greece (pp. pp. 729-735).

Zhang, Xiao and Kerkhoff, H.G. and Mailly, F. and Nouet, P. (2007) Dependable MEF Systems based on Control and Direct Sensing Electrodes via Current and Impedance Self-Tests. In: Proceedings of the 18th annual workshop on Circuits, Systems and Signal Processing, 29-30 Nov 2007, Veldhoven, The Netherlands (pp. pp. 1-3).

Zhang, Xiao and Kerkhoff, H.G. and Mailly, F. and Nouet, P. and Liu, H. and Richardson, A. (2007) A fault-tolerant MEF peptide synthesizer using control and direct sensing electrodes employing current and impedance tests. In: 13th International Mixed Signals Testing Workshop in conjunction with 3rd GHz/Gbps Test Workshop, 18-20 June 2007, Póvoa de Varzim, Portugal (pp. pp. 176-181).

Zhang, Xiao and Kerkhoff, Hans G. (2011) A Dependability Solution for Homogeneous MPSoCs. In: 17th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2011, 12-14 December 2011, Pasadena, CA, USA (pp. pp. 53-62).

Zhang, Xiao and Kerkhoff, Hans G. and Vermeulen, Bart (2010) On-Chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism. In: 13th Euromicro Conference on Digital System Design, DSD 2010, 1-3 September 2010, Lille, France (pp. pp. 531-537).

Zhang, Xiao and Kerkhoff, Hans G. and Vermeulen, Bart (2010) New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. In: 15th IEEE European Test Symposium, ETS 2010, 24-28 May 2010, Praha, Czech Republic (pp. 243 -244).

Zhang, Xiao and Proosdij, Frits van and Kerkhoff, Hans G. (2008) A droplet routing technique for fault-tolerant digital microfluidic devices. In: IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, IMS3TW 2008, 18-20 June 2007, Vancouver, BC, Canada (pp. pp. 1-7).

Zhao, Yong and Kerkhoff, Hans G. (2013) An embedded health-monitoring infrastructure for a reliable multi-core processor. In: Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, Median 2013, May 30-31, Avignone, France (pp. pp. 31-34).

Zhao, Yong and Zhang, Xiao and Kerkhoff, Hans G. (2013) Power-dissipation comparison of two dependability approaches for multi-processor systems. In: 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March 2013, Abu Dhabi, UAE (pp. pp. 56-61).

Zivkovic, V.A. and Tangelder, R.J.W.T. and Kerkhoff, H.G. (2000) Design and Test Space Exploration of Transport-Triggered Architectures. In: Design, Automation and Test in Europe Conference and Exhibition 2000, 27-30 March 2000, Paris, France (pp. pp. 146-151).

Zivkovic, V.A. and Tangelder, R.J.W.T. and Kerkhoff, H.G. (2000) Computer-Aided Test Flow in Core-Based Design. In: 22nd International Conference on Microelectronics, 2000, 14-17 May 2000 , Nis, Yugoslavia (pp. pp. 715-718).

This list was generated on Fri Aug 29 05:25:24 2014 CEST.