Author Publications

1994

Lohner, T. and Kotai, E. and Khanh, N.Q. and Toth, L. and Fried, M. and Vedam, K. and Nguyen, N.V. and Hanekamp, L.J. and Silfhout van, A. (1994) Ion-implantation induced anomalous surface amorphization in silicon. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 85 (1-4). pp. 335-339. ISSN 0168-583X

Lohner, T. and Toth, L. and Fried, M. and Khanh, N.Q. and Yang, Gen Qing and Lu, Lin Chen and Zou, Shichang and Hanekamp, L.J. and Silfhout van, A. and Gyulai, J. (1994) Comparative investigation of damage induced by diatomic and monoatomic ion implantation in silicon. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 85 (1-4). pp. 524-527. ISSN 0168-583X

1993

Lohner, T. and Fried, M. and Gyulai, J. and Vedam, K. and Nguyen, N.V. and Hanekamp, L.J. and Silfhout van, A. (1993) Ion-implantation-caused special damage profiles determined by spectroscopic ellipsometry in crystalline and in relaxed (annealed) amorphous silicon. Thin Solid Films, 233 (1-2). pp. 117-121. ISSN 0040-6090

1992

Fried, M. and Lohner, T. and Aarnink, W.A.M. and Hanekamp, L.J. and Silfhout van, A. (1992) Determination of complex dielectric functions of ion implanted and implanted‐annealed amorphous silicon by spectroscopic ellipsometry. Journal of Applied Physics, 71 (10). pp. 5260-5262. ISSN 0021-8979

Lisowski, W. and Berg van den, A.H.J. and Hanekamp, L.J. and Silfhout van, A. (1992) Composition and thickness of surface layer on molybdenum tips for scanning tunnelling microscopy (STM) studied by SEM/AES/(AR)XPS. Surface and Interface Analysis, 19 (1-12). pp. 93-99. ISSN 0142-2421

1990

Hanekamp, Lambertus J. and Berg van den, Albert H.J. and Bouwmeester, Henny J.M. and Sasse, Antonius G.B.M. and Kruidhof, Henk (1990) In-depth compositional analysis of ceramic by AES and XPS. Microchimica acta, 101 (1-6). pp. 189-194. ISSN 0026-3672

1989

Fried, M. and Lohner, T. and Nijs de, J.M.M. and Silfhout van, A. and Hanekamp, L.J. and Khanh, N.Q. and Laczik, Z. and Gyulai, J. (1989) Non-destructive characterization of nitrogen-implanted silicon-on-insulator structures by spectroscopic ellipsometry. Materials Science and Engineering B: Solid-state materials for advanced technology, 2 (1-3). pp. 131-137. ISSN 0921-5107

1988

Baikie, I.D. and Werf van der, K.O. and Hanekamp, L.J. (1988) Integrated automatic modular measuring system. Review of Scientific Instruments, 59 (9). p. 2075. ISSN 0034-6748

Hanekamp, L.J. (1988) Multiple reflections in an optical retarder investigated by spectroscopic transmission ellipsometry. Optics Communications, 65 (4). pp. 261-263. ISSN 0030-4018

1987

Langevoort, J.C. and Hanekamp, L.J. and Gellings, P.J. (1987) On the kinetics of oxidation of austenitic stainless steels AISI 304 and incoloy 800H. Applied Surface Science, 28 (3). pp. 189-203. ISSN 0169-4332

Langevoort, J.C. and Sutherland, I. and Hanekamp, L.J. and Gellings, P.J. (1987) On the oxide formation on stainless steels AISI 304 and incoloy 800H investigated with XPS. Applied Surface Science, 28 (2). pp. 167-179. ISSN 0169-4332

1986

Hemmes, K. and Lisowski, W. and Lodder, J.C. and Hanekamp, L.J. and Popma, Th.J.A. (1986) Surface and bulk magnetic behaviour of sputtered CoCr films. Journal of Physics D: Applied Physics, 19 (7). p. 1311. ISSN 0022-3727

1984

Hanekamp, L.J. and Brader, S.J.H. (1984) Short contribution: The behaviour of secondary electrons from Ni (110) upon oxygen adsorption. Vacuum, 34 (7). pp. 709-710. ISSN 0042-207X

1983

Hanekamp, L.J. and Brader, S.J.H. and Bootsma, G.A. (1983) Spectroscopic ellipsometric investigation of the clean and oxygen exposed Ni(110) surface. Surface Science, 135 (1-3). pp. 383-395. ISSN 0039-6028

1982

Hanekamp, L.J. and Lisowski, W. and Bootsma, G.A. (1982) Spectroscopic ellipsometric investigation of clean and oxygen covered copper single crystal surfaces. Surface Science, 118 (1-2). pp. 1-18. ISSN 0039-6028

1981

Oda, O. and Hanekamp, L.J. and Bootsma, G.A. (1981) An AES and LEED study of carbon and oxygen sorption on copper surfaces. Applications of Surface Science, 7 (3). pp. 206-214. ISSN 0378-5963

1980

Straaijer, A. and Hanekamp, L.J. and Bootsma, G.A. (1980) The influence of cell window imperfections on the calibration and measured data of two types of rotating-analyzer ellipsometers. Surface Science, 96 (1-3). pp. 217-231. ISSN 0039-6028

1977

Kono, S. and Hanekamp, L.J. and Silfhout van, A. (1977) Effects on ellipsometric parameters caused by heat treatment of silicon (111) surface. Surface Science, 65 (2). pp. 633-640. ISSN 0039-6028