Electric noise in a TES as a resistively shunted conducting junction

Kozorezov, A.G. and Golubov, A. and Martin, D. and Korte de, P.A.J. and Lindeman, M.A. and Hijmering, R.A. and Kuur van der, J. and Hoevers, H.F.C. and Gottardi, L. and Kupriyanov, M..Y. and Wigmore, J.K. (2012) Electric noise in a TES as a resistively shunted conducting junction. Journal of low temperature physics, 167 (3-4). 108 - 113. ISSN 0022-2291

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Abstract:	We present results of the analysis of electrical noise in a transition edge sensor (TES) as a resistively shunted conducting junction (the RSJ model). We derive an expression for the spectral density of voltage fluctuations taking into account weak superconductivity of a TES. We analyse and discuss differences in voltage noise in a TES compared to the familiar situation for the Josephson junction. The spectral density of voltage noise in the RSJ model has a unique analytical structure and cannot be reduced to the expression for the nonlinear Johnson noise near equilibrium
Item Type:	Article
Copyright:	© Springer
Faculty:	Science and Technology (TNW)
Research Group:	Interfaces and Correlated Electron Systems (ICE)
Link to this item:	http://purl.utwente.nl/publications/82265
Official URL:	http://dx.doi.org/10.1007/s10909-012-0489-7
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