Direct patterning of functional interfaces in oxide heterostructures


Banerjee, N. and Huijben, M. and Koster, G. and Rijnders, A.J.H.M. (2012) Direct patterning of functional interfaces in oxide heterostructures. Applied physics letters, 100 (4). 041601-1 - 041601-3. ISSN 0003-6951

[img] PDF
Restricted to UT campus only
: Request a copy
Abstract:We report on the direct patterning of high-quality structures incorporating the LaAlO3-SrTiO3 interface by an epitaxial-liftoff technique avoiding any reactive ion beam etching. Detailed studies of temperature dependent magnetotransport properties were performed on the patterned heterostructures with variable thickness of the LaAlO3 layer and compared to their unstructured thin film analogues. The results demonstrate the conservation of the high-quality interface properties in the patterned structures enabling future studies of low-dimensional confinement on high mobility interface conductivity as well as interface magnetism.
Item Type:Article
Copyright:© 2012 American Institute of Physics
Science and Technology (TNW)
Research Group:
Link to this item:
Official URL:
Export this item as:BibTeX
HTML Citation
Reference Manager


Repository Staff Only: item control page

Metis ID: 288492