Measurement of the sputter yield after mild ion erosion of a pristine Cu(001) surface

Stoian, F.G. and Gastel van, R. and Wormeester, H. and Poelsema, B. (2012) Measurement of the sputter yield after mild ion erosion of a pristine Cu(001) surface. Surface science, 606 (21-22). 1618 - 1622. ISSN 0039-6028

PDF
Restricted to UT campus only: Request a copy
658Kb

Abstract:	Using the STM technique we have determined the sputter yield on a pristine Cu(001) surface after mild (fluence less than 0.044 ions per surface atom) bombardment of the pristine surface with 800 eV Ar+ions at normal incidence. The experiments have been performed at substrate temperatures ranging from 200 to 350 K. Making use of the positional correlation of adatoms and surface vacancies, at 200 K and 325 K, we concluded that about 1/3 of the surface adatoms originate from interstitials arriving at the surface and they give a direct indication of the buried bulk vacancies. A careful analysis of the different areas for surface vacancies and adatom then allowed a quantitative evaluation of the sputter yield at 1.2 Cu atoms per 800 eV Ar+ ion
Item Type:	Article
Copyright:	© Elsevier
Faculty:	Science and Technology (TNW)
Research Group:	Physics of Interfaces and Nanomaterials (PIN)
Link to this item:	http://purl.utwente.nl/publications/81157
Official URL:	http://dx.doi.org/10.1016/j.susc.2012.06.013
Export this item as:	BibTeX EndNote HTML Citation Reference Manager

Show download statistics for this publication

Repository Staff Only: item control page

Metis ID: 287533