The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles

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Lee, C.J. and Boller, K.J. (2012) The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles. Optics express, 20 (12). 12793 - 12798. ISSN 1094-4087

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Abstract:With recent developments in microscopy, such as stimulated emission depletion (STED) microscopy, far-field imaging at resolutions better than the diffraction limit is now a commercially available technique. Here, we show that, in the special case of a diffusive regime, the noise-limited resolution of STED imaging is independent of the saturation intensity of the fluorescent label. Thermal motion limits the signal integration time, which, for a given excited-state lifetime, limits the total number of photons available for detection.
Item Type:Article
Additional information:lijkt hetzelfde als nr. 287513, maar beide wel laten staan.
Copyright:© 2012 Optical Society of America
Faculty:
Science and Technology (TNW)
Link to this item:http://purl.utwente.nl/publications/80554
Official URL:http://dx.doi.org/http://dx.doi.org/10.1364/OE.20.012793
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