Toward spectral-domain optical coherence tomography on a chip

Akca, B. Imran and Nguyen, Van Duc and Kalkman, Jeroen and Ismail, Nur and Sengo, Gabriel and Sun, Fei and Driessen, Alfred and Leeuwen van, Ton G. and Pollnau, Markus and Wörhoff, Kerstin and Ridder de, René M. (2012) Toward spectral-domain optical coherence tomography on a chip. IEEE Journal of Selected Topics in Quantum Electronics, 18 (3). pp. 1223-1233. ISSN 1077-260X

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Abstract:	We present experimental results of a spectral-domain optical coherence tomography system based on an integrated optical spectrometer. A 195-channel arrayed-waveguide-grating (AWG) spectrometer with 0.4-nm channel spacing centered at 1300 nm and a 125-channel AWG with 0.16-nm channel spacing centered at 800 nm have been fabricated in silicon oxynitride waveguide technology. Interferometric distance measurements have been performed by launching light from a broadband source into a free-space Michelson interferometer, with its output coupled into the AWG. A maximum imaging depth of 1 mm and axial resolution of 25 and 20 μm in air are demonstrated for the 800- and 1300-nm ranges, respectively.
Item Type:	Article
Copyright:	© 2012 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Optical MicroSystems (IOMS)
Link to this item:	http://purl.utwente.nl/publications/80520
Official URL:	http://dx.doi.org/10.1109/JSTQE.2011.2171674
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