Integrated AWG spectrometer for on-chip optical coherence tomography


Akca, B.I. and Chang, L. and Sengo, G. and Wörhoff, K. and Pollnau, M. and Ridder, R.M. de and Nguyen, V. Duc and Kalkman, J. and Leeuwen, T.G. van (2012) Integrated AWG spectrometer for on-chip optical coherence tomography. In: 16th European Conference on Integrated Optics, ECIO 2012, 18-20 April 2012, Sitges-Barcelona, Spain (pp. Paper 46).

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Abstract:We present experimental results of spectral-domain optical coherence tomography systems using arrayed-waveguide gratings (AWG) for the 800-nm and 1300-nm spectral ranges. A phantom is imaged by using the 1300-nm AWG.
Item Type:Conference or Workshop Item
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Metis ID: 296053