Materials Characterization of CIGS solar cells on Top of CMOS chips

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Lu, J. and Liu, W. and Kovalgin, A.Y. and Sun, Y. and Schmitz, J. (2011) Materials Characterization of CIGS solar cells on Top of CMOS chips. In: MRS Spring Meeting - Symposium E – Energy Harvesting, 25-29 April 2011, San Francisco, CA, USA (pp. e06-23).

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Abstract:In the current work, we present a detailed study on the material properties of the CIGS layers, fabricated on top of the CMOS chips, and compare the results with the fabrication on standard glass substrates. Almost identical elemental composition on both glass and CMOS chips (within measurement error). From X-ray diffraction measurement, except two peaks from the Si <100> substrate, the diffraction peaks from CIGS solar cell CMOS chip and that on glass substrate coincide for all three temperatures. Helium ion microscope images of the cross-section and top view of the CIGS layers, shows that the grain size is suitable for high efficiency solar cells.
Item Type:Conference or Workshop Item
Copyright:© 2011 Cambridge University Press
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/79892
Official URL:http://dx.doi.org/10.1557/opl.2011.1161
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