A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses

Krishnan, Shaji and Kerkhoff, Hans G. (2011) A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. In: 16th IEEE European Test Symposium, ETS 2011 , 23-27 May 2011, Trondheim, Norway.

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Abstract:	Mahalanobis distance is one of the commonly used multivariate metrics for finely segregating defective devices from non-defective ones. An associated problem with this approach is the estimation of a robust mean and a covariance matrix. In the absence of such robust estimates, especially in the presence of outliers to test-response measurements, and only a sub-sample from the population is available, the distance metric becomes unreliable. To circumvent this problem, multiple Mahalanobis distances are calculated from selected sets of test-response measurements. They are then suitably formulated to derive a metric that has a reduced variance and robust to shifts or deviations in measurements. In this paper, such a formulation is proposed to qualitatively screen product outliers and quantitatively measure the reliability of the non-defective ones. The application of method is exemplified over a test set of an industrial automobile product.
Item Type:	Conference or Workshop Item
Copyright:	© 2011 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/79215
Official URL:	http://dx.doi.org/10.1109/ETS.2011.31
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