A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses


Krishnan, Shaji and Kerkhoff, Hans G. (2011) A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. In: 16th IEEE European Test Symposium, ETS 2011 , 23-27 May 2011, Trondheim, Norway (pp. pp. 159-164).

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Abstract:Mahalanobis distance is one of the commonly used multivariate metrics for finely segregating defective devices from non-defective ones. An associated problem with this approach is the estimation of a robust mean and a covariance matrix. In the absence of such robust estimates, especially in the presence of outliers to test-response measurements, and only a sub-sample from the population is available, the distance metric becomes unreliable. To circumvent this problem, multiple Mahalanobis distances are calculated from selected sets of test-response measurements. They are then suitably formulated to derive a metric that has a reduced variance and robust to shifts or deviations in measurements. In this paper, such a formulation is proposed to qualitatively screen product outliers and quantitatively measure the reliability of the non-defective ones. The application of method is exemplified over a test set of an industrial automobile product.
Item Type:Conference or Workshop Item
Additional information:Best paper award ETS 2011 ISSN: 1530-1877
Copyright:© 2011 IEEE
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/79215
Official URL:https://doi.org/10.1109/ETS.2011.31
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