Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs

Wan, Jinbo and Kerkhoff, Hans G. (2011) Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs. In: 2011 International SoC Design Conference, ISOCC 2011, 17-18 November 2011, Jeju, Korea.

PDF
Restricted to UT campus only: Request a copy
291Kb

Abstract:	SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature instability (NBTI) make the SoCs, especially the analog/mixed-signal parts, undependable. In this paper, a dependability-improved Opamp is designed based on gain programmability and digital gain monitoring. To accomplish an extra gain range for tuning in 65nm technology, a new voltage-gain boosting method is proposed to provide a maximum 92dB gain in a single amplification stage. The NBTI influence is investigated using Cadence RelXpert and dependability properties for the Opamp are provided.
Item Type:	Conference or Workshop Item
Copyright:	© 2011 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/79174
Export this item as:	BibTeX EndNote HTML Citation Reference Manager

Show download statistics for this publication

Repository Staff Only: item control page