A Dependability Solution for Homogeneous MPSoCs

Zhang, Xiao and Kerkhoff, Hans G. (2011) A Dependability Solution for Homogeneous MPSoCs. In: 17th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2011, 12-14 December 2011, Pasadena, CA, USA.

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Abstract:	Nowadays highly dependable electronic devices are demanded by many safety-critical applications. Dependability attributes such as reliability and availability/maintainability of a many-processor system-on-chip (MPSoC) should already be examined at the design phase. Design for dependability approaches such as using available fault-free processor-cores and introducing a dependability manager infrastructural IP for self- test and evaluation can greatly enhance the dependability of an MPSoC. This is further supported by subsequent software-based repair. Design choices such as test fault coverage, test and repair time are examined to optimize the dependability attributes. Utilizing existing infrastructures like a network-on-chip (NoC) and tile-wrappers are needed to ensure a test can be performed at application run-time. An example design following the proposed design for dependability approach is shown. The MPSoC has been processed and measurement results have validated the proposed dependability approach.
Item Type:	Conference or Workshop Item
Copyright:	© 2011 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/78996
Official URL:	http://dx.doi.org/10.1109/PRDC.2011.16
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